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Hogle, Craig W. ; Blain, Matthew G. ; Hollowell, Andrew E. ; Lobser, Daniel L. ; Revelle, Melissa R. ; Yale, Christopher G. ; Haltli, Raymond A. ; Maunz, Peter L. ; Leibfried, Dietrich L.; Todaro, Susanna T.; McCormick, Katherine M.; Slichter, Daniel S.; wilson, andrew w.; Wineland, David W.
Finnegan, Patrick S. ; Langlois, Eric L. ; Arrington, Christian L. ; Hollowell, Andrew E. ; Pillars, Jamin R. ; Monson, Todd M. ; St John, Christopher S.
Maunz, Peter L. ; Haltli, Raymond A. ; Hollowell, Andrew E. ; Lepkowski, Stefan M. ; Lobser, Daniel L. ; Nordquist, Christopher N. ; Rembetski, John F. ; Revelle, Melissa R. ; Yale, Christopher G. ; Blain, Matthew G.
Lobser, Daniel L. ; Blain, Matthew G. ; Haltli, Raymond A. ; Hogle, Craig W. ; Hollowell, Andrew E. ; Revelle, Melissa R. ; Stick, Daniel L. ; Yale, Christopher G. ; Maunz, Peter L.
Menk, Lyle A. ; Arrington, Christian L. ; Hollowell, Andrew E. ; Josell, Daniel J.
Menk, Lyle A. ; Arrington, Christian L. ; Hollowell, Andrew E.
Hollowell, Andrew E. ; Arrington, Christian L. ; Bauer, Todd B. ; Blain, Matthew G. ; Dagel, Amber L. ; Dominguez, Jason J. ; Goeke, Ronald S. ; Heller, Edwin J. ; Jarecki, Robert L. ; Loviza, Becky G. ; McClain, Jaime L. ; Menk, Lyle A. ; Ortega, Anathea C. ; Pillars, Jamin R. ; Resnick, Paul J. ; Timon, Robert P.
St John, Christopher S. ; Arrington, Christian L. ; Pillars, Jamin R. ; Langlois, Eric L. ; Finnegan, Patrick S. ; Hollowell, Andrew E. ; Thorpe, Adam T.
Perez, Carlos P. ; Pillars, Jamin R. ; Hollowell, Andrew E. ; Arrington, Christian L. ; Yelton, William G.
Menk, Lyle A. ; Arrington, Christian L. ; Bauer, Todd B. ; Blain, Matthew G. ; Dominguez, Jason J. ; Dyer, Isaac D. ; Goeke, Ronald S. ; Han, Sang S.; Heller, Edwin J. ; Hollowell, Andrew E. ; Jarecki, Robert L. ; Loviza, Becky G. ; McClain, Jaime L. ; Pillars, Jamin R. ; Resnick, Paul J. ; St John, Christopher S. ; Timon, Robert P.
Hollowell, Andrew E. ; Arrington, Christian L. ; Bauer, Todd B. ; Blain, Matthew G. ; Dominguez, Jason J. ; Goeke, Ronald S. ; Heller, Edwin J. ; Jarecki, Robert L. ; Loviza, Becky G. ; McClain, Jaime L. ; Menk, Lyle A. ; Ortega, Anathea C. ; Pillars, Jamin R. ; Resnick, Paul J. ; Timon, Robert P.
Langlois, Eric L. ; Finnegan, Patrick S. ; Ballance, Mark H. ; Pillars, Jamin R. ; Monson, Todd M. ; Hollowell, Andrew E. ; Arrington, Christian L. ; Pearce, Charles J. ; St John, Christopher S.
Lobser, Daniel L. ; Blain, Matthew G. ; Fortier, Kevin M. ; Haltli, Raymond A. ; Hollowell, Andrew E. ; Mizrahi, Jonathan M.; Sterk, Jonathan D. ; Maunz, Peter L.
Goeke, Ronald S. ; Chakmakian, Edward C. ; Arrington, Christian L. ; Dagel, Amber L. ; Hollowell, Andrew E.
Lobser, Daniel L. ; Blain, Matthew G. ; Fortier, Kevin M. ; Haltli, Raymond A. ; Hollowell, Andrew E. ; Mizrahi, Jonathan M.; Sterk, Jonathan D. ; Maunz, Peter L.
