We have developed a system of differential-output monitors that diagnose current and voltage in the vacuum section of a 20-MA 3-MV pulsed-power accelerator. The system includes 62 gauges: 3 current and 6 voltage monitors that are fielded on each of the accelerator's 4 vacuum-insulator stacks, 6 current monitors on each of the accelerator's 4 outer magnetically insulated transmission lines (MITLs), and 2 current monitors on the accelerator's inner MITL. The inner-MITL monitors are located 6 cm from the axis of the load. Each of the stack and outer-MITL current monitors comprises two separate B-dot sensors, each of which consists of four 3-mm-diameter wire loops wound in series. The two sensors are separately located within adjacent cavities machined out of a single piece of copper. The high electrical conductivity of copper minimizes penetration of magnetic flux into the cavity walls, which minimizes changes in the sensitivity of the sensors on the 100-ns time scale of the accelerator's power pulse. A model of flux penetration has been developed and is used to correct (to first order) the B-dot signals for the penetration that does occur. The two sensors are designed to produce signals with opposite polarities; hence, each current monitor may be regarded as a single detector with differential outputs. Common-mode-noise rejection is achieved by combining these signals in a 50-{Omega} balun. The signal cables that connect the B-dot monitors to the balun are chosen to provide reasonable bandwidth and acceptable levels of Compton drive in the bremsstrahlung field of the accelerator. A single 50-{omega} cable transmits the output signal of each balun to a double-wall screen room, where the signals are attenuated, digitized (0.5-ns/sample), numerically compensated for cable losses, and numerically integrated. By contrast, each inner-MITL current monitor contains only a single B-dot sensor. These monitors are fielded in opposite-polarity pairs. The two signals from a pair are not combined in a balun; they are instead numerically processed for common-mode-noise rejection after digitization. All the current monitors are calibrated on a 76-cm-diameter axisymmetric radial transmission line that is driven by a 10-kA current pulse. The reference current is measured by a current-viewing resistor (CVR). The stack voltage monitors are also differential-output gauges, consisting of one 1.8-cm-diameter D-dot sensor and one null sensor. Hence, each voltage monitor is also a differential detector with two output signals, processed as described above. The voltage monitors are calibrated in situ at 1.5 MV on dedicated accelerator shots with a short-circuit load. Faraday's law of induction is used to generate the reference voltage: currents are obtained from calibrated outer-MITL B-dot monitors, and inductances from the system geometry. In this way, both current and voltage measurements are traceable to a single CVR. Dependable and consistent measurements are thus obtained with this system of calibrated diagnostics. On accelerator shots that deliver 22 MA to a low-impedance z-pinch load, the peak lineal current densities at the stack, outer-MITL, and inner-MITL monitor locations are 0.5, 1, and 58 MA/m, respectively. On such shots the peak currents measured at these three locations agree to within 1%.
In October 2005, an intensive three-year Laser Triggered Gas Switch (LTGS) development program was initiated to investigate and solve observed performance and reliability issues with the LTGS for ZR. The approach taken has been one of mission-focused research: to revisit and reassess the design, to establish a fundamental understanding of LTGS operation and failure modes, and to test evolving operational hypotheses. This effort is aimed toward deploying an initial switch for ZR in 2007, on supporting rolling upgrades to ZR as the technology can be developed, and to prepare with scientific understanding for the even higher voltage switches anticipated needed for future high-yield accelerators. The ZR LTGS was identified as a potential area of concern quite early, but since initial assessments performed on a simplified Switch Test Bed (STB) at 5 MV showed 300-shot lifetimes on multiple switch builds, this component was judged acceptable. When the Z{sub 20} engineering module was brought online in October 2003 frequent flashovers of the plastic switch envelope were observed at the increased stresses required to compensate for the programmatically increased ZR load inductance. As of October 2006, there have been 1423 Z{sub 20} shots assessing a variety of LTGS designs. Numerous incremental and fundamental switch design modifications have been investigated. As we continue to investigate the LTGS, the basic science of plastic surface tracking, laser triggering, cascade breakdown, and optics degradation remain high-priority mission-focused research topics. Significant progress has been made and, while the switch does not yet achieve design requirements, we are on the path to develop successively better switches for rolling upgrade improvements to ZR. This report summarizes the work performed in FY 2006 by the large team. A high-level summary is followed by detailed individual topical reports.
Study of the triggered plasma opening switch (TPOS) characteristics is in progress via an ion current collection diagnostic (ICCD), in addition to offline apparatus. This initial ion current collection diagnostic has been designed, fabricated, and tested on the TPOS in order to explore the opening profile of the main switch. The initial ion current collection device utilizes five collectors which are positioned perpendicularly to the main switch stage in order to collect radially traveling ions. It has been shown through analytical prowess that this specific geometry can be treated as a planar case of the Child-Langmuir law with only a 6% deviation from the cylindrical case. Additionally, magnetostatic simulations with self consistent space charge emitting surfaces of the main switch using the Trak code are under way. It is hoped that the simulations will provide evidence in support of both the analytical derivations and experimental data. Finally, an improved design of the ICCD (containing 12 collectors in the axial direction) is presently being implemented.
