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Bielejec, Edward S. ; Pacheco, Jose L. ; Camacho, Ryan C.
Abstract not provided.
Singh, Meenakshi S. ; Pacheco, Jose L. ; Perry, Daniel L. ; Ten Eyck, Gregory A. ; Wendt, J.R. ; Luhman, Dwight R. ; Bielejec, Edward S. ; Carroll, Malcolm ; Lilly, Michael L.
Abstract not provided.
Abraham, John B. ; Aguirre, Brandon A. ; Pacheco, Jose L. ; Vizkelethy, Gyorgy V. ; Bielejec, Edward S.
Abstract not provided.
Sharma, Peter A. ; Abraham, John B. ; Bielejec, Edward S. ; Pacheco, Jose L. ; Singh, Meenakshi S. ; Bielejec, Edward S. ; Pluym, Tammy P. ; Dominguez, Jason J. ; Carroll, Malcolm
Abstract not provided.
Abraham, John B. ; Pacheco, Jose L. ; Aguirre, Brandon A. ; Camacho, Ryan C. ; Bielejec, Edward S.
Abstract not provided.
Singh, Meenakshi S. ; Pacheco, Jose L. ; Luhman, Dwight R. ; Bielejec, Edward S. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
IEEE Transactions on Nuclear Science
Auden, Elizabeth C. ; Pacheco, Jose L. ; Bielejec, Edward S. ; Vizkelethy, Gyorgy V. ; Abraham, John B. ; Doyle, Barney L.
Displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keVions focused in a 40 nm beam spot are used to create damage cascades within areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of {200 ions and 60 keV ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.
Pacheco, Jose L. ; Hughart, David R. ; Vizkelethy, Gyorgy V. ; Bielejec, Edward S. ; Marinella, Matthew J.
Abstract not provided.
Abraham, John B. ; Aguirre, Brandon A. ; Pacheco, Jose L. ; Camacho, Ryan C. ; Bielejec, Edward S.
Abstract not provided.
Sandia journal manuscript; Not yet accepted for publication
Singh, Meenakshi S. ; Pacheco, Jose L. ; Perry, Daniel L. ; Ten Eyck, Gregory A. ; Wendt, J.R. ; Pluym, Tammy P. ; Dominguez, Jason J. ; Manginell, Ronald P. ; Luhman, Dwight R. ; Bielejec, Edward S. ; Lilly, Michael L. ; Carroll, Malcolm
Deterministic control over the location and number of donors is crucial to donor spin quantum bits (qubits) in semiconductor based quantum computing. A focused ion beam is used to implant close to quantum dots. Ion detectors are integrated next to the quantum dots to sense the implants. The numbers of ions implanted can be counted to a precision of a single ion. Regular coulomb blockade is observed from the quantum dots. Charge offsets indicative of donor ionization, are observed in devices with counted implants.
Singh, Meenakshi S. ; Pacheco, Jose L. ; Perry, Daniel L. ; Ten Eyck, Gregory A. ; Wendt, J.R. ; Luhman, Dwight R. ; Bielejec, Edward S. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
Singh, Meenakshi S. ; Pacheco, Jose L. ; Perry, Daniel L. ; Ten Eyck, Gregory A. ; Wendt, J.R. ; Luhman, Dwight R. ; Bielejec, Edward S. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
Aguirre, Brandon A. ; Abraham, John B. ; Pacheco, Jose L. ; Ward, Daniel R. ; Bielejec, Edward S. ; Camacho, Ryan C.
Abstract not provided.
Pacheco, Jose L. ; Hughart, David R. ; Vizkelethy, Gyorgy V. ; Bielejec, Edward S. ; Marinella, Matthew J.
Abstract not provided.
Abraham, John B. ; Sharma, Peter A. ; Pacheco, Jose L. ; Bielejec, Edward S. ; Carroll, Malcolm
Abstract not provided.
Bielejec, Edward S. ; Singh, Meenakshi S. ; Pacheco, Jose L. ; Jacobson, Noah T. ; Gamble, John K. ; Nielsen, Erik N. ; Muller, Richard P. ; Luhman, Dwight R. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
Pacheco, Jose L. ; Bielejec, Edward S. ; Singh, Meenakshi S. ; Bureau-Oxton, Chloe B.; Jacobson, Noah T. ; Gamble, John K. ; Nielsen, Erik N. ; Muller, Richard P. ; Luhman, Dwight R. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
Pacheco, Jose L. ; Bielejec, Edward S.
Abstract not provided.
Frank, Ian W. ; Camacho, Ryan C. ; Bielejec, Edward S. ; Pacheco, Jose L.
Abstract not provided.
Auden, Elizabeth C. ; Pacheco, Jose L. ; Doyle, Barney L. ; Bielejec, Edward S. ; Vizkelethy, Gyorgy V. ; Abraham, John B.
Abstract not provided.
Bielejec, Edward S. ; Pacheco, Jose L. ; Singh, Meenakshi S. ; Jacobson, Noah T. ; Gamble, John K. ; Luhman, Dwight R. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
Auden, Elizabeth C. ; Doyle, Barney L. ; Bielejec, Edward S. ; Pacheco, Jose L. ; Vizkelethy, Gyorgy V. ; Abraham, John B.
Abstract not provided.
Bielejec, Edward S. ; Pacheco, Jose L. ; Camacho, Ryan C.
Abstract not provided.
Singh, Meenakshi S. ; Pacheco, Jose L. ; Perry, Daniel L. ; Ten Eyck, Gregory A. ; Bishop, Nathaniel B. ; Wendt, J.R. ; Luhman, Dwight R. ; Bielejec, Edward S. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
Pacheco, Jose L. ; Singh, Meenakshi S. ; Bielejec, Edward S. ; Lilly, Michael L. ; Carroll, Malcolm
Abstract not provided.
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