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Agarwal, Sapan A. ; Jacobs-Gedrim, Robin B. ; Hsia, Alexander W. ; Hughart, David R. ; Fuller, Elliot J. ; Talin, A.A. ; James, Conrad D. ; Plimpton, Steven J. ; Marinella, Matthew J.
Proceedings of the International Joint Conference on Neural Networks
Agarwal, Sapan A. ; Plimpton, Steven J. ; Hughart, David R. ; Hsia, Alexander W. ; Richter, Isaac; Cox, Jonathan A. ; James, Conrad D. ; Marinella, Matthew J.
Resistive memories enable dramatic energy reductions for neural algorithms. We propose a general purpose neural architecture that can accelerate many different algorithms and determine the device properties that will be needed to run backpropagation on the neural architecture. To maintain high accuracy, the read noise standard deviation should be less than 5% of the weight range. The write noise standard deviation should be less than 0.4% of the weight range and up to 300% of a characteristic update (for the datasets tested). Asymmetric nonlinearities in the change in conductance vs pulse cause weight decay and significantly reduce the accuracy, while moderate symmetric nonlinearities do not have an effect. In order to allow for parallel reads and writes the write current should be less than 100 nA as well.
Goeke, Ronald S. ; Hughart, David R. ; Jacobs-Gedrim, Robin B. ; Smith, Carl S. ; James, Conrad D. ; Marinella, Matthew J.
Jacobs-Gedrim, Robin B. ; Hughart, David R. ; Agarwal, Sapan A. ; Finnegan, Patrick S. ; Goeke, Ronald S. ; Van Heukelom, Michael V. ; Nowlin, Joshua N. ; Wagner, Jamison W. ; James, Conrad D. ; Marinella, Matthew J.
James, Conrad D. ; Severa, William M. ; Draelos, Timothy J. ; Aimone, James B. ; Vineyard, Craig M. ; Agarwal, Sapan A. ; Hsia, Alexander W. ; Hughart, David R. ; Finnegan, Patrick S. ; Jacobs-Gedrim, Robin B. ; Fuller, Elliot J. ; Talin, A.A. ; Marinella, Matthew J. ; Schiek, Richard S. ; Plimpton, Steven J.
Smith, Carl S. ; Goeke, Ronald S. ; Jacobs-Gedrim, Robin B. ; Marinella, Matthew J. ; Hughart, David R.
Goeke, Ronald S. ; Marinella, Matthew J. ; Hughart, David R. ; Decker, Seth D.
Marinella, Matthew J. ; Agarwal, Sapan A. ; Talin, A.A. ; McCormick, Frederick B. ; Plimpton, Steven J. ; El Gabaly Marquez, Farid E. ; Fuller, Elliot J. ; Jacobs-Gedrim, Robin B. ; Hughart, David R. ; Goeke, Ronald S. ; Hsia, Alexander W.
Marinella, Matthew J. ; Agarwal, Sapan A. ; Plimpton, Steven J. ; Talin, A.A. ; El Gabaly Marquez, Farid E. ; Fuller, Elliot J. ; Hughart, David R. ; Parekh, Ojas D. ; DeBenedictis, Erik ; Goeke, Ronald S. ; Hsia, Alexander W. ; Aimone, James B. ; James, Conrad D.
Agarwal, Sapan A. ; Plimpton, Steven J. ; Hughart, David R. ; Hsia, Alexander W. ; Richter, Isaac R. ; Cox, Jonathan A.; James, Conrad D. ; Marinella, Matthew J.
Marinella, Matthew J. ; Agarwal, Sapan A. ; Fuller, Elliot J. ; Talin, A.A. ; El Gabaly Marquez, Farid E. ; Jacobs-Gedrim, Robin B. ; Hughart, David R. ; Goeke, Ronald S. ; Hsia, Alexander W. ; Schiek, Richard S. ; Plimpton, Steven J. ; James, Conrad D.
