The Hecht equation can be used to model the nonlinear degradation of charge collection efficiency (CCE) in response to radiation-induced displacement damage in both fully and partially depleted GaAs photodiodes. CCE degradation is measured for laser-generated photocurrent as a function of fluence and bias in Al0.3Ga0.7As/GaAs/Al0.25Ga0.75As p-i-n photodiodes which have been irradiated with 12 MeV C and 7.5 MeV Si ions. CCE is observed to degrade more rapidly with fluence in partially depleted photodiodes than in fully depleted photodiodes. When the intrinsic GaAs layer is fully depleted, the 2-carrier Hecht equation describes CCE degradation as photogenerated electrons and holes recombine at defect sites created by radiation damage in the depletion region. If the GaAs layer is partially depleted, CCE degradation is more appropriately modeled as the sum of the 2-carrier Hecht equation applied to electrons and holes generated within the depletion region and the 1-carrier Hecht equation applied to minority carriers that diffuse from the field-free (non-depleted) region into the depletion region. Enhanced CCE degradation is attributed to holes that recombine within the field-free region of the partially depleted intrinsic GaAs layer before they can diffuse into the depletion region.
We propose here a novel device, called the Triassico, to microscopically study the entire surface of millimeter-sized spheres. The sphere dimensions can be as small as 1 mm, and the upper limit defined only by the power and by the mechanical characteristics of the motors used. Three motorized driving rods are arranged so an equilateral triangle is formed by the rod's axes, on such a triangle the sphere sits. Movement is achieved by rotating the rods with precise relative speeds and by exploiting the friction between the sphere and the rods surfaces. The sphere can be held in place by gravity or by an opposing trio of rods. By rotating the rods with specific relative angular velocities, a net torque can be exerted on the sphere which then rotates. No repositioning of the sphere or of the motors is needed to cover the full surface with the investigating tools. An algorithm was developed to position the sphere at any arbitrary polar and azimuthal angle. The algorithm minimizes the number of rotations needed by the rods, in order to efficiently select a particular position on the sphere surface. A prototype Triassico was developed for the National Ignition Facility, of the Lawrence Livermore National Laboratory (Livermore, California, USA), as a sphere manipulation apparatus for ion microbeam analysis at Sandia National Laboratories (Albuquerque, NM, USA) of Xe-doped DT inertial confinement fusion fuel spheres. Other applications span from samples orientation, ball bearing manufacturing, or jewelry.
This project was to use light ion beam induced charge (IBIC) to detect damage cascades generated by a single heavy ion, and thereby reveal details of the shape of the cascade and the physics of recombination of carriers that interact with the cluster. Further IBIC measurements using the hardware and software of this project will improve the accuracy of theoretical models used to predict electrical degradation in devices exposed to radiation environments. In addition, future use of light ion IBIC detection of single ion-induced damage could be used to locate single ion implantation sites in quantum computing applications. This project used Sandia's Pelletron and nanoImplanter (nI) to produce heavy ion-induced collision cascades in p-n diodes, simulating cascades made by primary knock-on atoms recoiled by neutrons. Si and Li beams from the nI were used to perform highly focused scans generating IBIC signal maps where regions of lower charge collection efficiency were observed without incurring further damage. The very first use of ion channeled beams for IBIC was explored to maximize ionization, improve contrast and provide very straight line trajectories to improve lateral resolution.
A MS Excel program has been written that calculates ion channeling half-angles and minimum yields in cubic bcc, fcc and diamond lattice crystals. All of the tables and graphs in the three Ion Beam Analysis Handbooks that previously had to be manually looked up and read from were programed into Excel in handy lookup tables, or parameterized, for the case of the graphs, using rather simple exponential functions with different power functions of the arguments. The program then offers an extremely convenient way to calculate axial and planar half-angles, minimum yields, effects on half-angles and minimum yields of amorphous overlayers. The program can calculate these half-angles and minimum yields for 〈uvw〉 axes and [hkl] planes up to (5 5 5). The program is open source and available at http://www.sandia.gov/pcnsc/departments/iba/ibatable.html.
Displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keVions focused in a 40 nm beam spot are used to create damage cascades within areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of {200 ions and 60 keV ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.
Sandia journal manuscript; Not yet accepted for publication
Lemasson, Quentin L.; Kotula, Paul K.; Pichon, Laurent P.; Pacheco, Claire P.; Moignard, Brice M.; Doyle, Barney L.; Van Bennekom, Joosje V.
In the field of archaeometry, it is not uncommon to be presented with art objects that contain inscriptions, signatures and other writings that are nearly impossible to read. Scanned microbeam PIXE offers an attractive approach to attack this problem, but even then the distribution of characteristic X-rays of the element(s) used in these writings can remain illegible. We show in this paper that two methods were used to reveal the inscription: first the use of a GUPIXWin, TRAUPIXE and AGLAEMap software suite enables to make quantitative analysis of each pixel, to visualize the results and to select X-ray peaks that could enable to distinguish letters. Then, the Automated eXpert Spectral Image Analysis (AXSIA) program developed at Sandia, which analyzes the x-ray intensity vs. Energy and (X, Y) position “datacubes”, was used to factor the datacube into 1) principle component spectral shapes and 2) the weighting images of these components. The specimen selected for this study was a silver plaque representing a scroll from the so-called “MerkelscheTafelaufsatz,” a centrepiece made by the Nuremberg goldsmith Wenzel Jamnitzer in 1549. X-ray radiography of the plaque shows lines of different silver thicknesses, meaning that a text has been removed. The PIXE analysis used a 3-MeV proton beam focused to 50μm and scanned across the sample on different areas of interest of several cm². This analysis showed major elements of Cu and Ag, and minor elements such as Pb, Au, Hg. X-ray intensity maps were then made by setting windows on the various x-ray peaks but the writing on the centrepiece was not revealed even if the map of Cu after data treatment at AGLAE enabled to distinguish some letters. The AXSIA program enabled to factor two main spectral shapes from the datacube that were quite similar and involved virtually all of the X-rays being generated. Nevertheless, small differences between these factors were observed for the Cu K X-rays, Pb, Bi and Au L X-rays. The plot of the factor with the highest Au signal gave also information on the shape of some letters. The comparison of the results obtained by the two methods shows that they both drastically improve the resolution and contrast of such writings and that each of the method can also bring different information on the composition and thus the techniques used for the writing.
The recipients of the 2014 NSREC Outstanding Conference Paper Award are Nathaniel A. Dodds, James R. Schwank, Marty R. Shaneyfelt, Paul E. Dodd, Barney L. Doyle, Michael Trinczek, Ewart W. Blackmore, Kenneth P. Rodbell, Michael S. Gordon, Robert A. Reed, Jonathan A. Pellish, Kenneth A. LaBel, Paul W. Marshall, Scot E. Swanson, Gyorgy Vizkelethy, Stuart Van Deusen, Frederick W. Sexton, and M. John Martinez, for their paper entitled "Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam." For older CMOS technologies, protons could only cause single-event effects (SEEs) through nuclear interactions. Numerous recent studies on 90 nm and newer CMOS technologies have shown that protons can also cause SEEs through direct ionization. Furthermore, this paper develops and demonstrates an accurate and practical method for predicting the error rate caused by proton direct ionization (PDI).