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Analysis of TOF-SIMS spectral series and spectral image series using AXSIA

Zavadil, Kevin R.; Kilgo, Riley D.; Ohlhausen, J.A.

Abstract not provided.

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TYPE Conference YEAR 2004

OSTI

New microsystem packaging capabilities at Sandia National Laboratories

Mitchell, Robert T.; Rohwer, Lauren E.; Robinson, Melissa V.; Kilgo, Riley D.; Mulhall, James M.; Fischer, Thomas A.

Abstract not provided.

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TYPE Conference YEAR 2002

OSTI