Publications

Ivory, Megan K.; Setzer, William J.; Stick, Daniel L.; Parazzoli, Lambert P.; McGuinness, Hayden J.; Karl, Nicholas J.; DeRose, Christopher T.; Gehl, M.; Slobodyan, Oleksiy S.; Burkart, James K.; Kay, Randolph R.; Haltli, Raymond A.; Hunker, Jeffrey D.; Blain, Matthew G.

Abstract not provided.

Kaplar, Robert K.; Allerman, A.A.; Armstrong, Andrew A.; Baca, A.G.; Binder, Andrew B.; Crawford, Mary H.; Dickerson, Jeramy R.; Douglas, Erica A.; Flicker, Jack D.; Klein, Brianna A.; Neely, Jason C.; Reza, Shahed R.; Sharps, Paul; Slobodyan, Oleksiy S.; Yates, Luke Y.

Abstract not provided.

Hollis, Mark A.; Slobodyan, Oleksiy S.; Flicker, Jack D.; Dickerson, Jeramy R.; Binder, Andrew B.; Smith, Trevor S.; Kaplar, Robert K.

Abstract not provided.

Guttromson, Ross G.; Lawton, Craig R.; Halligan, Matthew H.; Huber, Dale L.; Flicker, Jack D.; Hoffman, Matthew J.; Bowman, Tyler B.; Campione, Salvatore; Clem, Paul G.; Fiero, Andrew F.; Hansen, Clifford H.; Llanes, Rodrigo E.; Pfeiffer, Robert A.; Pierre, Brian J.; Martin, Luis S.; Sanabria, David E.; Schiek, Richard S.; Slobodyan, Oleksiy S.; Warne, Larry K.

Sandia National Laboratories sponsored a three-year internally funded Laboratory Directed Research and Development (LDRD) effort to investigate the vulnerabilities and mitigations of a high-altitude electromagnetic pulse (HEMP) on the electric power grid. The research was focused on understanding the vulnerabilities and potential mitigations for components and systems at the high voltage transmission level. Results from the research included a broad array of subtopics, covered in twenty-three reports and papers, and which are highlighted in this executive summary report. These subtopics include high altitude electromagnetic pulse (HEMP) characterization, HEMP coupling analysis, system-wide effects, and mitigating technologies.

Kaplar, Robert K.; Flicker, Jack D.; Slobodyan, Oleksiy S.; Mueller, Jacob M.; Garcia Rodriguez, Luciano A.; Binder, Andrew B.; Dickerson, Jeramy R.; Smith, Trevor S.; Atcitty, Stanley A.

Abstract not provided.

Reza, Shahed R.; Kaplar, Robert K.; Armstrong, Andrew A.; Baca, A.G.; Klein, Brianna A.; Douglas, Erica A.; Allerman, A.A.; Crawford, Mary H.; Dickerson, Jeramy R.; Binder, Andrew B.; Flicker, Jack D.; Neely, Jason C.; Slobodyan, Oleksiy S.

Abstract not provided.

Kaplar, Robert K.; Armstrong, Andrew A.; Baca, A.G.; Klein, Brianna A.; Douglas, Erica A.; Reza, Shahed R.; Allerman, A.A.; Crawford, Mary H.; Dickerson, Jeramy R.; Binder, Andrew B.; Flicker, Jack D.; Neely, Jason C.; Slobodyan, Oleksiy S.

Abstract not provided.

MRS Communications

Slobodyan, Oleksiy S.; Smith, Trevor S.; Flicker, J.; Sandoval, S.; Matthews, C.; Van Heukelom, M.; Kaplar, Robert K.; Atcitty, S.

We report on reliability testing of vertical GaN (v-GaN) devices under continuous switching conditions of 500, 750, and 1000 V. Using a modified double-pulse test circuit, we evaluate 1200 V-rated v-GaN PiN diodes fabricated by Avogy. Forward current-voltage characteristics do not change over the stress period. Under the reverse bias, the devices exhibit an initial rise in leakage current, followed by a slower rate of increase with further stress. The leakage recovers after a day's relaxation which suggests that trapping of carriers in deep states is responsible. Overall, we found the devices to be robust over the range of conditions tested.

Slobodyan, Oleksiy S.; Smith, Trevor S.; Flicker, Jack D.; Sandoval, Stephane S.; Matthews, Chris M.; Van Heukelom, Michael V.; Kaplar, Robert K.; Atcitty, Stanley A.

Abstract not provided.

Slobodyan, Oleksiy S.; Smith, Trevor S.; Flicker, Jack D.; Sandoval, Stephanie S.; Matthews, Chris M.; Van Heukelom, Michael V.; Kaplar, Robert K.; Atcitty, Stanley A.

Abstract not provided.

Kaplar, Robert K.; Slobodyan, Oleksiy S.; Flicker, Jack D.; Sandoval, Stephanie S.; Matthews, Chris M.; Van Heukelom, Michael V.; Smith, Trevor S.; Atcitty, Stanley A.; Khalil, Sameh K.; Bahl, Sandeep B.

Abstract not provided.

Slobodyan, Oleksiy S.; Sandoval, Stephanie S.; Flicker, Jack D.; Kaplar, Robert K.; matthews, christopher m.; Van Heukelom, Michael V.; Atcitty, Stanley A.; Aktas, Ozgur A.; Kizilyalli, Isik C.

Abstract not provided.

Slobodyan, Oleksiy S.; Sandoval, Stephanie S.; Flicker, Jack D.; Kaplar, Robert K.; matthews, christopher m.; Van Heukelom, Michael V.; Atcitty, Stanley A.; Aktas, O.A.; Kizilyalli, I.C.

Abstract not provided.

Slobodyan, Oleksiy S.; Sandoval, Stephanie S.; Flicker, Jack D.; Kaplar, Robert K.; matthews, christopher m.; Van Heukelom, Michael V.; Atcitty, Stanley A.; Kizilyalli, Isik C.; Aktas, Ozgur A.

Abstract not provided.