Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories Hughart, David R.; Marinella, Matthew J.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Bielejec, Edward S. Abstract not provided. More Details TYPE Conference YEAR 2013 OSTI
Stages of Switching in Tantalum Oxide Memristor Lohn, Andrew L.; Mickel, Patrick R.; Marinella, Matthew J. Abstract not provided. More Details TYPE Conference YEAR 2013 OSTI
A physical model of switching dynamics in tantalum oxide memristive devices Mickel, Patrick R.; Lohn, Andrew L.; Marinella, Matthew J.; James, Conrad D. Abstract not provided. More Details TYPE Conference YEAR 2012 OSTI
Radiation Effects in TaOx Memristors Dodd, Paul E.; Shaneyfelt, Marty R.; Bielejec, Edward S.; Kotula, Paul G.; Mickel, Patrick R. Abstract not provided. More Details TYPE Conference YEAR 2012 OSTI