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Final report on LDRD project : narrow-linewidth VCSELs for atomic microsystems

Serkland, Darwin K.; Chow, Weng W.; Geib, K.M.; Peake, Gregory M.

Vertical-cavity surface-emitting lasers (VCSELs) are well suited for emerging photonic microsystems due to their low power consumption, ease of integration with other optical components, and single frequency operation. However, the typical VCSEL linewidth of 100 MHz is approximately ten times wider than the natural linewidth of atoms used in atomic beam clocks and trapped atom research, which degrades or completely destroys performance in those systems. This report documents our efforts to reduce VCSEL linewidths below 10 MHz to meet the needs of advanced sub-Doppler atomic microsystems, such as cold-atom traps. We have investigated two complementary approaches to reduce VCSEL linewidth: (A) increasing the laser-cavity quality factor, and (B) decreasing the linewidth enhancement factor (alpha) of the optical gain medium. We have developed two new VCSEL devices that achieved increased cavity quality factors: (1) all-semiconductor extended-cavity VCSELs, and (2) micro-external-cavity surface-emitting lasers (MECSELs). These new VCSEL devices have demonstrated linewidths below 10 MHz, and linewidths below 1 MHz seem feasible with further optimization.

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Feedback in close-coupled axial VCSEL-photodiode pairs

Proceedings of SPIE - The International Society for Optical Engineering

Geib, Kent M.; Serkland, Darwin K.; Peake, Gregory M.; Sanchez, Victoria M.

We have been investigating the use of coaxial multimode VCSEL/PD (vertical cavity surface emitting laser/photodiode) pairs for positional sensing with emitter to target mirror distances on the order of 1mm. We have observed large variations in signal levels due to the strong optical feedback in these close-coupled systems, employing either heterogeneously integrated commercial components or our own monolithically integrated devices. The feedback effect is larger than anticipated due to the annular geometry of the photodetector. Even though there is very little change in the measured VCSEL total output power, the optical feedback induces variations in the transverse mode distributions in these multimode VCSELs. The higher order modes have a larger divergence angle resulting in changes in the reflected light power incident upon the active detector area for a large range of emitter/mirror separations. We will review the experimental details and provide strategies for avoiding these variations in detected power. © 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

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High-speed reflective S-SEEDs for photonic logic circuits

2009 International Conference on Photonics in Switching, PS '09

Keeler, Gordon A.; Serkland, Darwin K.; Overberg, Mark E.; Geib, K.M.; Gill, D.D.; Mukherjee, Sayan M.; Hsu, Alan Y.; Clevenger, Jascinda C.; Baiocchi, D.; Sweatt, W.C.

We demonstrate the operation of low-power reflective S-SEEDs with 6-ps switching times at a 2-Volt bias. Efficient refractive micro-optics are used to optically interconnect multiple S-SEED gates. The technology platform is expected to enable dense photonic logic circuits for high-speed telecommunications-related applications. © 2009 IEEE.

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Growth, fabrication, and characterization of high-speed 1550-nm S-SEEDs for all-optical logic

ECS Transactions

Keeler, Gordon A.; Serkland, Darwin K.; Overberg, Mark E.; Klem, John F.; Geib, K.M.; Clevenger, Jascinda C.; Hsu, Alan Y.; Hadley, G.R.

We describe recent advances in the development of 1550-nm symmetric self-electrooptic effect devices (S-SEEDs). S-SEEDs are semiconductor optoelectronic devices used to implement ultrafast all-optical logic functions: for optical fiber communication applications. In this paper, basic S-SEED operation is described, followed by a detailed explanation of the optimization techniques used to improve DC and high-speed performance in these long wavelength devices. Both epitaxial strain and quantum well design are shown to be important for S-SEEDs grown in the InAlGaAs quaternary material system. The device fabrication approach is outlined, and DC electrical and optical performance is discussed. Finally, we describe the high-speed optoelectronic measurements used to determine S-SEED switching characteristics. The devices described herein are the first known S-SEEDs to operate at telecommunications- compatible wavelengths and demonstrate record switching speeds with rail-to-rail switching rates faster than 6 picoseconds. © The Electrochemical Society.

