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The effect of chrome adhesion layer on quartz resonator aging

Wessendorf, Kurt O.; Ohlhausen, J.A.

This SAND report documents a late start LDRD designed to determine the possible aging effects of a quartz resonator gold adhesion layer. Sandia uses quartz resonators for applications. These applications require a very stable frequency source with excellent aging (low drift) characteristics. These parts are manufactured by one of our qualified vendors outside Sandia Laboratories, Statek Corp. Over the years we, Sandia and the vendor, have seen aging variations that have not been completely explained by the typical mechanisms known in the industry. One theory was that the resonator metallization may be contributing to the resonator aging. This LDRD would allow us to test and analyze a group of resonators with known differentiating metallization and via accelerated aging determine if a chrome adhesion layer used to accept the final gold plating may contribute to poor aging. We worked with our main vendor to design and manufacture a set of quartz resonators with a wide range of metallization thickness ratios between the chrome and gold that will allow us determine the cause of this aging and which plating thickness ratios provide the best aging performance while not degrading other key characteristics.

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Experiences with the High Energy Resolution Optics (HERO) update on a physical electronics 690 auger system

Wallace, William O.; Ohlhausen, J.A.; Brumbach, Michael T.

We will present our experiences with the new High Energy Resolution Optics (HERO) upgrade on a Physical Electronics Auger 690 system. This upgrade allows the single pass cylindrical analyzer in the Auger system to achieve higher energy resolution than in the standard mode. With this upgrade, it should be possible to separate chemical states for certain elements. Also, it should be possible to separate closely spaced peaks from selected elements that have been difficult or impossible to separate without the upgrade. Specifically, we will investigate practical use of this upgrade in the analysis of materials systems where overlapping peaks have historically been an issue, such as Kovar, which consists of the elements Ni, Fe and Co. Strategies for the successful use of the technique as well as its current limitations will be shown.

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The role of polymer formation during vapor phase lubrication of silicon

Dugger, Michael T.; Ohlhausen, J.A.; Dirk, Shawn M.

The lubrication of silicon surfaces with alcohol vapors has recently been demonstrated. With a sufficient concentration of pentanol vapor present, sliding of a silica ball on an oxidized silicon wafer can proceed with no measurable wear. The initial results of time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of wear surfaces revealed a reaction product having thickness on the order of a monolayer, and with an ion spectrum that included fragments having molecular weights of 200 or more that occurred only inside the wear tracks. The parent alcohol molecule pentanol, has molecular weight of 88amu, suggesting that reactions of adsorbed alcohols on the wearing surfaces allowed polymerization of the alcohols to form higher molecular weight species. In addition to pin-on-disk studies, lubrication of silicon surfaces with pentanol vapors has also been demonstrated using MicroElectroMechanical Systems (MEMS) devices. Recent investigations of the reaction mechanisms of the alcohol molecules with the oxidized silicon surfaces have shown that wearless sliding requires a concentration of the alcohol vapor that is dependent upon the contact stress during sliding, with higher stress requiring a greater concentration of alcohol. Different vapor precursors including those with acid functionality, olefins, and methyl termination also produce polymeric reaction products, and can lubricate the silica surfaces. Doping the operating environment with oxygen was found to quench the formation of the polymeric reaction product, and demonstrates that polymer formation is not necessary for wearless sliding.

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Characterization of the surface changes during the activation process of erbium/erbium oxide for hydrogen storage

Brumbach, Michael T.; Zavadil, Kevin R.; Snow, Clark S.; Ohlhausen, J.A.

Erbium is known to effectively load with hydrogen when held at high temperature in a hydrogen atmosphere. To make the storage of hydrogen kinetically feasible, a thermal activation step is required. Activation is a routine practice, but very little is known about the physical, chemical, and/or electronic processes that occur during Activation. This work presents in situ characterization of erbium Activation using variable energy photoelectron spectroscopy at various stages of the Activation process. Modification of the passive surface oxide plays a significant role in Activation. The chemical and electronic changes observed from core-level and valence band spectra will be discussed along with corroborating ion scattering spectroscopy measurements.

