Publications

Antolak, Arlyn J.

Abstract not provided.

Antolak, Arlyn J.; Raber, Thomas N.

Abstract not provided.

Antolak, Arlyn J.; Doyle, Barney L.; King, Michael K.; Provencio, P.N.; Raber, Thomas N.

Shielded special nuclear material (SNM) is very difficult to detect and new technologies are needed to clear alarms and verify the presence of SNM. High-energy photons and neutrons can be used to actively interrogate for heavily shielded SNM, such as highly enriched uranium (HEU), since neutrons can penetrate gamma-ray shielding and gamma-rays can penetrate neutron shielding. Both source particles then induce unique detectable signals from fission. In this LDRD, we explored a new type of interrogation source that uses low-energy proton- or deuteron-induced nuclear reactions to generate high fluxes of mono-energetic gammas or neutrons. Accelerator-based experiments, computational studies, and prototype source tests were performed to obtain a better understanding of (1) the flux requirements, (2) fission-induced signals, background, and interferences, and (3) operational performance of the source. The results of this research led to the development and testing of an axial-type gamma tube source and the design/construction of a high power coaxial-type gamma generator based on the {sup 11}B(p,{gamma}){sup 12}C nuclear reaction.

Doyle, Barney L.; Foiles, Stephen M.; Antolak, Arlyn J.

Abstract not provided.

Antolak, Arlyn J.; Doyle, Barney L.

Abstract not provided.

Proposed for publication in IEEE Transactions on Nuclear Science.

Chinn, Douglas A.; Antolak, Arlyn J.; Doty, Fred P.; King, Michael K.; Wilson, Tiffany W.

Abstract not provided.

Physical Review C

Doyle, Barney L.; Antolak, Arlyn J.

Abstract not provided.

Chinn, Douglas A.; Antolak, Arlyn J.; Doty, Fred P.

Abstract not provided.

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Antolak, Arlyn J.; Morse, Daniel H.; Grant, Patrick G.; Kotula, Paul G.; Doyle, Barney L.; Richardson, Charles B.

Obtaining particulate compositional maps from scanned PIXE (proton-induced X-ray emission) measurements is extremely difficult due to the complexity of analyzing spectroscopic data collected with low signal-to-noise at each scan point (pixel). Multivariate spectral analysis has the potential to analyze such data sets by reducing the PIXE data to a limited number of physically realizable and easily interpretable components (that include both spectral and image information). We have adapted the AXSIA (automated expert spectral image analysis) program, originally developed by Sandia National Laboratories to quantify electron-excited X-ray spectroscopy data, for this purpose. Samples consisting of particulates with known compositions and sizes were loaded onto Mylar and paper filter substrates and analyzed by scanned micro-PIXE. The data sets were processed by AXSIA and the associated principal component spectral data were quantified by converting the weighting images into concentration maps. The results indicate automated, nonbiased, multivariate statistical analysis is useful for converting very large amounts of data into a smaller, more manageable number of compositional components needed for locating individual particles-of-interest on large area collection media.

Antolak, Arlyn J.; Doyle, Barney L.; Rossi, Paolo R.

Abstract not provided.

Doyle, Barney L.; Banks, J.C.; Kotula, Paul G.; Antolak, Arlyn J.

Abstract not provided.

Doyle, Barney L.; Banks, J.C.; Kotula, Paul G.; Antolak, Arlyn J.

Abstract not provided.

Antolak, Arlyn J.; Doyle, Barney L.; Rossi, Paolo R.

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Antolak, Arlyn J.

Abstract not provided.

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Doyle, Barney L.; Provencio, P.N.; Kotula, Paul G.; Antolak, Arlyn J.; Ryan, C.G.; Campbell, J.L.; Barrett, K.

Automated, nonbiased, multivariate statistical analysis techniques are useful for converting very large amounts of data into a smaller, more manageable number of chemical components (spectra and images) that are needed to describe the measurement. We report the first use of the multivariate spectral analysis program AXSIA (Automated eXpert Spectral Image Analysis) developed at Sandia National Laboratories to quantitatively analyze micro-PIXE data maps. AXSIA implements a multivariate curve resolution technique that reduces the spectral image data sets into a limited number of physically realizable and easily interpretable components (including both spectra and images). We show that the principal component spectra can be further analyzed using conventional PIXE programs to convert the weighting images into quantitative concentration maps. A common elemental data set has been analyzed using three different PIXE analysis codes and the results compared to the cases when each of these codes is used to separately analyze the associated AXSIA principal component spectral data. We find that these comparisons are in good quantitative agreement with each other. © 2006 Elsevier B.V. All rights reserved.

Banks, J.C.; Antolak, Arlyn J.; Doyle, Barney L.; Richardson, Charles B.

