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Bell, K.; Coverdale, Christine A.; Ampleford, David J.; Bailey, James E.; Loisel, Guillaume P.; Harper-Slaboszewicz, V.; Schwarz, Jens; Christner, Edytka; Turner, Colin; Mcpherson, Leroy A.; Bourdon, Christopher; Kernaghan, Matthew D.; Sullivan, Michael A.; Kirtley, Christopher K.; Cuneo, Michael E.
Bell, K.; Coverdale, Christine A.; Ampleford, David J.; Bailey, James E.; Loisel, Guillaume P.; Harper-Slaboszewicz, V.; Schwarz, Jens; Christner, Edytka; Turner, Colin; Mcpherson, Leroy A.; Bourdon, Christopher; Kernaghan, Matthew D.; Sullivan, Michael A.; Kirtley, Christopher K.; Cuneo, Michael E.
Coverdale, Christine A.; Bell, K.; Harper-Slaboszewicz, V.; Mcpherson, Leroy A.; Ampleford, David J.; Flanagan, Timothy M.; Loisel, Guillaume P.; Bourdon, Christopher; Kernaghan, Matthew D.; Sullivan, Michael A.; Serrano, Jason D.; Mccourt, Andrew L.; Cuneo, Michael E.
Bell, K.; Coverdale, Christine A.; Ampleford, David J.; Hansen, Stephanie B.; Mcpherson, Leroy A.; Harper-Slaboszewicz, V.; Bourdon, Christopher; Bailey, James E.; Loisel, Guillaume P.; Christner, Edytka; Turner, Colin; Kernaghan, Matthew D.; Sullivan, Michael A.; Cuneo, Michael E.
Coverdale, Christine A.; Bell, K.; Harper-Slaboszewicz, V.; Mcpherson, Leroy A.; Ampleford, David J.; Flanagan, Timothy M.; Bourdon, Christopher; Kernaghan, Matthew D.; Sullivan, Michael A.; Serrano, Jason D.; Mccourt, Andrew L.; Cuneo, Michael E.
Bell, K.; Coverdale, Christine A.; Ampleford, David J.; Mcpherson, Leroy A.; Harper-Slaboszewicz, V.; Kernaghan, Matthew D.; Bourdon, Christopher; Jones, Brent M.; Jones, Michael; Cuneo, Michael E.; Austin, Kevin N.
Bell, K.; Cuneo, Michael E.; Lake, Patrick; Austin, Kevin N.; Coverdale, Christine A.; Mcpherson, Leroy A.; Harper-Slaboszewicz, V.; Ampleford, David J.; Jones, Brent M.; Kernaghan, Matthew D.; Bourdon, Christopher; Jones, Michael
Rochau, G.A.; Nielsen-Weber, L.B.; Kernaghan, Matthew D.
Proceedings of the APS-SCCM&AIRAPT-24 Joint Conference 2013
Ao, Tommy; Geissel, Matthias; Reneker, Joseph; Kernaghan, Matthew D.; Harding, Eric H.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Rochau, G.A.; Sinars, Daniel; Smith, Ian C.
Review of Scientific Instruments
Gomez, Matthew R.; Rochau, G.A.; Bailey, James E.; Dunham, G.S.; Kernaghan, Matthew D.; Gard, P.; Robertson, G.K.; Owen, A.C.; Argo, Jeffrey W.; Nielsen, D.S.; Lake, Patrick
The pinned optically aligned diagnostic dock (PODD) is a multi-configuration diagnostic platform designed to measure x-ray emission on the Z facility. The PODD houses two plasma emission acquisition (PEA) systems, which are aligned with a set of precision machined pins. The PEA systems are modular, allowing a single diagnostic housing to support several different diagnostics. The PEA configurations fielded to date include both time-resolved and time-integrated, 1D spatially resolving, elliptical crystal spectrometers, and time-integrated, 1D spatially resolving, convex crystal spectrometers. Additional proposed configurations include time-resolved, monochromatic mirrored pinhole imagers and arrays of filtered x-ray diodes, diamond photo-conducting diode detectors, and bolometers. The versatility of the PODD system will allow the diagnostic configuration of the Z facility to be changed without significantly adding to the turn-around time of the machine. Additionally, the PODD has been designed to allow instrument setup to be completed entirely off-line, leaving only a refined alignment process to be performed just prior to a shot, which is a significant improvement over the instrument the PODD replaces. Example data collected with the PODD are presented. © 2012 American Institute of Physics.
Gomez, Matthew R.; Lake, Patrick; Rochau, G.A.; Bailey, James E.; Dunham, G.S.; Kernaghan, Matthew D.; Robertson, G.K.; Owen, Albert C.; Argo, Jeffrey W.; Nielsen, D.S.
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