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Operational characteristics and analysis of the immersed-Bz diode on RITS-3

Rovang, Dean C.; Johnston, Mark D.; Maenchen, John E.; Oliver, Bryan V.; Portillo, Salvador; Madrid, Elizabeth A.

The immersed-B{sub z} diode is being developed as a high-brightness, flash x-ray radiography source. This diode is a foil-less electron-beam diode with a long, thin, needle-like cathode inserted into the bore of a solenoid. The solenoidal magnetic field guides the electron beam emitted from the cathode to the anode while maintaining a small beam radius. The electron beam strikes a thin, high-atomic-number anode and produces bremsstrahlung. We report on an extensive series of experiments where an immersed-B{sub z} diode was fielded on the RITS-3 pulsed power accelerator, a 3-cell inductive voltage generator that produced peak voltages between 4 and 5 MV, {approx}140 kA of total current, and power pulse widths of {approx}50 ns. The diode is a high impedance device that, for these parameters, nominally conducts {approx}30 kA of electron beam current. Diode operating characteristics are presented and two broadly characterized operating regimes are identified: a nominal operating regime where the total diode current is characterized as classically bipolar and an anomalous impedance collapse regime where the total diode current is in excess of the bipolar limit and up to the full accelerator current. The operating regimes are approximately separated by cathode diameters greater than {approx}3 mm for the nominal regime and less than {approx} 3 mm for the anomalous impedance collapse regime. This report represents a compilation of data taken on RITS-3. Results from key parameter variations are presented in the main body of the report and include cathode diameter, anode-cathode gap, and anode material. Results from supporting parameter variations are presented in the appendices and include magnetic field strength, prepulse, pressure and accelerator variations.

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Circuit Simulations of a 1 MV LTD for radiography

Leckbee, Joshua L.; Maenchen, John E.; Portillo, Salvador; Molina, I.

A 1 MV linear transformer driver (LTD), capable of driving a radiographic diode load, has been built and tested. A circuit model of this accelerator has been developed using the BERTHA circuit simulation code. Simulations are compared to data from power-flow experiments utilizing a large area electron-beam diode load. Results show that the simulation model performs well in modeling the baseline operation of the accelerator. In addition, the circuit model has been used to predict several possible fault modes. Simulations of switch prefires, main capacitor failure, vacuum insulator flashover, and core saturation have been used to estimate the probability of inducing further failures and the impact on the load voltage and current.

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Reliability assessment of a 1 MV LTD

Leckbee, Joshua L.; Maenchen, John E.; Portillo, Salvador; Molina, I.

A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.

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Plasma spectroscopy diagnostics in pulsed-power X-ray radiography diode research

Johnston, Mark D.; Hahn, Kelly D.; Rovang, Dean C.; Portillo, Salvador; Maenchen, John E.

Spectroscopic investigations in the visible and near UV are underway to study plasmas present in X-ray radiography diodes during the time of the electron beam propagation. These studies are being performed on the RITS-3 accelerator (5.25 MV and 120 kA) at Sandia National Laboratories using several diode configurations. The proper characterization of the plasmas occurring during the time of the X-ray pulse can lead to a greater understanding of diode behavior and X-ray spot size evolution. By studying these plasmas along with the use of selective dopants, insights into such phenomena as impedance collapse, thermal and non-thermal species behavior, charge and current neutralization, anode and cathode plasma formation and propagation, and beam/foil interactions, can be obtained. Information from line and continuum emission and absorption can give key plasma parameters such as temperatures, densities, charge states, and expansion velocities. This information is important for proper modeling and future predictive capabilities for the design and improvement of flash X-ray radiography diodes. Diagnostics include a gated, intensified multichannel plate camera combined with a 1 meter Czerny-Turner monochromator with a multi-fiber spectral input, allowing for both temporal and spatial resolution. Recent results are presented.

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Radiation predictions and shielding calculations for RITS-6

Maenchen, John E.; Kensek, Ronald P.; Fan, Wesley C.

