Square PulseLTD based injector for ARIA and / orDARHT I
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Proceedings of SPIE - The International Society for Optical Engineering
A Compton spectrometer has been re-commissioned for measurements of flash radiographic sources. The determination of the energy spectrum of these sources is difficult due to the high count rates and short nature of the pulses (∼50 ns). The spectrometer is a 300 kg neodymium-iron magnet which measures spectra in the <1 MeV to 20 MeV energy range. Incoming x-rays are collimated into a narrow beam incident on a converter foil. The ejected Compton electrons are collimated so that the forward-directed electrons enter the magnetic field region of the spectrometer. The position of the electrons at the magnet's focal plane is a function of their momentum, allowing the x-ray spectrum to be reconstructed. Recent measurements of flash sources are presented.
Proceedings of SPIE - The International Society for Optical Engineering
The self-magnetic pinch (SMP) diode is an intense radiographic source fielded on the Radiographic Integrated Test Stand (RITS-6) accelerator at Sandia National Laboratories in Albuquerque, NM. The accelerator is an inductive voltage adder (IVA) that can operate from 2-10 MV with currents up to 160 kA (at 7 MV). The SMP diode consists of an annular cathode separated from a flat anode, holding the bremsstrahlung conversion target, by a vacuum gap. Until recently the primary imaging diagnostic utilized image plates (storage phosphors) which has generally low DQE at these photon energies along with other problems. The benefits of using image plates include a high-dynamic range, good spatial resolution, and ease of use. A scintillator-based X-ray imaging system or "gamma camera" has been fielded in front of RITS and the SMP diode which has been able to provide vastly superior images in terms of signal-to-noise with similar resolution and acceptable dynamic range.
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In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed power, dustbin and transmission line alignment, and di erent knob shapes. We nd no changes in the transmission line hardware, alignment, or hardware preparation methods which correlate with impedance collapse. However, in classifying good versus poor shots, we nd that there is not a continuous spectrum of diode impedance behavior but that the good and poor shots can be grouped into two distinct impedance pro les. This result forms the basis of a follow-on study focusing on the variability resulting from diode physics. 3
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IEEE Transactions on Plasma Science Special Issue on Pulsed Power Science and Technology
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