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17 G directly modulated datacom VCSELs

2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS

Johnson, Ralph H.; Serkland, Darwin K.

The next generation 850 nm datacom VCSEL to go into production will be the 17 G VCSEL. It is not certain that direct modulation will be suitable given the reliability, supply voltage, and temperature range required. This paper is a first look at VCSELs designed and targeted for production 17 G use. The design is discussed and LIV and small signal frequency response is presented. © 2008 Optical Society of America.

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Final report on LDRD project : advanced optical trigger systems

Serkland, Darwin K.; Mar, Alan M.; Geib, K.M.; Peake, Gregory M.; Roose, Lars D.; Keeler, Gordon A.; Hadley, G.R.; Loubriel, Guillermo M.; Sullivan, Charles T.

Advanced optically-activated solid-state electrical switch development at Sandia has demonstrated multi-kA/kV switching and the path for scalability to even higher current/power. Realization of this potential requires development of new optical sources/switches based on key Sandia photonic device technologies: vertical-cavity surface-emitting lasers (VCSELs) and photoconductive semiconductor switch (PCSS) devices. The key to increasing the switching capacity of PCSS devices to 5kV/5kA and higher is to distribute the current in multiple parallel line filaments triggered by an array of high-brightness line-shaped illuminators. Commercial mechanically-stacked edge-emitting lasers have been used to trigger multiple filaments, but they are difficult to scale and manufacture with the required uniformity. In VCSEL arrays, adjacent lasers utilize identical semiconductor material and are lithographically patterned to the required dimensions. We have demonstrated multiple-line filament triggering using VCSEL arrays to approximate line generation. These arrays of uncoupled circular-aperture VCSELs have fill factors ranging from 2% to 30%. Using these arrays, we have developed a better understanding of the illumination requirements for stable triggering of multiple-filament PCSS devices. Photoconductive semiconductor switch (PCSS) devices offer advantages of high voltage operation (multi-kV), optical isolation, triggering with laser pulses that cannot occur accidentally in nature, low cost, high speed, small size, and radiation hardness. PCSS devices are candidates for an assortment of potential applications that require multi-kA switching of current. The key to increasing the switching capacity of PCSS devices to 5kV/5kA and higher is to distribute the current in multiple parallel line filaments triggered by an array of high-brightness line-shaped illuminators. Commercial mechanically-stacked edge-emitting lasers have been demonstrated to trigger multiple filaments, but they are difficult to scale and manufacture with the required uniformity. As a promising alternative to multiple discrete edge-emitting lasers, a single wafer of vertical-cavity surface-emitting lasers (VCSELs) can be lithographically patterned to achieve the desired layout of parallel line-shaped emitters, in which adjacent lasers utilize identical semiconductor material and thereby achieve a degree of intrinsic optical uniformity. Under this LDRD project, we have fabricated arrays of uncoupled circular-aperture VCSELs to approximate a line-shaped illumination pattern, achieving optical fill factors ranging from 2% to 30%. We have applied these VCSEL arrays to demonstrate single and dual parallel line-filament triggering of PCSS devices. Moreover, we have developed a better understanding of the illumination requirements for stable triggering of multiple-filament PCSS devices using VCSEL arrays. We have found that reliable triggering of multiple filaments requires matching of the turn-on time of adjacent VCSEL line-shaped-arrays to within approximately 1 ns. Additionally, we discovered that reliable triggering of PCSS devices at low voltages requires more optical power than we obtained with our first generation of VCSEL arrays. A second generation of higher-power VCSEL arrays was designed and fabricated at the end of this LDRD project, and testing with PCSS devices is currently underway (as of September 2008).

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Electronic/photonic interfaces for ultrafast data processing

Keeler, Gordon A.; Serkland, Darwin K.; Hsu, Alan Y.; Geib, K.M.; Overberg, Mark E.

