NextGen Workflow for Electrical Analysis Calibration Glickman, Matthew R.; Friedman-Hill, Ernest J.; Reza, Shahed R.; Sholander, Peter E.; Gurule, Rachelle T. Abstract not provided. More Details TYPE Presentation YEAR 2017 OSTI
MEMS component reliability testing Clements, James W.; Gurule, Rachelle T.; Bitsie, Fernando; Johnson, Evan P.; Spletzer, Matthew A.; Buchheit, Thomas E. Abstract not provided. More Details TYPE Conference YEAR 2011 OSTI