Risk-informed Metrics for Cybersecurity Yang, Lynn I.; Nachtigal, Noel M.; DeRosa, Sean D.; Gordon, Susanna P.; Hingorani, Sheryl L.; Imbro, Dennis R.; Teclemariam, Nerayo P.; Todd, Margaret T.; Tucker, Mark D.; Wyss, Gregory D.; ewing, eric e.; Kane, Samuel S. Abstract not provided. More Details TYPE Presentation YEAR 2017 OSTI
Ephemeral Biometrics Choe, Yung R.; Choi, Sung N.; Bierma, Michael B.; Todd, Margaret T.; Bigg, Jeffrey B.; Narayanan, Shrinithi N.; Gandhi, Vansh G. Abstract not provided. More Details TYPE Presentation YEAR 2014 OSTI