This report summarizes a 3-month program that explored the potential areas of impact for electronic/photonic integration technologies, as applied to next-generation data processing systems operating within 100+ Gb/s optical networks. The study included a technology review that targeted three key functions of data processing systems, namely receive/demultiplexing/clock recovery, data processing, and transmit/multiplexing. Various technical approaches were described and evaluated. In addition, we initiated the development of high-speed photodetectors and hybrid integration processes, two key elements of an ultrafast data processor. Relevant experimental results are described herein.

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Final report on LDRD project 105967 : exploring the increase in GaAs photodiode responsivity with increased neutron fluence

Blansett, Ethan B.; Serkland, Darwin K.; Geib, K.M.; Peake, Gregory M.; Fleming, Robert M.; Wrobel, Diana L.

A previous LDRD studying radiation hardened optoelectronic components for space-based applications led to the result that increased neutron irradiation from a fast-burst reactor caused increased responsivity in GaAs photodiodes up to a total fluence of 4.4 x 10{sup 13} neutrons/cm{sup 2} (1 MeV Eq., Si). The silicon photodiodes experienced significant degradation. Scientific literature shows that neutrons can both cause defects as well as potentially remove defects in an annealing-like process in GaAs. Though there has been some modeling that suggests how fabrication and radiation-induced defects can migrate to surfaces and interfaces in GaAs and lead to an ordering effect, it is important to consider how these processes affect the performance of devices, such as the basic GaAs p-i-n photodiode. In this LDRD, we manufactured GaAs photodiodes at the MESA facility, irradiated them with electrons and neutrons at the White Sands Missile Range Linac and Fast Burst Reactor, and performed measurements to show the effect of irradiation on dark current, responsivity and high-speed bandwidth.

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Integrated NEMS and optoelectronics for sensor applications

Czaplewski, David A.; Krishnamoorthy, Uma K.; Okandan, Murat O.; Olsson, Roy H.; Serkland, Darwin K.; Warren, M.E.

This work utilized advanced engineering in several fields to find solutions to the challenges presented by the integration of MEMS/NEMS with optoelectronics to realize a compact sensor system, comprised of a microfabricated sensor, VCSEL, and photodiode. By utilizing microfabrication techniques in the realization of the MEMS/NEMS component, the VCSEL and the photodiode, the system would be small in size and require less power than a macro-sized component. The work focused on two technologies, accelerometers and microphones, leveraged from other LDRD programs. The first technology was the nano-g accelerometer using a nanophotonic motion detection system (67023). This accelerometer had measured sensitivity of approximately 10 nano-g. The Integrated NEMS and optoelectronics LDRD supported the nano-g accelerometer LDRD by providing advanced designs for the accelerometers, packaging, and a detection scheme to encapsulate the accelerometer, furthering the testing capabilities beyond bench-top tests. A fully packaged and tested die was never realized, but significant packaging issues were addressed and many resolved. The second technology supported by this work was the ultrasensitive directional microphone arrays for military operations in urban terrain and future combat systems (93518). This application utilized a diffraction-based sensing technique with different optical component placement and a different detection scheme from the nano-g accelerometer. The Integrated NEMS LDRD supported the microphone array LDRD by providing custom designs, VCSELs, and measurement techniques to accelerometers that were fabricated from the same operational principles as the microphones, but contain proof masses for acceleration transduction. These devices were packaged at the end of the work.

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Multi-filament triggering of PCSS for high current utilizing VCSEL triggers

PPPS-2007 - Pulsed Power Plasma Science 2007

Mar, Alan; Serkland, Darwin K.; Keeler, Gordon A.; Roose, Lars D.; Geib, K.M.; Loubriel, Guillermo M.; Zutavern, Fred J.