Journal of Physics. D, Applied Physics
Hughart, David R. ; Gao, Xujiao G. ; Mamaluy, Denis M. ; Marinella, Matthew J. ; Mickel, Patrick R.
We present a study of the 'snap-back' regime of resistive switching hysteresis in bipolar TaOx memristors, identifying power signatures in the electronic transport. Using a simple model based on the thermal and electric field acceleration of ionic mobilities, we provide evidence that the 'snap-back' transition represents a crossover from a coupled thermal and electric-field regime to a primarily thermal regime, and is dictated by the reconnection of a ruptured conducting filament. We discuss how these power signatures can be used to limit filament radius growth, which is important for operational properties such as power, speed, and retention.
Smith, Carl S. ; Goeke, Ronald S. ; Hughart, David R. ; Marinella, Matthew J. ; Kotula, Paul G.
Marinella, Matthew J. ; Agarwal, Sapan A. ; Hughart, David R. ; Plimpton, Steven J. ; Parekh, Ojas D. ; Quach, Tu-Thach Q. ; DeBenedictis, Erik ; Goeke, Ronald S. ; Hsia, Alexander W. ; Aimone, James B. ; James, Conrad D.
Agarwal, Sapan A. ; Plimpton, Steven J. ; Parekh, Ojas D. ; Hsia, Alexander W. ; Quach, Tu-Thach Q. ; Hughart, David R. ; Richter, Isaac R.; DeBenedictis, Erik ; James, Conrad D. ; Aimone, James B. ; Marinella, Matthew J.
Marinella, Matthew J. ; Agarwal, Sapan A. ; Hughart, David R. ; Plimpton, Steven J. ; Parekh, Ojas D. ; Quach, Tu-Thach Q. ; DeBenedictis, Erik ; Goeke, Ronald S. ; Hsia, Alexander W. ; Aimone, James B. ; James, Conrad D.
Pacheco, Jose L. ; Hughart, David R. ; Vizkelethy, Gyorgy V. ; Bielejec, Edward S. ; Marinella, Matthew J.
Tierney, Brian D. ; Hjalmarson, Harold P. ; McLain, Michael L. ; Hughart, David R. ; Marinella, Matthew J. ; Mamaluy, Denis M.
Pacheco, Jose L. ; Hughart, David R. ; Vizkelethy, Gyorgy V. ; Bielejec, Edward S. ; Marinella, Matthew J.
Hughart, David R. ; Kao, Wei-Chieh K.; Goryll, Michael G.; Jiao, ChunKun J.; Dhar, Sarit D.; Cooper, James A.; Schroder, Dieter S.; Atcitty, Stanley A. ; Flicker, Jack D. ; Marinella, Matthew J. ; Kaplar, Robert K.
Hughart, David R. ; Kao, Wei-Chieh K.; Goryll, Michael G.; Jiao, ChunKun J.; Dhar, Sarit D.; Cooper, James A.; Schroder, Dieter S.; Atcitty, Stanley A. ; Flicker, Jack D. ; Marinella, Matthew J. ; Kaplar, Robert K.
Hughart, David R. ; Kao, Wei-Chieh K.; Goryll, Michael G.; Jiao, ChunKun J.; Dhar, Sarit D.; Cooper, James A.; Schroder, Dieter S.; Atcitty, Stanley A. ; Flicker, Jack D. ; Marinella, Matthew J. ; Kaplar, Robert K.
Hughart, David R.
Reeves, Kylie R. ; Nowlin, Joshua N. ; Hughart, David R. ; Goeke, Ronald S. ; James, Conrad D. ; Marinella, Matthew J.
Marinella, Matthew J. ; Hughart, David R. ; Stevens, James E. ; Mickel, Patrick R. ; Haase, Gad S. ; Decker, Seth D. ; Apodaca, Roger A. ; Bielejec, Edward S. ; Vizkelethy, Gyorgy V. ; McLain, Michael L.
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