The mission of Radiographic Integrated Test Stand-6 (RITS-6) facility is to provide the underlying science and technology for pulsed-power-driven flash radiographic X-ray sources for the National Nuclear Security Administration (NNSA). Flash X-ray radiography is a penetrating diagnostic to discern the internal structure in dynamic experiments. Short (~50 nanosecond (ns) duration) bursts of very high intensity Xrays from mm-scale source sizes are required at a variety of voltages to address this mission. RITS-6 was designed and is used to both develop the accelerator technology needed for these experiments and serves as the principal test stand to develop the high intensity electron beam diodes that generate the required X-ray sources. RITS is currently in operation with three induction cavities (RITS-3) with a maximum voltage output of 5.5 MV and is classified as a low hazard non-nuclear facility in accordance with CPR 400.1.1, Chapter 13, Hazards Identification/Analysis and Risk Management. The facility will be expanded from three to six cavities (RITS-6) effectively doubling the operating voltage. The increase in the operating voltage to above 10 MV has resulted in RITS-6 being classified as an accelerator facility. RITS-6 will come under DOE Order 420.2B, Safety of Accelerator Facilities. The hazards of RITS are detailed in the "Safety Assessment Document for the Radiographic Integrated Test Stand Facility." The principal non-industrial hazard is prompt x-ray radiation. As the operating voltage is increased, both the penetration power and the total amount (dose) of x-rays are increased, thereby increasing the risk to local personnel. Fixed site shielding (predominantly concrete walls and a steel/lead skyshine shield) is used to attenuate these x-rays and mitigate this risk. This SAND Report details the anticipated x-ray doses, the shielding design, and the anticipated x-ray doses external to this shielding structure both in areas where administrative access control restricts occupation and in adjacent uncontrolled areas.

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Plasma-filled focusing cell for radiographic paraxial diodes on RITS

Conference Record of the International Power Modulator Symposium and High Voltage Workshop

Hahn, K.; Maenchen, John E.; Cordova, S.; Molina, I.; Portillo, Salvador; Rovang, Dean C.; Schamiloglu, E.; Welch, D.R.; Oliver, B.V.; Rose, D.V.

Paraxial diodes have been a stronghold for high-brightness, flash x-ray radiography. In its traditional configuration, an electron beam impinges onto an anode foil, entering a gas-filled transport cell. Within the cell, the beam is focused into a small spot onto a high-Z target to generate x-rays for the radiographic utility. Simulations using Lsp, a particle-in-cell code, have shown that within the gas-filled focusing cell the electron beam spot location sweeps axially during the course of the beam pulse. The result is a larger radiographic spot than is desirable. Lsp has also shown that replacing the gas-filled cell with a fully ionized plasma on the order of 1016 cm-3 will prevent the spot from significant beam sweeping, thus resulting in a smaller, more stable radiographic spot size. Sandia National Laboratories (SNL) is developing a plasma-filled focusing cell for future paraxial diode experiments. A z-discharge in a hydrogen fill is used to generate a uniform, highly ionized plasma. Laser interferometry is the key diagnostic to determine electron density in a light lab setting and during future paraxial diode shots on SNL's RITS-3 accelerator. A time-resolved spot diagnostic will also be implemented during diode shots to measure the change in spot size during the course of the pulse. © 2004 IEEE.

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Advances in pulsed-power-driven radiography system design

Maenchen, John E.; Cordova, S.; Bohlken, Fawn A.; Hahn, Kelly D.; Jaramillo, Deanna M.; Molina, I.; Portillo, Salvador; Madrid, Elizabeth A.; Rovang, Dean C.; Sceiford, Matthew S.

Flash x-ray radiography has undergone a transformation in recent years with the resurgence of interest in compact, high intensity pulsed-power-driven electron beam sources. The radiographic requirements and the choice of a consistent x-ray source determine the accelerator parameters, which can be met by demonstrated Induction Voltage Adder technologies. This paper reviews the state of the art and the recent advances which have improved performance by over an order of magnitude in beam brightness and radiographic utility.

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RITS-3 self-break water switch maintenance

Portillo, Salvador; Hahn, Kelly D.; Molina, I.; Cordova, S.; Maenchen, John E.

The radiographic integrated test stand (RITS-3) is a 5-MV, 160-kA, 70-ns inductive voltage adder accelerator at Sandia National Laboratories used to develop critical understanding of x-ray sources and flash radiographic drivers. On RITS-3 three pulse forming lines (PFLs) are used to drive three inductive voltage adder cavities. Each PFL contains a fast-pulse-charged, self-breakdown annular water switch that is used for initial pulse shaping and timing. Low loss in the switches combined with good synchronization is required for efficient operation of the accelerator. Switch maintenance is closely monitored over time to determine the effects of wear on switch breakdown performance.

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Results 26–50 of 66
Results 26–50 of 66