Novel Applications of the Multi-Beam SEM
Abstract not provided.
Publications
Imaging Oxide-Covered Doped Silicon Structures Using Low-Energy Electron Microscopy
Abstract not provided.
Quantitative analysis of microelectromechanical-based field effect transistors using scanning capacitance microscopy and device simulations
Proposed for publication in Applied Physics Letters.
Abstract not provided.
Transmission electron microscopy and scanning capacitance microscopy analysis of dislocation-induced leakages in n-channel I/O transistors
Abstract not provided.
Transmission Electron Microscopy and Scanning Capacitance Microscopy Analysis of Dislocation-Induced Leakages in n-channel I/O Transistors
Proposed for publication in the Conference proceedings from the 31st International Symposium for Testing and Failure Analysis.
Abstract not provided.
The effect of embedded Pb on Cu diffusion on Pb/Cu(111) surface alloys
Proposed for publication in Surface Science.
We have used scanning tunneling microscopy and low-energy electron microscopy to measure the thermal decay of two-dimensional Cu, Pb-overlayer, and Pb-Cu alloy islands on Pb-Cu(1 1 1) surface alloys. Decay rates covering 6-7 orders of magnitude are accessible by applying the two techniques to the same system. We find that Cu adatom diffusion across the surface alloy is rate-limiting for the decay of both Pb and Pb-Cu islands on the surface alloy and that this rate decreases monotonically with increasing Pb concentration in the alloy. The decrease is attributed to repulsive interactions between Cu adatoms and embedded Pb atoms in the surface alloy. The measured temperature dependences of island decay rates are consistent with first-principles calculations of the Cu binding and diffusion energies related to this 'site-blocking' effect.
The importance of Pb-vacancy attractions on diffusion in the Pb/Cu(001) surface alloy
Proposed for publication in Surface Science.
Abstract not provided.
7 Results