We are developing advanced optically-activated solid-state switch technology for Firing Sets. Advanced switch development at Sandia has demonstrated multikA/kV switching and the path for scalability to even higher current/power, resulting in good prospects for sprytron replacement and other even higher current pulsed power switching applications. Realization of this potential requires development of new optical sources/switches based on key Sandia photonic device technologies: vertical-cavity surface-emitting lasers (VCSELs) and photoconductive semiconductor switch (PCSS) devices. The key to increasing the switching capacity of PCSS devices to 5kV/5kA and higher has been to distribute the current in multiple parallel line filaments triggered by an array of high-brightness line-shaped illuminators.1 This was limited by commercial mechanically-stacked edgeemitting lasers, which are difficult to scale and manufacture with the required uniformity. In VCSEL arrays, adjacent lasers utilize identical semiconductor material and are lithographically patterned to the required aspect ratio. However, we have demonstrated that good optical uniformity in rectangular-aperture (e.g. 5-by- 500μmu; m) VCSELs is difficult to achieve due to the lack of optical confinement in the long dimension. We have demonstrated line filament triggering using 1-D VCSEL arrays to approximate line generation. These arrays of uncoupled circular-aperture VCSELs have fill factors ranging from 2% to 40%. Using these arrays, we are developing a better understanding of the illumination requirements for stable triggering of multiple-filament PCSS devices. In particular, we are examining the dependence of filament formation versus the illumination fill factor and spatial brightness along the length of the filament. Ultimately, we will apply effective index techniques, pioneered at Sandia for leaky-mode VCSELs, to create a lateral photonic lattice that selects a single transverse mode with high brightness and uniformity for even higher fill factors and illumination unformity.2 These sources will be developed and tested with complementary PCSS designs employing interdigitatedmulti-filament contacts for high-power switching. ©2007 IEEE.

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Final LDRD report : development of advanced UV light emitters and biological agent detection strategies

Crawford, Mary H.; Armstrong, Andrew A.; Allerman, A.A.; Figiel, J.J.; Schmitt, Randal L.; Serkland, Darwin K.

We present the results of a three year LDRD project which has focused on the development of novel, compact, ultraviolet solid-state sources and fluorescence-based sensing platforms that apply such devices to the sensing of biological and nuclear materials. We describe our development of 270-280 nm AlGaN-based semiconductor UV LEDs with performance suitable for evaluation in biosensor platforms as well as our development efforts towards the realization of a 340 nm AlGaN-based laser diode technology. We further review our sensor development efforts, including evaluation of the efficacy of using modulated LED excitation and phase sensitive detection techniques for fluorescence detection of bio molecules and uranyl-containing compounds.

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The chip-scale atomic clock : prototype evaluation

Serkland, Darwin K.; Geib, K.M.; Peake, Gregory M.

The authors have developed a chip-scale atomic clock (CSAC) for applications requiring atomic timing accuracy in portable battery-powered applications. At PTTI/FCS 2005, they reported on the demonstration of a prototype CSAC, with an overall size of 10 cm{sup 3}, power consumption > 150 mW, and short-term stability sy(t) < 1 x 10-9t-1/2. Since that report, they have completed the development of the CSAC, including provision for autonomous lock acquisition and a calibrated output at 10.0 MHz, in addition to modifications to the physics package and system architecture to improve performance and manufacturability.

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Ultrasensitive directional microphone arrays for military operations in urban terrain

Okandan, Murat O.; Parker, Eric P.; Resnick, Paul J.; Serkland, Darwin K.

Acoustic sensing systems are critical elements in detection of sniper events. The microphones developed in this project enable unique sensing systems that benefit significantly from the enhanced sensitivity and extremely compact foot-print. Surface and bulk micromachining technologies developed at Sandia have allowed the design, fabrication and characterization of these unique sensors. We have demonstrated sensitivity that is only available in 1/2 inch to 1 inch studio reference microphones--with our devices that have only 1 to 2mm diameter membranes in a volume less than 1cm{sup 3}.

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VCSEL polarization control for chip-scale atomic clocks

Keeler, Gordon A.; Geib, K.M.; Serkland, Darwin K.; Peake, Gregory M.; Wendt, J.R.

