Publications
Vacuum-Assisted ex situ Lift Out for Plan View FIB Specimen Preparation
High-Resolution Characterization of Josephson Junctions and Magnetic Multilayers for Low-Power Superconducting Logic and Memory Devices
Metallurgical Analysis of Pin-to-Flex Circuit Solder Joints
Comparison of analysis routines for EDS and EELS spectrum images of electrical contacts to single-walled carbon nanotubes
Microscopy and Microanalysis
Federal Business Opportunity on Material Characterization
6 Results