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Characterization of the surface changes during the activation of erbium/erbium oxide for hydrogen storage

Zavadil, Kevin R.; Snow, Clark S.; Ohlhausen, J.A.

Erbium is known to effectively load with hydrogen when held at high temperature in a hydrogen atmosphere. To make the storage of hydrogen kinetically feasible, a thermal activation step is required. Activation is a routine practice, but very little is known about the physical, chemical, and/or electronic processes that occur during Activation. This work presents in situ characterization of erbium Activation using variable energy photoelectron spectroscopy at various stages of the Activation process. Modification of the passive surface oxide plays a significant role in Activation. The chemical and electronic changes observed from core-level and valence band spectra will be discussed along with corroborating ion scattering spectroscopy measurements.

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Predicting fracture in micron-scale polycrystalline silicon MEMS structures

Boyce, Brad B.; Foulk, James W.; Field, Richard V.; Ohlhausen, J.A.

Designing reliable MEMS structures presents numerous challenges. Polycrystalline silicon fractures in a brittle manner with considerable variability in measured strength. Furthermore, it is not clear how to use a measured tensile strength distribution to predict the strength of a complex MEMS structure. To address such issues, two recently developed high throughput MEMS tensile test techniques have been used to measure strength distribution tails. The measured tensile strength distributions enable the definition of a threshold strength as well as an inferred maximum flaw size. The nature of strength-controlling flaws has been identified and sources of the observed variation in strength investigated. A double edge-notched specimen geometry was also tested to study the effect of a severe, micron-scale stress concentration on the measured strength distribution. Strength-based, Weibull-based, and fracture mechanics-based failure analyses were performed and compared with the experimental results.

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Spectroscopy and capacitance measurements of tunneling resonances in an Sb-implanted point contact

Bishop, Nathaniel B.; Stevens, Jeffrey S.; Childs, Kenton D.; Ohlhausen, J.A.; Lilly, Michael L.; Carroll, Malcolm; Young, Ralph W.; Bielejec, Edward S.; Ten Eyck, Gregory A.; Wendt, J.R.; Rahman, Rajib R.; Grubbs, Robert K.

We fabricated a split-gate defined point contact in a double gate enhancement mode Si-MOS device, and implanted Sb donor atoms using a self-aligned process. E-beam lithography in combination with a timed implant gives us excellent control over the placement of dopant atoms, and acts as a stepping stone to focused ion beam implantation of single donors. Our approach allows us considerable latitude in experimental design in-situ. We have identified two resonance conditions in the point contact conductance as a function of split gate voltage. Using tunneling spectroscopy, we probed their electronic structure as a function of temperature and magnetic field. We also determine the capacitive coupling between the resonant feature and several gates. Comparison between experimental values and extensive quasi-classical simulations constrain the location and energy of the resonant level. We discuss our results and how they may apply to resonant tunneling through a single donor.

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LDRD 140639 final report : investigation of transmutation claims

Reich, Jeffrey E.; Grant, Richard P.; Ohlhausen, J.A.

The Proton-21 Laboratory in the Ukraine has been publishing results on shock-induced transmutation of several elements, including Cobalt 60 into non-radioactive elements. This report documents exploratory characterization of a shock-compressed Aluminum-6061 sample, which is the only available surrogate for the high-purity copper samples in the Proton-21 experiments. The goal was to determine Sandia's ability to detect possible shock-wave-induced transmutation products and to unambiguously validate or invalidate the claims in collaboration with the Proton-21 Laboratory. We have developed a suitable characterization process and tested it on the surrogate sample. Using trace elemental analysis capabilities, we found elevated and localized concentrations of impurity elements like the Ukrainians report. All our results, however, are consistent with the ejection of impurities that were not in solution in our alloy or were deposited from the cathode during irradiation or possibly storage. Based on the detection capabilities demonstrated and additional techniques available, we are positioned to test samples from Proton-21 if funded to do so.

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Results 51–75 of 121
Results 51–75 of 121