Total Ionizing Dose Effect Study on Radiation-Hard Power MOSFET Device Kerber, Pranita K.; Leeson, Kenneth M.; Gao, Xujiao G.; Musson, Lawrence M.; Campbell, Philip L.; McLain, Michael L.; Paskaleva, Biliana S.; Mar, Alan M. Abstract not provided. More Details TYPE Conference Poster YEAR 2020 OSTI
Heavy Ion Displacement Damage Effects in 14nm-Process FinFETs Esposito, Madeline G.; Manuel, Jack E.; Bielejec, Edward S.; Dickerson, Jeramy R.; Kerber, Pranita K.; King, Michael P.; Talin, A.A.; Ashby, David; McLain, Michael L.; Marinella, Matthew J. Abstract not provided. More Details TYPE Conference Poster YEAR 2020 OSTI