Abstract not provided.

Banks, J.C.; Doyle, Barney L.; Hearne, Sean J.; Provencio, P.N.; Antolak, Arlyn J.

Abstract not provided.

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Auzelyte, V.; Elfman, M.; Kristiansson, P.; Pallon, J.; Wegdén, M.; Nilsson, C.; Malmqvist, K.; Doyle, Barney L.; Rossi, P.; Hearne, Sean J.; Provencio, P.N.; Antolak, Arlyn J.

A new nuclear microscopy technique called ion photon emission microscopy or IPEM was recently invented. IPEM allows analysis involving single ions, such as ion beam induced charge (IBIC) or single event upset (SEU) imaging using a slightly modified optical microscope. The spatial resolution of IPEM is currently limited to more than 10 μm by the scattering and reflection of ion-induced photons, i.e. light blooming or spreading, in the ionoluminescent phosphor layer. We are developing a "Microscopic Gridded Phosphor" (also called Black Matrix) where the phosphor nanocrystals are confined within the gaps of a micrometer scale opaque grid, which limits the amount of detrimental light blooming. MeV-energy proton beam lithography is ideally suited to lithographically form masks for the grid because of high aspect ratio, pattern density and sub-micron resolution of this technique. In brief, the fabrication of the grids was made in the following manner: (1) a MeV proton beam focused to 1.5-2 μm directly fabricated a matrix of pillars in a 15 μm thick SU-8 lithographic resist; (2) 7:1 aspect ratio pillars were then formed by developing the proton exposed area; (3) Ni (Au) was electrochemically deposited onto Cu-coated Si from a sulfamate bath (or buffered CN bath); (4) the SU-8 pillars were removed by chemical etching; finally (5) the metal micro-grid was freed from its substrate by etching the underlying Cu layer. Our proposed metal micro-grids promise an order-of-magnitude improvement in the resolution of IPEM. © 2005 Elsevier B.V. All rights reserved.

Doyle, Barney L.; Antolak, Arlyn J.; Morse, Daniel H.

Abstract not provided.

Doyle, Barney L.; Provencio, P.N.; Kotula, Paul G.; Antolak, Arlyn J.

Abstract not provided.

Antolak, Arlyn J.; Lucadamo, Gene A.

Transmission electron microscope (TEM) tomography provides three-dimensional structural information from tilt series with nanoscale resolution. We have collected TEM projection data sets to study the internal structure of photocatalytic nanoparticles. Multiple cross-sectional slices of the nanoparticles are reconstructed using an algebraic reconstruction technique (ART) and then assembled to form a 3D rendering of the object. We recently upgraded our TEM with a new sample holder having a tilt range of +/-70{sup o} and have collected tomography data over a range of 125{sup o}. Simulations were performed to study the effects of field-of-view displacement (shift and rotation), limited tilt angle range, hollow (missing) projections, stage angle accuracy, and number of projections on the reconstructed image quality. This paper discusses our experimental and computational approaches, presents some examples of TEM tomography, and considers future directions.

Doty, Fred P.; Antolak, Arlyn J.; Chinn, Douglas A.; Cuppoletti, Christine M.

Abstract not provided.

Doty, Fred P.; Antolak, Arlyn J.; Chinn, Douglas A.; Cuppoletti, Christine M.; Morse, Daniel H.; Munoz, Christel M.

Abstract not provided.

Applications of X-Rays in Mechanical Engineering 2004

Morse, Daniel H.; Antolak, Arlyn J.; Mills, Bernice E.

X-ray radiography has long been recognized as a valuable tool for detecting internal features and flaws. Recent developments in microfabrication and composite materials have extended inspection requirements to the resolution limits of conventional radiography. Our work has been directed toward pushing both detection and measurement capabilities to a smaller scale. Until recently, we have used conventional contact radiography, optimized to resolve small features. With the recent purchase of a nano-focus (sub-micron) x-ray source, we are now investigating projection radiography, phase contrast imaging and micro-computed tomography (μ-CT). Projection radiography produces a magnified image that is limited in spatial resolution mainly by the source size, not by film grain size or detector pixel size. Under certain conditions phase contrast can increase the ability to resolve small features such as cracks, especially in materials with low absorption contrast. Micro-computed tomography can provide three-dimensional measurements on a micron scale and has been shown to provide better sensitivity than simple radiographs. We have included applications of these techniques to small-scale measurements not easily made by mechanical or optical means. Examples include void detection in meso-scale nickel MEMS parts, measurement of edge profiles in thick gold lithography masks, and characterization of the distribution of phases in composite materials. Our work, so far, has been limited to film. Copyright © 2004 by ASME.