Reverse Annealing Comparisons of PnP and Npn III-V HBTs under Ion Irradiation - Probing the Effects of Thermal and Current Injection Annealing
Abstract not provided.
Publications
Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in TaOx Memristors
Abstract not provided.
A Low Noise Detection Circuit for Probing the Structure of Damage Cascades with IBIC
Abstract not provided.
Micro-systems for Scalable QKD Components
Abstract not provided.
Radiation Testing Capability for Electronic Devices and Circuits at Sandia's Ion Beam Laboratory
Abstract not provided.
Localization of Conductive Filaments in TaOx Memristor using Focused Ion Beam Irradiation
Abstract not provided.
A Low Noise Detection Circuit for Probing the Structure of Damage Cascades with IBIC
Abstract not provided.
Test simulation of neutron damage to electronic components using accelerator facilities
Abstract not provided.
Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors
Abstract not provided.
Si quantum dots with counted Sb donors
Abstract not provided.
Manipulating single electrons in semiconductor devices for quantum computing
Abstract not provided.
Radiation-Induced Resistance Changes in TaOx and TiO2 Memristors
Abstract not provided.
Advanced Nanofabrication of Single Donor Devices using Top-Down Implantation
Abstract not provided.
Potential Evidence for Post-Irradiation Defect Evolution Resulting in Enhanced Gain Degradation
Abstract not provided.
A Comparison of the Radiation Response of TaOx and TiO2 Memristors
Abstract not provided.
A Comparison of the Radiation Response of TaOx and TiO2 Memristors
Abstract not provided.
Radiation Effects on TaOx ReRAM: A Candidate for Rad-Hard Memory
Abstract not provided.
Chip-scale Quantum Phonodynamics: Realizing "Phonitons" the Sound-based analogue of Quantum Electrodynamics
Abstract not provided.
Fabrication of Single Donor Devices for Quantum Computation using Focused Top-Down Ion Implantation
Abstract not provided.
Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories
Abstract not provided.
Revisiting Recombination Current in Electron Ion and Neutron Damaged GaAs Diodes
Abstract not provided.
Single Ion Implant of Self-Aligned Poly-Silicon Nanostructures
Abstract not provided.
Controlled deterministic Implantation at the limit of ion straggle by nanostencil lithography
Abstract not provided.
Single Ion Implant of Self-Aligned Poly-Silicon Nanostructures
Abstract not provided.
Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories
Abstract not provided.
Results 176–200 of 249