Publications

Leckbee, Joshua L.; Oliver, Bryan V.; Maenchen, John E.; Portillo, Salvador; Johnston, Mark D.; Hahn, Kelly D.; Rovang, Dean C.; Molina, I.; Cordova, S.

Abstract not provided.

Leckbee, Joshua L.; Oliver, Bryan V.; Maenchen, John E.; Portillo, Salvador; Cordova, S.; Molina, I.

Abstract not provided.

Leckbee, Joshua L.; Oliver, Bryan V.; Maenchen, John E.; Portillo, Salvador; Johnston, Mark D.; Hahn, Kelly D.; Rovang, Dean C.; Molina, I.; Cordova, S.

Abstract not provided.

Leckbee, Joshua L.; Oliver, Bryan V.

Abstract not provided.

Leckbee, Joshua L.; Cordova, S.; Johnston, Mark D.; Maenchen, John E.; Molina, I.; Oliver, Bryan V.; Rovang, Dean C.

Abstract not provided.

Leckbee, Joshua L.; Maenchen, John E.; Portillo, Salvador; Molina, I.

A 1 MV linear transformer driver (LTD), capable of driving a radiographic diode load, has been built and tested. A circuit model of this accelerator has been developed using the BERTHA circuit simulation code. Simulations are compared to data from power-flow experiments utilizing a large area electron-beam diode load. Results show that the simulation model performs well in modeling the baseline operation of the accelerator. In addition, the circuit model has been used to predict several possible fault modes. Simulations of switch prefires, main capacitor failure, vacuum insulator flashover, and core saturation have been used to estimate the probability of inducing further failures and the impact on the load voltage and current.

Leckbee, Joshua L.; Maenchen, John E.; Portillo, Salvador; Molina, I.

A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.

Leckbee, Joshua L.; Maenchen, John E.; Portillo, Salvador; Cordova, S.; Molina, I.

Abstract not provided.