Publications

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Compound Semiconductor Integrated Photonics for Avionics

Tauke-Pedretti, Anna; Vawter, Gregory A.; Skogen, Erik J.; Alford, Charles A.; Cajas, Florante G.; Overberg, Mark E.; Peake, Gregory M.; Wendt, J.R.; Chow, Weng W.; Lentine, Anthony L.; Nelson, Jeffrey S.; Sweatt, W.C.; Jared, Bradley H.; Resnick, Paul J.; Sanchez, Carlos A.; Pipkin, Jennifer R.; Girard, Gerald R.; Nielson, Greg N.; Cruz-Campa, Jose L.; Okandan, Murat O.

Abstract not provided.

Defect Characterization for Material Assurance in Metal Additive Manufacturing (FY15-0664)

Salzbrenner, Bradley S.; Boyce, Brad B.; Jared, Bradley H.; Rodelas, Jeffrey R.; Laing, John R.

No industry-wide standards yet exist for minimum properties in additively manufactured (AM) metals. While AM alloys such as 17-4 precipitation hardened stainless steel have been shown to have average properties that can be comparable to wrought or cast product, they suffer from inconsistent performance. Variability in the feedstock powder, feature sizes, thermal history, and laser performance can lead to unpredictable surface finish, chemistry, phase content, and defects. To address this issue, rapid, efficient, high-throughput mechanical testing and data analysis was developed, providing profound statistical insight into the stochastic variability in properties. With this new approach, 1000’s of comprehensive tensile tests can be performed for the cost of 10’s of conventional tests. This new high-throughput approach provides a material qualification pathway that is commensurate with the quick turn-around benefit of AM.

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Microsystem Enabled Photovoltaics

Nielson, Gregory N.; Cruz Campa, Jose L.; Okandan, Murat O.; Lentine, Anthony L.; Sweatt, W.C.; Gupta, Vipin P.; Tauke-Pedretti, Anna; Jared, Bradley H.; Resnick, Paul J.; Cederberg, Jeffrey G.; Paap, Scott M.; Sanchez, Carlos A.; Biefeld, Robert M.; Langlois, Eric L.; Yang, Benjamin B.; Koleske, Daniel K.; Wierer, Jonathan J.; Miller, William K.; Elisberg, Brenton E.; Zamora, David J.; Luna, Ian L.; Saavedra, Michael P.; Alford, Charles A.; Ballance, Mark H.; Wiwi, Michael W.; Samora, S.; Chavez, Julie C.; Pipkin, Jennifer R.; Nguyen, Janet N.; Anderson, Ben A.; Gu, Tian G.; Agrawal, Gautum A.; Nelson, Jeffrey S.

Abstract not provided.

Cost analysis of flat-plate concentrators employing microscale photovoltaic cells for high energy per unit area applications

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Paap, Scott; Gupta, Vipin P.; Tauke-Pedretti, Anna; Resnick, Paul J.; Sanchez, Carlos A.; Nielson, Gregory N.; Cruz-Campa, Jose L.; Jared, Bradley H.; Nelson, Jeffrey; Okandan, Murat O.; Sweatt, W.C.

Microsystems Enabled Photovoltaics (MEPV) is a relatively new field that uses microsystems tools and manufacturing techniques familiar to the semiconductor industry to produce microscale photovoltaic cells. The miniaturization of these PV cells creates new possibilities in system designs that can be used to reduce costs, enhance functionality, improve reliability, or some combination of all three. In this article, we introduce analytical tools and techniques to estimate the costs associated with a hybrid concentrating photovoltaic system that uses multi-junction microscale photovoltaic cells and miniaturized concentrating optics for harnessing direct sunlight, and an active c-Si substrate for collecting diffuse sunlight. The overall model comprises components representing costs and profit margin associated with the PV cells, concentrating optics, balance of systems, installation, and operation. This article concludes with an analysis of the component costs with particular emphasis on the microscale PV cell costs and the associated tradeoffs between cost and performance for the hybrid CPV design.

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Flat plate concentrators with large acceptance angle enabled by micro cells and mini lenses: performance evaluation

Cruz-Campa, Jose L.; Anderson, Benjamin J.; Gupta, Vipin P.; Tauke-Pedretti, Anna; Cederberg, Jeffrey G.; Paap, Scott M.; Sanchez, Carlos A.; Nordquist, Christopher N.; Nielson, Gregory N.; Saavedra, Michael P.; Ballance, Mark H.; Nguyen, Janet N.; Alford, Charles A.; Riley, Daniel R.; Okandan, Murat O.; Lentine, Anthony L.; Sweatt, W.C.; Jared, Bradley H.; Resnick, Paul J.; Kratochvil, Jay A.

Abstract not provided.

Results 151–200 of 212
Results 151–200 of 212