Publications
Securing Trusted Rad-Hard Electronics for the Future
Radiation Hardened Enabling Technologies and Trusted ASICs
SOI-Enabled MEMS Processes Lead to Novel Mechanical Optical and Atomic Physics Devices Presentation
SOI-Enabled MEMS Processes Lead to Novel Mechanical Optical and Atomic Physics Devices
Arsenic ion implant energy effects on CMOS gate oxide hardness
Proposed for publication in the IEEE Transactions on Nuclear Science.
6 Results