PV Lifetime Project: Measuring PV Module Performance Degradation: 2018 Indoor Flash Testing Results
Abstract not provided.
Publications
PV Lifetime Project ? Challenges of Measuring PV Module Degradation
Abstract not provided.
Automatic fault classification of photovoltaic strings based on an in situ IV characterization system and a Gaussian process algorithm
Conference Record of the IEEE Photovoltaic Specialists Conference
Current-voltage (I-V) curve traces of photovoltaic (PV) systems can provide detailed information for diagnosing fault conditions. The present work implemented an in situ, automatic I-V curve tracer system coupled with Support Vector Machine and a Gaussian Process algorithms to classify and estimate abnormal and normal PV performance. The approach successfully identified normal and fault conditions. In addition, the Gaussian Process regression algorithm was used to estimate ideal I-V curves based on a given irradiance and temperature condition. The estimation results were then used to calculate the lost power due to the fault condition.
Outdoor test and analysis procedures for generating coefficients for the Sandia Array Performance Model
Conference Record of the IEEE Photovoltaic Specialists Conference
The Sandia Array Performance Model (SAPM), a semi-empirical model for predicting PV system power, has been in use for more than a decade. While several studies have presented laboratory intercomparisons of measurements and analysis, detailed procedures for determining model coefficients have never been published. Independent test laboratories must develop in-house procedures to determine SAPM coefficients, which contributes to uncertainty in the resulting models. In response to requests from commercial laboratories and module manufacturers, Sandia has formally documented the measurement and analysis methods as a supplement to the original model description. In this paper we present a description of the measurement procedures and an example analysis for calibrating the SAPM.
Simplifying methods to calibrate the Sandia Array Performance Model: elimination of the traditional thermal test
Abstract not provided.
Improving Module Temperature Measurements using Averaging Resistive Temperature Devices
Abstract not provided.
Automatic Fault Classification of Photovoltaic Strings Based on an In-Situ IV Characterization System and a Gaussian Process Algorithm
Abstract not provided.
Procedure to Determine Coefficients for the Sandia Array Performance Model (SAPM)
The Sandia Array Performance Model (SAPM), a semi-empirical model for predicting PV system power, has been in use for more than a decade. While several studies have presented comparisons of measurements and analysis results among laboratories, detailed procedures for determining model coefficients have not yet been published. Independent test laboratories must develop in-house procedures to determine SAPM coefficients, which contributes to uncertainty in the resulting models. Here we present a standard procedure for calibrating the SAPM using outdoor electrical and meteorological measurements. Analysis procedures are illustrated with data measured outdoors for a 36-cell silicon photovoltaic module.
Outdoor Test and Analysis Procedures for Generating Coefficients for the Sandia Array Performance Model
Abstract not provided.
Recent Advancements in Outdoor Measurement Techniques for Angle of Incidence Effects
Abstract not provided.
Recent Advances in Outdoor Measurement Techniques for Angle of Incidence Effects
Abstract not provided.
Initial Results of a Five Site Study Comparing Spatial Variability of Soiling and Ambient Particulate Concentrations
Abstract not provided.
Measuring PV system series resistance without full IV curves
2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
We present a method for measuring the series resistance of the PV module, string, or array that does not require measuring a full IV curve or meteorological data. Our method relies only on measurements of open circuit voltage and maximum power voltage and current, which can be readily obtained using standard PV monitoring equipment; measured short circuit current is not required. We validate the technique by adding fixed resistors to a PV circuit and demonstrating that the method can predict the added resistance. Relative prediction accuracy appears highest for smaller changes in resistance, with a systematic underestimation at larger resistances. Series resistance is shown to vary with irradiance levels with random errors below 1.5% standard deviation.
Measuring PV System Series Resistance Without Full IV Curves
Abstract not provided.
Results 26–39 of 39