Sandia National Laboratories and Mytek, LLC have collaborated to develop a monolithically-integrated vertical-cavity surface-emitting laser (VCSEL) assembly with controllable polarization states suitable for use in chip-scale atomic clocks. During the course of this work, a robust technique to provide polarization control was modeled and demonstrated. The technique uses deeply-etched surface gratings oriented at several different rotational angles to provide VCSEL polarization stability. A rigorous coupled-wave analysis (RCWA) model was used to optimize the design for high polarization selectivity and fabrication tolerance. The new approach to VCSEL polarization control may be useful in a number of defense and commercial applications, including chip-scale atomic clocks and other low-power atomic sensors.

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Control of VCSEL polarization using deeply etched surface gratings

Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

Keeler, Gordon A.; Geib, K.M.; Serkland, Darwin K.; Peake, Gregory M.; Wendt, J.R.

We demonstrate a robust approach to VCSEL polarization control using deeply-etched surface gratings oriented at several different rotational angles. A RCWA model is used to optimize the design for high polarization selectivity and fabrication tolerance. © 2006 Optical Society of America.

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Final report on LDRD project : single-photon-sensitive imaging detector arrays at 1600 nm

Serkland, Darwin K.; Childs, Kenton D.; Koudelka, Robert K.; Geib, K.M.; Klem, John F.; Hawkins, Samuel D.; Patel, Rupal K.

The key need that this project has addressed is a short-wave infrared light detector for ranging (LIDAR) imaging at temperatures greater than 100K, as desired by nonproliferation and work for other customers. Several novel device structures to improve avalanche photodiodes (APDs) were fabricated to achieve the desired APD performance. A primary challenge to achieving high sensitivity APDs at 1550 nm is that the small band-gap materials (e.g., InGaAs or Ge) necessary to detect low-energy photons exhibit higher dark counts and higher multiplication noise compared to materials like silicon. To overcome these historical problems APDs were designed and fabricated using separate absorption and multiplication (SAM) regions. The absorption regions used (InGaAs or Ge) to leverage these materials 1550 nm sensitivity. Geiger mode detection was chosen to circumvent gain noise issues in the III-V and Ge multiplication regions, while a novel Ge/Si device was built to examine the utility of transferring photoelectrons in a silicon multiplication region. Silicon is known to have very good analog and GM multiplication properties. The proposed devices represented a high-risk for high-reward approach. Therefore one primary goal of this work was to experimentally resolve uncertainty about the novel APD structures. This work specifically examined three different designs. An InGaAs/InAlAs Geiger mode (GM) structure was proposed for the superior multiplication properties of the InAlAs. The hypothesis to be tested in this structure was whether InAlAs really presented an advantage in GM. A Ge/Si SAM was proposed representing the best possible multiplication material (i.e., silicon), however, significant uncertainty existed about both the Ge material quality and the ability to transfer photoelectrons across the Ge/Si interface. Finally a third pure germanium GM structure was proposed because bulk germanium has been reported to have better dark count properties. However, significant uncertainty existed about the quantum efficiency at 1550 nm the necessary operating temperature. This project has resulted in several conclusions after fabrication and measurement of the proposed structures. We have successfully demonstrated the Ge/Si proof-of-concept in producing high analog gain in a silicon region while absorbing in a Ge region. This has included significant Ge processing infrastructure development at Sandia. However, sensitivity is limited at low temperatures due to high dark currents that we ascribe to tunneling. This leaves remaining uncertainty about whether this structure can achieve the desired performance with further development. GM detection in InGaAs/InAlAs, Ge/Si, Si and pure Ge devices fabricated at Sandia was shown to overcome gain noise challenges, which represents critical learning that will enable Sandia to respond to future single photon detection needs. However, challenges to the operation of these devices in GM remain. The InAlAs multiplication region was not found to be significantly superior to current InP regions for GM, however, improved multiplication region design of InGaAs/InP APDs has been highlighted. For Ge GM detectors it still remains unclear whether an optimal trade-off of parameters can achieve the necessary sensitivity at 1550 nm. To further examine these remaining questions, as well as other application spaces for these technologies, funding for an Intelligence Community post-doc was awarded this year.

