Publications

In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed power, dustbin and transmission line alignment, and di erent knob shapes. We nd no changes in the transmission line hardware, alignment, or hardware preparation methods which correlate with impedance collapse. However, in classifying good versus poor shots, we nd that there is not a continuous spectrum of diode impedance behavior but that the good and poor shots can be grouped into two distinct impedance pro les. This result forms the basis of a follow-on study focusing on the variability resulting from diode physics. 3

Abstract not provided.

The Z Refurbishment Project was completed in September 2007. Prior to the shutdown of the Z facility in July 2006 to install the new hardware, it provided currents of {le} 20 MA to produce energetic, intense X-ray sources ({approx} 1.6 MJ, > 200 TW) for performing high energy density science experiments and to produce high magnetic fields and pressures for performing dynamic material property experiments. The refurbishment project doubled the stored energy within the existing tank structure and replaced older components with modern, conventional technology and systems that were designed to drive both short-pulse Z-pinch implosions and long-pulse dynamic material property experiments. The project goals were to increase the delivered current for additional performance capability, improve overall precision and pulse shape flexibility for better reproducibility and data quality, and provide the capacity to perform more shots. Experiments over the past year have been devoted to bringing the facility up to full operating capabilities and implementing a refurbished suite of diagnostics. In addition, we have enhanced our X-ray backlighting diagnostics through the addition of a two-frame capability to the Z-Beamlet system and the addition of a high power laser (Z-Petawatt). In this paper, we will summarize the changes made to the Z facility, highlight the new capabilities, and discuss the results of some of the early experiments.

Abstract not provided.