Publications

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Time-resolved measurements of carrier recombination are reported for a midwave infrared InAs/InAs0.66Sb0.34 type-II superlattice (T2SL) as a function of pump intensity and sample temperature. By including the T2SL doping level in the analysis, the Shockley-Read-Hall (SRH), radiative, and Auger recombination components of the carrier lifetime are uniquely distinguished at each temperature. SRH is the limiting recombination mechanism for excess carrier densities less than the doping level (the low-injection regime) and temperatures less than 175 K. A SRH defect energy of 95 meV, either below the T2SL conduction-band edge or above the T2SL valence-band edge, is identified. Auger recombination limits the carrier lifetimes for excess carrier densities greater than the doping level (the high-injection regime) for all temperatures tested. Additionally, at temperatures greater than 225 K, Auger recombination also limits the low-injection carrier lifetime due to the onset of the intrinsic temperature range and large intrinsic carrier densities. Radiative recombination is found to not have a significant contribution to the total lifetime for all temperatures and injection regimes, with the data implying a photon recycling factor of 15. Using the measured lifetime data, diffusion currents are calculated and compared to calculated Hg1-xCdxTe dark current, indicating that the T2SL can have a lower dark current with mitigation of the SRH defect states. These results illustrate the potential for InAs/InAs1-xSbx T2SLs as absorbers in infrared photodetectors.

We present an extensive characterization of the minority carrier transport properties in an nBn mid-wave infrared detector incorporating a Ga-free InAs/InAsSb type-II superlattice as the absorbing region. Using a modified electron beam induced current technique in conjunction with time-resolved photoluminescence, we were able to determine several important transport parameters of the absorber region in the device, which uses a barrier layer to reduce dark current. For a device at liquid He temperatures, we report a minority carrier diffusion length of 750 nm and a minority carrier lifetime of 200 ns, with a vertical diffusivity of 3 × 10-2 cm2/s. We also report on the device's optical response characteristics at 78 K.

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Thermal detection has made extensive progress in the last 40 years, however, the speed and detectivity can still be improved. The advancement of silicon photonic microring resonators has made them intriguing for detection devices due to their small size and high quality factors. Implementing silicon photonic microring or microdisk resonators as a means of a thermal detector gives rise to higher speed and detectivity, as well as lower noise compared to conventional devices with electrical readouts. This LDRD effort explored the design and measurements of silicon photonic microdisk resonators used for thermal detection. The characteristic values, consisting of the thermal time constant ({tau} {approx} 2 ms) and noise equivalent power were measured and found to surpass the performance of the best microbolometers. Furthermore the detectivity was found to be D{sub {lambda}} = 2.47 x 10{sup 8} cm {center_dot} {radical}Hz/W at 10.6 {mu}m which is comparable to commercial detectors. Subsequent design modifications should increase the detectivity by another order of magnitude. Thermal detection in the terahertz (THz) remains underdeveloped, opening a door for new innovative technologies such as metamaterial enhanced detectors. This project also explored the use of metamaterials in conjunction with a cantilever design for detection in the THz region and demonstrated the use of metamaterials as custom thin film absorbers for thermal detection. While much work remains to integrate these technologies into a unified platform, the early stages of research show promising futures for use in thermal detection.

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