Publications
Identification of radiation-induced parasitic leakage paths using light emission microscopy
IEEE Transactions on Nuclear Science
Novel application of transmission electron microscopy and scanning capacitance microscopy for defect root cause identification and yield enhancement
Electrostatic discharge/electrical overstress susceptibility in MEMS: A new failure mode
Proceedings of SPIE - The International Society for Optical Engineering
Focused ion beam damage to MOS integrated circuits
5 Results