A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS Clark, Lawrence T.; Duvnjak, Alen D.; Brunhaver, John B.; Agarwal, Sapan A.; Manuel, Jack E.; Cannon, Matthew J.; Marinella, Matthew J. Abstract not provided. More Details TYPE Conference Presenation YEAR 2021 OSTIDOI
Measurement and Modeling of Single Event Transients in 12nm Inverters Agarwal, Sapan A.; Clark, Lawrence T.; YoungSciortino, Clifford Y.; Ng, Garrick N.; Black, Dolores A.; Cannon, Matthew J.; Black, Jeffrey B.; Quinn, Heather; Barnaby, Hugh J.; Brunhaver, John S.; Marinella, Matthew J. Abstract not provided. More Details TYPE Conference Presenation YEAR 2021 OSTIDOI
Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies Privat, A.P.; Barnaby, H.B.; Spear, M.S.; Esposito, Madeline G.; Manuel, Jack E.; Clark, Lawrence T.; Brunhaver, J.B.; A., Duvnjak A.; Jokai, R.J.; Holbert, K.E.; McLain, Michael L.; Marinella, Matthew J.; King, Michael P. Abstract not provided. More Details TYPE Conference Presenation YEAR 2020 OSTIDOI
Fault Tracking and Modeling in Advanced Node Processors of Single Event Effects Cannon, Matthew J.; Rodrigues, Arun; Black, Dolores A.; Black, Jeffrey B.; Bustamante, Luis G.; Feinberg, Benjamin F.; Quinn, Heather Q.; Clark, Lawrence T.; Brunhaver, John S.; Barnaby, Hugh J.; McLain, Michael L.; Agarwal, Sapan A.; Marinella, Matthew J. Abstract not provided. More Details TYPE Conference Poster YEAR 2020 OSTI