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Sharma, Peter A.; Blea-Kirby, Mia A.; McKenzie, Bonnie B.; Edney, Cynthia E.; Medlin, Douglas L.; Nishimoto, Ryan K.; Ihlefeld, Jon I.
Sinclair, Michael B.; Peters, D.W.; Brener, Igal B.; Clem, Paul G.; Ihlefeld, Jon I.; Basilio, Lorena I.; Warne, Larry K.; Wendt, J.R.; Stevens, Jeffrey S.; Miller, Shannon M.
Ihlefeld, Jon I.
Ihlefeld, Jon I.
Rasberry, Roger D.; Arrington, Christian L.; Clem, Paul G.; Ihlefeld, Jon I.; Brumbach, Michael T.; Peters, D.W.; Sinclair, Michael B.; Dirk, Shawn M.
Brener, Igal B.; Clem, Paul G.; Ihlefeld, Jon I.; Basilio, Lorena I.; Warne, Larry K.; Wendt, J.R.; Stevens, Jeffrey S.; Miller, Shannon M.; Peters, D.W.
Basilio, Lorena I.; Brener, Igal B.; Burckel, David B.; Shaner, Eric A.; Wendt, J.R.; Luk, Ting S.; Ellis, A.R.; Bender, Daniel A.; Clem, Paul G.; Rasberry, Roger D.; Langston, William L.; Ihlefeld, Jon I.; Dirk, Shawn M.; Warne, Larry K.; Peters, D.W.; El-Kady, I.; Reinke, Charles M.; Loui, Hung L.; Williams, Jeffery T.; Sinclair, Michael B.; McCormick, Frederick B.
Journal of the Electrochemical Society
Small, Leo; Cook, Adam W.; Apblett, Christopher A.; Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Duquette, David
An electrochemical probe station (EPS) for automated electrochemical testing of electronic-grade thin films is presented. Similar in design to a scanning droplet cell, this modular system features a flexible probe tip capable of contacting both metallic and oxide surfaces. Using the highly sensitive Pt-H 2SO 4 system, it is demonstrated that the EPS obtains results equivalent to those of a traditional electrochemical cell. Further, electrical testing of thin film PbZr 0.52Ti 0.48O 3 shows that this system may be used to ascertain fundamental electrical properties of dielectric films. © 2012 The Electrochemical Society.
Duda, John C.; Hattar, Khalid M.; Piekos, Edward S.; Medlin, Douglas L.; Ihlefeld, Jon I.
Journal of Materials Research
Rodriguez, Marko A.; Garino, Terry J.; Edney, Cynthia E.; Ihlefeld, Jon I.; Lu, Ping L.
Meyer, Kelsey M.; Brown-Shaklee, Harlan J.; Shahin, David S.; Ihlefeld, Jon I.; Brennecka, Geoffrey L.
Brennecka, Geoffrey L.; Ihlefeld, Jon I.; Apblett, Christopher A.; Small, Leo J.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Meyer, Kelsey M.
Apblett, Christopher A.; Ihlefeld, Jon I.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; Meyer, Kelsey M.
Brennecka, Geoffrey L.; Meyer, Kelsey M.; Brown-Shaklee, Harlan J.; Shahin, David S.; George, Matthew C.; Ihlefeld, Jon I.
Brennecka, Geoffrey L.; Brown-Shaklee, Harlan J.; Meyer, Kelsey M.; Shahin, David S.; Ihlefeld, Jon I.
Ihlefeld, Jon I.; Hopkins, Patrick E.; Brown-Shaklee, Harlan J.
Ihlefeld, Jon I.; Brown-Shaklee, Harlan J.; Hopkins, Patrick E.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Kotula, Paul G.
Brener, Igal B.; Sinclair, Michael B.; Clem, Paul G.; Ihlefeld, Jon I.; Stevens, Jeffrey S.; Wendt, J.R.; Peters, D.W.; Warne, Larry K.; Basilio, Lorena I.
Sinclair, Michael B.; Brener, Igal B.; Peters, D.W.; Stevens, Jeffrey S.; Wendt, J.R.; Basilio, Lorena I.; Warne, Larry K.; Clem, Paul G.; Ihlefeld, Jon I.
Brennecka, Geoffrey L.; Meyer, Kelsey M.; Shahin, David S.; Brown-Shaklee, Harlan J.; Ihlefeld, Jon I.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; McKenzie, Bonnie B.; Rye, Michael J.; Meyer, Kelsey M.
Ihlefeld, Jon I.; Atcitty, Stanley A.
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