Publications

Brumbach, Michael T.; Zeitler, Todd Z.; Alam, Todd M.; Rodriguez, Mark A.; Criscenti, Louise C.; Kalan, Michael K.; Mirabal, Alex J.; Bencoe, Denise N.; Ewsuk, Kevin G.; Brumbach, Michael T.

Abstract not provided.

James, Conrad D.; Kalan, Michael K.; Wheeler, David W.; Edwards, Thayne L.; Murton, Jaclyn K.; Schiess, Adrian R.

Abstract not provided.

Brumbach, Michael T.; Zeitler, Todd Z.; Alam, Todd M.; Rodriguez, Mark A.; Criscenti, Louise C.; Kalan, Michael K.; Mirabal, Alex J.; Bencoe, Denise N.; Ewsuk, Kevin G.

Abstract not provided.

Kalan, Michael K.; Brumbach, Michael T.

Abstract not provided.

Brumbach, Michael T.; Mirabal, Alex J.; Kalan, Michael K.; Baca, Ana B.; hale, kevin h.

Replicating compounds are used to cast reproductions of surface features on a variety of materials. Replicas allow for quantitative measurements and recordkeeping on parts that may otherwise be difficult to measure or maintain. In this study, the chemistry and replicating capability of several replicating compounds was investigated. Additionally, the residue remaining on material surfaces upon removal of replicas was quantified. Cleaning practices were tested for several different replicating compounds. For all replicating compounds investigated, a thin silicone residue was left by the replica. For some compounds, additional inorganic species could be identified in the residue. Simple solvent cleaning could remove some residue.

Journal of Applied Physics

Brumbach, Michael T.; Kalan, Michael K.; Mirabal, Alex J.; Mickel, Patrick R.; Lohn, Andrew L.; Marinella, Matthew J.; Stevens, James E.

Abstract not provided.

Journal of Applied Physics

Brumbach, Michael T.; Kalan, Michael K.; Mirabal, Alex J.; Mickel, Patrick R.; Lohn, Andrew L.; Marinella, Matthew J.; Stevens, James E.

Abstract not provided.

Kalan, Michael K.

The objective of this project was to characterize the performance and chemistry of a siliconebased replicating compound. Some silicone replicating compounds are useful for critical inspection of surface features. Common applications are for examining micro-cracks, surface pitting, scratching, and other surface defects. Materials characterization techniques were used: FTIR, XPS, ToF-SIMS, AFM, and Confocal Microscopy to evaluate the replicating compound. These techniques allowed for the characterization and verification of the resolution capabilities and surface contamination that may be a result of using the compound. FTIR showed the compound is entirely made from silicone constituents. The AFM and Confocal Microscopy results showed the compound does accurately replicate the surface features to the claimed resolution. XPS and ToF-SIMS showed there is a silicone contaminant layer left behind when a cured replica is peeled off a surface. Attempts to clean off the contamination could not completely remove all silicone residues.