Lobser, Daniel L. ; Blain, Matthew G. ; Haltli, Raymond A. ; Hollowell, Andrew E. ; Mizrahi, Jonathan M.; Rembetski, John F. ; Resnick, Paul J. ; Sterk, Jonathan D. ; Stick, Daniel L. ; Maunz, Peter L.
Monson, Todd M. ; Langlois, Eric L. ; Pillars, Jamin R. ; Arrington, Christian L. ; Rodriguez, Mark A. ; Finnegan, Patrick S. ; Hollowell, Andrew E.
Monson, Todd M. ; Langlois, Eric L. ; Arrington, Christian L. ; Pillars, Jamin R. ; Finnegan, Patrick S. ; Hollowell, Andrew E. ; St John, Christopher S. ; Pearce, Charles J. ; Rodriguez, Mark A.
Monson, Todd M. ; Langlois, Eric L. ; Pillars, Jamin R. ; Arrington, Christian L. ; Hollowell, Andrew E. ; Finnegan, Patrick S. ; DiAntonio, Christopher D. ; Chavez, Tom C. ; Zheng, baolong Z.; Zhou, Yizheng Z.; Lavernia, Enrique J.
Hollowell, Andrew E. ; Arrington, Christian L. ; Coleman, Jonathan J. ; Finnegan, Patrick S. ; Rowen, Adam M. ; Dagel, Amber L.
Arrington, Christian L. ; Pillars, Jamin R. ; Langlois, Eric L. ; Monson, Todd M. ; Hollowell, Andrew E.
Pillars, Jamin R. ; Langlois, Eric L. ; Arrington, Christian L. ; Monson, Todd M. ; Hollowell, Andrew E. ; Rodriguez, Mark A.
The development of an electrodeposition process for cobalt/iron (CoFe) alloys with minimal oxygen concentration and controlled stoichiometry is necessary for the advancement of magnetostrictive device functionalities. CoFe alloy films were electrodeposited out of a novel chemistry onto copper test structures enabling magnetic displacement testing for magnetostriction calculations. Using a combination of additives that served as oxygen scavengers, grain refiners, and complexing agents in conjunction with a pulsed plating technique, CoFe films were synthesized at thicknesses as high as 10μm with less than 8 at% oxygen at a stoichiometry of 70-75% Co and 25-30% Fe. X-Ray diffraction (XRD) analysis confirmed that these films had a crystal structure consistent with 70% Co 30% Fe Wairuaite with a slight lattice contraction due to Co doping in the film. A novel characterization technique was used to measure the displacement of the CoFe films electrodeposited, as a function of applied magnetic bias, in order to determine the saturation magnetostriction (λS) of the material. With this chemistry and a tailored pulse plating regime, λS values as high as 172 ± 25ppm have been achieved. This is believed by the authors to be the highest reported value of magnetostriction for an electrodeposited CoFe film.
Maunz, Peter L. ; Hollowell, Andrew E. ; Lobser, Daniel L. ; Nordquist, Christopher N. ; Benito, Francisco M. ; Clark, Craig R. ; Clark, Susan M. ; Colombo, Anthony P. ; Fortier, Kevin M. ; Haltli, Raymond A. ; Heller, Edwin J. ; Resnick, Paul J. ; Rembetski, John F. ; Sterk, Jonathan D. ; Stick, Daniel L. ; Tabakov, Boyan T. ; Tigges, Chris P. ; Van Der Wall, Jay W. ; Dagel, Amber L. ; Blain, Matthew G. ; Scrymgeour, David S.
Maunz, Peter L. ; Berry, Chris B.; Clark, Craig R. ; Clark, Susan M. ; Haltli, Raymond A. ; Hollowell, Andrew E. ; Mizrahi, Jonathan M.; Nordquist, Christopher N. ; Resnick, Paul J. ; Rembetski, John F. ; Sterk, Jonathan D. ; Stick, Daniel L. ; Tabakov, Boyan T. ; Tigges, Chris P. ; Van Der Wall, Jay W. ; Blain, Matthew G.
Nordquist, Christopher N. ; Berry, Christopher W.; Rembetski, John F. ; Hollowell, Andrew E. ; Resnick, Paul J. ; Blain, Matthew G. ; McClain, Jaime L. ; Sterk, Jonathan D. ; Heller, Edwin J. ; Haltli, Raymond A. ; Fortier, Kevin M. ; Maunz, Peter L.
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