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Compound Semiconductor Integrated Photonics for Avionics

Tauke-Pedretti, Anna; Vawter, Gregory A.; Skogen, Erik J.; Alford, Charles A.; Cajas, Florante G.; Overberg, Mark E.; Peake, Gregory M.; Wendt, J.R.; Chow, Weng W.; Lentine, Anthony L.; Nelson, Jeffrey S.; Sweatt, W.C.; Jared, Bradley H.; Resnick, Paul J.; Sanchez, Carlos A.; Pipkin, Jennifer R.; Girard, Gerald R.; Nielson, Greg N.; Cruz-Campa, Jose L.; Okandan, Murat O.

Abstract not provided.

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TYPE Conference Poster YEAR 2016
OSTIDOI

Defect Characterization for Material Assurance in Metal Additive Manufacturing (FY15-0664)

Salzbrenner, Bradley S.; Boyce, Brad B.; Jared, Bradley H.; Rodelas, Jeffrey R.; Laing, John R.

No industry-wide standards yet exist for minimum properties in additively manufactured (AM) metals. While AM alloys such as 17-4 precipitation hardened stainless steel have been shown to have average properties that can be comparable to wrought or cast product, they suffer from inconsistent performance. Variability in the feedstock powder, feature sizes, thermal history, and laser performance can lead to unpredictable surface finish, chemistry, phase content, and defects. To address this issue, rapid, efficient, high-throughput mechanical testing and data analysis was developed, providing profound statistical insight into the stochastic variability in properties. With this new approach, 1000’s of comprehensive tensile tests can be performed for the cost of 10’s of conventional tests. This new high-throughput approach provides a material qualification pathway that is commensurate with the quick turn-around benefit of AM.

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TYPE Other Report YEAR 2016
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Microsystem Enabled Photovoltaics

Nielson, Gregory N.; Cruz Campa, Jose L.; Okandan, Murat O.; Lentine, Anthony L.; Sweatt, W.C.; Gupta, Vipin P.; Tauke-Pedretti, Anna; Jared, Bradley H.; Resnick, Paul J.; Cederberg, Jeffrey G.; Paap, Scott M.; Sanchez, Carlos A.; Biefeld, Robert M.; Langlois, Eric L.; Yang, Benjamin B.; Koleske, Daniel K.; Wierer, Jonathan J.; Miller, William K.; Elisberg, Brenton E.; Zamora, David J.; Luna, Ian L.; Saavedra, Michael P.; Alford, Charles A.; Ballance, Mark H.; Wiwi, Michael W.; Samora, S.; Chavez, Julie C.; Pipkin, Jennifer R.; Nguyen, Janet N.; Anderson, Ben A.; Gu, Tian G.; Agrawal, Gautum A.; Nelson, Jeffrey S.

Abstract not provided.

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TYPE Presentation YEAR 2016
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Results 151–175 of 212
Results 151–175 of 212