Controlling the explosion of a high-current-density conductor through the addition of micron-scale surface defects Awe, Thomas J.; Yu, Edmund Y.; Hatch, Maren H.; Tomlinson, Kurt T.; Tatum, William T.; Yates, Kevin C.; Hutsel, Brian T.; Bauer, Bruno S. Abstract not provided. More Details TYPE Conference Presenation YEAR 2021 OSTIDOI
Plasma formation from micron-scale defects on ultra-pure aluminum rods Hatch, Maren W.; Awe, Thomas J.; Yu, Edmund Y.; Yates, Kevin C.; Hutsel, Brian T.; Hutchinson, Trevor M.; Tatum, William T.; Tomlinson, Kurt T.; Gilmore, Mark A. Abstract not provided. More Details TYPE Conference Poster YEAR 2021 OSTIDOI
Using engineered defects to explore 3D feedback processes in current-driven metal Yu, Edmund Y.; Awe, Thomas J.; Cochrane, Kyle C.; Hatch, Maren W.; Peterson, Kyle J.; Hutchinson, Trevor M.; Yates, Kevin C.; Tomlinson, Kurt T.; Tatum, William T.; Bauer, Bruno S.; Hutsel, Brian T. Abstract not provided. More Details TYPE Conference Poster YEAR 2021 OSTIDOI