The Z machine at Sandia National Laboratories (SNL) is the world's largest and most powerful laboratory X-ray source. The Z Refurbishment Project (ZR) is presently underway to provide an improved precision, more shot capacity, and a higher current capability. The ZR upgrade has a total output current requirement of at least 26 MA for a 100-ns standard Z-pinch load. To accomplish this with minimal impact on the surrounding hardware, the 60 high-energy discharge capacitors in each of the existing 36 Marx generators must be replaced with identical size units but with twice the capacitance. Before the six-month shut down and transition from Z to ZR occurs, 2500 of these capacitors will be delivered. We chose to undertake an ambitious vendor qualification program to reduce the risk of not meeting ZR performance goals, to encourage the pulsed-power industry to revisit the design and development of high- energy discharge capacitors, and to meet the cost and delivery schedule within the ZR project plans. Five manufacturers were willing to fabricate and sell SNL samples of six capacitors each to be evaluated. The 8000-shot qualification test phase of the evaluation effort is now complete. This paper summarizes how the 0.279 x 0.356 x 0.635-m (11 x 14 x 25-in) stainless steel can, Scyllac-style insulator bushing, 2.65-{micro}F, < 30-nH, 100-kV, 35%-reversal capacitor lifetime specifications were determined, briefly describes the nominal 260-kJ test facility configuration, presents the test results of the most successful candidates, and discusses acceptance testing protocols that balance available resources against performance, cost, and schedule risk. We also summarize the results of our accelerated lifetime testing of the selected General Atomics P/N 32896 capacitor. We have completed lifetime tests with twelve capacitors at 100 kV and with fourteen capacitors at 110-kV charge voltage. The means of the fitted Weibull distributions for these two cases are about 17,000 and 10,000 shots, respectively. As a result of this effort plus the rigorous vendor testing prior to shipping, we are confident in the high reliability of these capacitors and have acquired information pertaining to their lifetime dependence on the operating voltage. One result of the analysis is that, for these capacitors, lifetime scales inversely with voltage to the 6.28 {+-} 0.91 power, over this 100 to 110-kV voltage range. Accepting the assumptions leading to this outcome allows us to predict the overall ZR system Marx generator capacitor reliability at the expected lower operating voltage of about 85 kV.
To meet or exceed the 26-MA goal for ZR, the refurbished upgrade to the Z machine at Sandia National Labs, the existing Marx generator capacitors must be replaced with identical size units but with twice the capacitance. Before the six-month shut down and transition from Z to ZR occurs in late 2005, most of the 2500 capacitors must be delivered for acceptance testing and installation. We chose to undertake an ambitious vendor qualification program to reduce the risk of not meeting ZR performance goals, to encourage the pulsed-power industry to revisit the design and development of high energy discharge capacitors, and to meet the cost and delivery schedule within the ZR project plans. Five manufacturers were willing to fabricate and sell Sandia samples of six capacitors each to be evaluated. In addition, four more samples of modified or alternate designs were submitted for testing at the vendors' expense, giving us a total of 45 capacitors to test. The 8,000-shot qualification test phase of the effort is now complete. This paper summarizes how the 0.279×0.356×0.635-m Scyllac-style 2.6-μF, <30-nH, 100-kV, 35%-reversal capacitor lifetime specifications were determined, briefly describes the nominal 260-kJ test facility configuration, presents the test results of the most successful candidates, and provides procurement strategy and acceptance testing protocols that balance available resources against performance, cost, and schedule risk.
Optimizing the design of the upgrade to the Z pulser at Sandia National Laboratories renewed interest in the ubiquitous Scyllac-cased capacitor. For the Z upgrade, the desired capacitance value in each case is different than those built before, and double that of the existing units in Z. The cost and fundamental importance of the Marx capacitors in pulsers like Z prompted the decision to build a test facility that could evaluate sample units from capacitor manufacturers. The number of interested vendors and the expected lifetime indicated about 350 thousand capacitor-shots for the capacitors in a plus-minus configuration. The project schedule demanded that the initial testing be completed in a few months. These factors, and budget limitations, pointed to the need for a system that could test multiple pairs of capacitors at once, without a full-time attendant. The system described here tests up to ten pairs of 2.6 μF capacitors charged to 100 kV in 90 seconds, then discharged at 150 kA and 35 percent reversal. Unattended operation requires sophisticated fault detection, and so much attention has been paid to this. This paper will describe the system, and the key components including the control system, the switches, and the load resistors. The paper will also show some lifetime and performance data from commonly used 200 kV spark gap switches.
This research consisted of testing surface treatment processes for stainless steel and aluminum for the purpose of suppressing electron emission over large surface areas to improve the pulsed high voltage hold-off capabilities of these metals. Improvements to hold-off would be beneficial to the operation of the vacuum-insulator grading rings and final self-magnetically insulated transmission line on the ZR-upgrade machine and other pulsed power applications such as flash radiograph and pulsed-microwave machines. The treatments tested for stainless steel include the Z-protocol (chemical polish, HVFF, and gold coating), pulsed E-beam surface treatments by IHCE, Russia, and chromium oxide coatings. Treatments for aluminum were anodized and polymer coatings. Breakdown thresholds also were measured for a range of surface finishes and gap distances. The study found that: (1.) Electrical conditioning and solvent cleaning in a filtered air environment each improve HV hold-off 30%. (2.) Anodized coatings on aluminum give a factor of two improvement in high voltage hold-off. However, anodized aluminum loses this improvement when the damage is severe. Chromium oxide coatings on stainless steel give a 40% and 20% improvement in hold-off before and after damage from many arcs. (3.) Bare aluminum gives similar hold-off for surface roughness, R{sub a}, ranging from 0.08 to 3.2 {micro}m. (4.) The various EBEST surfaces tested give high voltage hold-off a factor of two better than typical machined and similar to R{sub a} = 0.05 {micro}m polished stainless steel surfaces. (5.) For gaps > 2 mm the hold-off voltage increases as the square root of the gap for bare metal surfaces. This is inconsistent with the accepted model for metals that involves E-field induced electron emission from dielectric inclusions. Micro-particles accelerated across the gap during the voltage pulse give the observed voltage dependence. However the similarity in observed breakdown times for large and small gaps places a requirement that the particles be of molecular size. This makes accelerated micro-particle induced breakdown seem improbable also.