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Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Apblett, Christopher A.; Small, Leo J.; Graham, Joseph G.
Abstract not provided.
Ihlefeld, Jon I.; Kotula, Paul G.; Gough, Dara G.; Lu, Ping L.; Spoerke, Erik D.; McKenzie, Bonnie B.; Rye, Michael J.; Brennecka, Geoffrey L.
Abstract not provided.
Brennecka, Geoffrey L.; Brown-Shaklee, Harlan J.; Shahin, David S.; Wilkerson, Ryan P.
Abstract not provided.
Brennecka, Geoffrey L.
Abstract not provided.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; McKenzie, Bonnie B.; Rye, Michael J.; Meyer, Kelsey M.
Abstract not provided.
Brennecka, Geoffrey L.; Ihlefeld, Jon I.; George, Matthew C.
Abstract not provided.
Journal of the Electrochemical Society
Small, Leo; Cook, Adam W.; Apblett, Christopher A.; Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Duquette, David
An electrochemical probe station (EPS) for automated electrochemical testing of electronic-grade thin films is presented. Similar in design to a scanning droplet cell, this modular system features a flexible probe tip capable of contacting both metallic and oxide surfaces. Using the highly sensitive Pt-H 2SO 4 system, it is demonstrated that the EPS obtains results equivalent to those of a traditional electrochemical cell. Further, electrical testing of thin film PbZr 0.52Ti 0.48O 3 shows that this system may be used to ascertain fundamental electrical properties of dielectric films. © 2012 The Electrochemical Society.
Meyer, Kelsey M.; Brown-Shaklee, Harlan J.; Shahin, David S.; Ihlefeld, Jon I.; Brennecka, Geoffrey L.
Abstract not provided.
Brennecka, Geoffrey L.; Ihlefeld, Jon I.; Apblett, Christopher A.; Small, Leo J.
Abstract not provided.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Meyer, Kelsey M.
Abstract not provided.
Brennecka, Geoffrey L.; Kotula, Paul G.; Rye, Michael J.; McKenzie, Bonnie B.; Meyer, Kelsey M.
Abstract not provided.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; Meyer, Kelsey M.
Abstract not provided.
Brennecka, Geoffrey L.; Meyer, Kelsey M.; Brown-Shaklee, Harlan J.; Shahin, David S.; George, Matthew C.; Ihlefeld, Jon I.
Abstract not provided.
Brennecka, Geoffrey L.; Brown-Shaklee, Harlan J.; Meyer, Kelsey M.; Shahin, David S.; Ihlefeld, Jon I.
Abstract not provided.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Kotula, Paul G.
Abstract not provided.
Brennecka, Geoffrey L.; George, Matthew C.; Burckel, David B.; Skinner, J.L.; Yang, Chu-Yeu P.; Steinhaus, Charles A.; Allendorf, Sarah W.
Abstract not provided.
Brennecka, Geoffrey L.; Meyer, Kelsey M.; Shahin, David S.; Brown-Shaklee, Harlan J.; Ihlefeld, Jon I.
Abstract not provided.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; McKenzie, Bonnie B.; Rye, Michael J.; Meyer, Kelsey M.
Abstract not provided.
Meyer, Kelsey M.; Kotula, Paul G.; Brennecka, Geoffrey L.; Ihlefeld, Jon I.
Abstract not provided.
Brennecka, Geoffrey L.; Ihlefeld, Jon I.
Abstract not provided.
Brennecka, Geoffrey L.; Ihlefeld, Jon I.
Abstract not provided.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Apblett, Christopher A.; Small, Leo J.; Graham, Joseph G.
Abstract not provided.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.
Abstract not provided.
Ihlefeld, Jon I.; Brennecka, Geoffrey L.
Abstract not provided.
Brennecka, Geoffrey L.; Ihlefeld, Jon I.; George, Matthew C.
Abstract not provided.
Results 51–75 of 121