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IEEE Transactions on Nuclear Science
Black, Jeffrey B. ; Dame, Jeff A.; Black, Dolores A. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Teifel, John T. ; Salas, Joseph G. ; Steinbach, Robert; Davis, Matthew; Reed, Robert A.; Weller, Robert A.; Trippe, James M. ; Warren, Kevin M.; Tonigan, Andrew M.; Schrimpf, Ronald D.; Marquez, Richard S.
Silicon-on-insulator latch designs and layouts that are robust to multiple-node charge collection are introduced. A general Monte Carlo radiative energy deposition (MRED) approach is used to identify potential single-event susceptibilities associated with different layouts prior to fabrication. MRED is also applied to bound single-event testing responses of standard and dual interlocked cell latch designs. Heavy ion single-event testing results validate new latch designs and demonstrate bounds for standard latch layouts.
Black, Jeffrey B. ; Dame, Jeff A.; Black, Dolores A. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Teifel, John T. ; Salas, Joseph G. ; Steinbach, Robert S.; Davis, Matthew M.; Reed, Robert R.; Weller, Robert W.; Trippe, James M. ; Warren, Kevin W.; Tonigan, Andrew M.; Schrimpf, Ronald D.; Marquez, Richard S.
Teifel, John T. ; Wang, Cheng C.; Teifel, John T.
Teifel, John T. ; Wang, Cheng C.; Teifel, John T.
Teifel, John T. ; Black, Jeffrey B. ; Cavanaugh, William S. ; clark, kevin c.; McCasland, Jeffrey T. ; Owen, Richard E. ; Sharif, Moslema S.
Teifel, John T.
Teifel, John T. ; Black, Jeffrey B. ; Cavanaugh, William S. ; Clark, Kevin D. ; McCasland, Jeffrey T. ; Owen, Richard E. ; Sharif, Moslema S.
Teifel, John T. ; Land, Matthew L. ; Miller, Russell D.
Teifel, John T. ; Land, Matthew L. ; Miller, Russell D.
Black, Jeffrey B. ; Dodds, Nathaniel A. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Martinez, Marino M. ; Teifel, John T. ; Pearson, Sean P. ; Ma, Kwok-Kee M.
Teifel, John T. ; Black, Jeffrey B. ; Edwards, Eric E. ; Mannos, Tom M.
Teifel, John T. ; Black, Jeffrey B. ; Edwards, Eric E. ; Mannos, Tom M.
Teifel, John T. ; Flores, Richard S. ; Pearson, Sean P. ; Nowlin, Robert N. ; Black, Jeffrey B.
Teifel, John T. ; Flores, Richard S. ; Jarecki, Robert L. ; Bauer, Todd B. ; Shinde, Subhash L.
Teifel, John T. ; Flores, Richard S. ; Jarecki, Robert L. ; Bauer, Todd B. ; Shinde, Subhash L.
IEEE Aerospace Conference Proceedings
Teifel, John T. ; Flores, Richard S. ; Pearson, Sean P. ; Begay, Cynthia B. ; Ma, Kwok-Kee M. ; Palmer, Jeremy A.
Teifel, John T. ; Flores, Richard S. ; Pearson, Sean P. ; Begay, Cynthia B. ; Palmer, Jeremy A.
Teifel, John T. ; Flores, Richard S. ; Pearson, Sean P. ; Begay, Cynthia B. ; Ma, Kwok-Kee M. ; Palmer, Jeremy A.
Ma, Kwok-Kee M. ; Teifel, John T. ; Flores, Richard S.
Ma, Kwok-Kee M. ; Teifel, John T. ; Flores, Richard S.
Teifel, John T. ; Flores, Richard S. ; Pearson, Sean P. ; Begay, Cynthia B. ; Ma, Kwok-Kee M.
IEEE Transactions on Nuclear Science
Teifel, John T.
Dual-modular-redundancy (DMR) architectures use duplication and self-voting asynchronous circuits to mitigate single event transients (SETs). The area and performance of DMR circuitry is evaluated against conventional triple-modular-redundancy (TMR) logic. Benchmark ASIC circuits designed with DMR logic show a 1024% area improvement for flip-flop designs, and a 33% improvement for latch designs. © 2006 IEEE.
IEEE Transactions on Nuclear Science
Teifel, John T.
Teifel, John T.
Teifel, John T.
Teifel, John T. ; Flores, Richard S. ; Ma, Kwok-Kee M.
Teifel, John T. ; Flores, Richard S. ; Ma, Kwok-Kee M.
Teifel, John T.
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