TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices King, Michael P.; Massey, Greg M.; Silva, A S.; Cannon, EH C.; Shaneyfelt, Marty R.; Loveless, TD L.; Ballast, J.B.; Cabanas-Holmen, M C.; DiGregorio, Steven D.; Rice, William C.; Draper, Bruce L.; Oldgies, P O.; Rodbell, K R. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI
Leakage and Drive Characteristics of Planar 22-nm Partially-Depleted Silicon-on-Insulator and 14-nm Bulk and Quasi-Silicon-on-Insulator FinFET Devices King, Michael P.; Silva, Antoinette I.; DiGregorio, Steven D.; Rice, William C.; Massey, J.G.; Cannon, E.H.; Ballast, J.B.; Cabanas-Holmen, M.C.; Oldgies, P.O.; Rodbell, K.P.; Draper, Bruce L. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI