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Technology for On-Chip Qubit Control with Microfabricated Surface Ion Traps

Highstrete, Clark H.; Sterk, Jonathan D.; Heller, Edwin J.; Maunz, Peter L.; Nordquist, Christopher N.; Stevens, James E.; Tigges, Chris P.; Blain, Matthew G.

Trapped atomic ions are a leading physical system for quantum information processing. However, scalability and operational fidelity remain limiting technical issues often associated with optical qubit control. One promising approach is to develop on-chip microwave electronic control of ion qubits based on the atomic hyperfine interaction. This project developed expertise and capabilities at Sandia toward on-chip electronic qubit control in a scalable architecture. The project developed a foundation of laboratory capabilities, including trapping the 171Yb+ hyperfine ion qubit and developing an experimental microwave coherent control capability. Additionally, the project investigated the integration of microwave device elements with surface ion traps utilizing Sandia’s state-of-the-art MEMS microfabrication processing. This effort culminated in a device design for a multi-purpose ion trap experimental platform for investigating on-chip microwave qubit control, laying the groundwork for further funded R&D to develop on-chip microwave qubit control in an architecture that is suitable to engineering development.

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TYPE SAND Report YEAR 2013
OSTIDOI

Sandia Micro-fabricated Ion Traps for the MUSIQC architecture

Maunz, Peter L.; Heller, Edwin J.; Hollowell, Andrew E.; Kemme, S.A.; Loviza, Becky G.; Mizrahi, Jonathan A.; Ortega, Anathea C.; Scrymgeour, David S.; Sterk, Jonathan D.; Tigges, Chris P.; Dagel, Amber L.; Clark, Craig R.; Stick, Daniel L.; Blain, Matthew G.; Clark, Susan M.; Resnick, Paul J.; Arrington, Christian L.; Benito, Francisco M.; Boye, Robert B.; Ellis, A.R.; Haltli, Raymond A.

Abstract not provided.

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TYPE Conference YEAR 2013
OSTI

Advanced atom chips with two metal layers

Blain, Matthew G.; Biedermann, Grant B.; Benito, Francisco M.; Stevens, James E.

A design concept, device layout, and monolithic microfabrication processing sequence have been developed for a dual-metal layer atom chip for next-generation positional control of ultracold ensembles of trapped atoms. Atom chips are intriguing systems for precision metrology and quantum information that use ultracold atoms on microfabricated chips. Using magnetic fields generated by current carrying wires, atoms are confined via the Zeeman effect and controllably positioned near optical resonators. Current state-of-the-art atom chips are single-layer or hybrid-integrated multilayer devices with limited flexibility and repeatability. An attractive feature of multi-level metallization is the ability to construct more complicated conductor patterns and thereby realize the complex magnetic potentials necessary for the more precise spatial and temporal control of atoms that is required. Here, we have designed a true, monolithically integrated, planarized, multi-metal-layer atom chip for demonstrating crossed-wire conductor patterns that trap and controllably transport atoms across the chip surface to targets of interest.

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TYPE SAND Report YEAR 2010
OSTIDOI

Microfabricated surface ion traps for quantum computation

Highstrete, Clark H.; Stick, Daniel L.; Tigges, Chris P.; Blain, Matthew G.; Fortier, Kevin M.; Haltli, Raymond A.; Kemme, S.A.; Lindgren, Thomas L.; Moehring, David L.

We will present results of the design, operation, and performance of surface ion micro-traps fabricated at Sandia. Recent progress in the testing of the micro-traps will be highlighted, including successful motional control of ions and the validation of simulations with experiments.

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TYPE Conference YEAR 2010
OSTI
Results 51–75 of 84
Results 51–75 of 84