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In-situ optical time-domain reflectometry (OTDR) for VCSEL-based communication systems

Proceedings of SPIE - The International Society for Optical Engineering

Keeler, Gordon A.; Serkland, Darwin K.; Geib, K.M.; Klem, John F.; Peake, Gregory M.

Optical lime-domain reflectometry (OTDR) is an effeclive technique for locating faults in fiber communication links. The fact that most OTDR measurements are performed manually is a significant drawback, because it makes them too costly for use in many short-distance networks and too slow for use in military avionic platforms. Here we describe and demonstrate an automated, low-cost, real-time approach to fault monitoring that can be achieved by integrating OTDR functionality directly into VCSEL-based transceivers. This built-in test capability is straightforward to implement and relevant to both multimode and single mode networks. In-situ OTDR uses the transmitter VCSEL already present in data transceivers. Fault monitoring is performed by emitting a brief optical pulse into the fiber and then turning the VCSEL off. If a fault exists, a portion of the optical pulse returns to the transceiver after a time equal to the round-trip delay through the fiber. In multimode OTDR, the signal is detected by an integrated photodetector, while in single mode OTDR the VCSEL itself can be used as a detector. Modified driver electronics perform the measurement and analysis. We demonstrate that VCSEL-based OTDR has sufficient sensitivity to determine the location of most faults commonly seen in short-haul networks (i.e., the Fresnel reflections from improperly terminated fibers and scattering from raggedly-broken fibers). Results are described for single mode and multimode experiments, at both 850 nm and 1.3 μm. We discuss the resolution and sensitivity that have been achieved, as well as expected limitations for this novel approach to network monitoring.

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High slope efficiency measured from a composite-resonator vertical-cavity laser

IEEE Photonics Technology Letters

Grasso, D.M.; Choquette, K.D.; Serkland, Darwin K.; Peake, G.M.; Geib, K.M.

We report high differential slope of the light versus current (L-I) characteristic in excess of 400% external quantum efficiency from a monolithic dual resonator vertical-cavity surface-emitting laser. The additional optical cavity of the composite resonator can provide gain or loss to the distributed laser mode, depending on the bias conditions. We describe the factors contributing to the internal optical loss, and present a qualitative model for the L-I characteristic. With sufficient current injected into the top cavity, the composite-resonator vertical-cavity laser achieves over 6 W/A of differential slope efficiency from threshold to greater than 1 mW of output power, which may be applicable for analog optical data links. © 2006 IEEE.

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Final report on LDRD project :leaky-mode VCSELs for photonic logic circuits

Serkland, Darwin K.; Geib, K.M.; Peake, Gregory M.; Hadley, G.R.; Hargett, Terry H.; Keeler, Gordon A.; Blansett, Ethan B.; Diaz, Melissa R.; Sullivan, Charles T.

This report describes the research accomplishments achieved under the LDRD Project ''Leaky-mode VCSELs for photonic logic circuits''. Leaky-mode vertical-cavity surface-emitting lasers (VCSELs) offer new possibilities for integration of microcavity lasers to create optical microsystems. A leaky-mode VCSEL output-couples light laterally, in the plane of the semiconductor wafer, which allows the light to interact with adjacent lasers, modulators, and detectors on the same wafer. The fabrication of leaky-mode VCSELs based on effective index modification was proposed and demonstrated at Sandia in 1999 but was not adequately developed for use in applications. The aim of this LDRD has been to advance the design and fabrication of leaky-mode VCSELs to the point where initial applications can be attempted. In the first and second years of this LDRD we concentrated on overcoming previous difficulties in the epitaxial growth and fabrication of these advanced VCSELs. In the third year, we focused on applications of leaky-mode VCSELs, such as all-optical processing circuits based on gain quenching.

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Results 51–100 of 111
Results 51–100 of 111