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Pinned, optically aligned diagnostic dock for use on the Z facility

Review of Scientific Instruments

Gomez, Matthew R.; Rochau, G.A.; Bailey, James E.; Dunham, Gregory S.; Kernaghan, M.D.; Gard, P.; Robertson, Grafton K.; Owen, A.C.; Argo, J.W.; Nielsen, D.S.; Lake, Patrick W.

The pinned optically aligned diagnostic dock (PODD) is a multi-configuration diagnostic platform designed to measure x-ray emission on the Z facility. The PODD houses two plasma emission acquisition (PEA) systems, which are aligned with a set of precision machined pins. The PEA systems are modular, allowing a single diagnostic housing to support several different diagnostics. The PEA configurations fielded to date include both time-resolved and time-integrated, 1D spatially resolving, elliptical crystal spectrometers, and time-integrated, 1D spatially resolving, convex crystal spectrometers. Additional proposed configurations include time-resolved, monochromatic mirrored pinhole imagers and arrays of filtered x-ray diodes, diamond photo-conducting diode detectors, and bolometers. The versatility of the PODD system will allow the diagnostic configuration of the Z facility to be changed without significantly adding to the turn-around time of the machine. Additionally, the PODD has been designed to allow instrument setup to be completed entirely off-line, leaving only a refined alignment process to be performed just prior to a shot, which is a significant improvement over the instrument the PODD replaces. Example data collected with the PODD are presented. © 2012 American Institute of Physics.

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TYPE Conference YEAR 2012
ScopusOSTI

Z facility diagnostic system for high energy density physics at Sandia National Laboratories

Leeper, Ramon J.; Deeney, Christopher D.; Dunham, Gregory S.; Fehl, David L.; Franklin, James K.; Hawn, Rona E.; Hall, Clint A.; Hurst, Michael J.; Jinzo, Tanya D.; Jobe, Daniel O.; Leeper, Ramon J.; Joseph, Nathan R.; Knudson, Marcus D.; Lake, Patrick W.; Lazier, Steven E.; Lucas, J.; McGurn, John S.; Manicke, Matthew P.; Mock, Raymond M.; Moore, T.C.; Nash, Thomas J.; Bailey, James E.; Nelson, Alan J.; Nielsen, D.S.; Olson, Richard E.; Pyle, John H.; Rochau, G.A.; Ruggles, Larry R.; Ruiz, Carlos L.; Sanford, Thomas W.; Seamen, Johann F.; Bennett, Guy R.; Simpson, Walter W.; Sinars, Daniel S.; Speas, Christopher S.; Stygar, William A.; Wenger, D.F.; Seamen, Johann J.; Carlson, Alan L.; Chandler, Gordon A.; Cooper, Gary W.; Cuneo, M.E.

Abstract not provided.

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TYPE Conference YEAR 2003
OSTI
Results 26–33 of 33
Results 26–33 of 33