Publications
Imaging Oxide-Covered Doped Silicon Structures Using Low-Energy Electron Microscopy
Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations
Proposed for publication in Applied Physics Letters.
Transmission electron microscopy and scanning capacitance microscopy analysis of dislocation-induced leakages in n-channel I/O transistors
Transmission Electron Microscopy and Scanning Capacitance Microscopy Analysis of Dislocation-Induced Leakages in n-channel I/O Transistors
Proposed for publication in the Conference proceedings from the 31st International Symposium for Testing and Failure Analysis.
The effect of embedded Pb on Cu diffusion on Pb/Cu(111) surface alloys
Proposed for publication in Surface Science.
The importance of Pb-vacancy attractions on diffusion in the Pb/Cu(001) surface alloy
Proposed for publication in Surface Science.
7 Results