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X-ray power and yield measurements at the refurbished Z machine

Review of Scientific Instruments

Jones, Brent M.; Ampleford, David A.; Cuneo, M.E.; Hohlfelder, Robert J.; Jennings, C.A.; Johnson, Drew J.; Jones, Brent M.; Lopez, M.R.; Macarthur, J.; Mills, Jerry A.; Preston, T.; Rochau, G.A.; Savage, Mark E.; Spencer, D.; Sinars, Daniel S.; Porter, J.L.

Advancements have been made in the diagnostic techniques to measure accurately the total radiated x-ray yield and power from z-pinch implosion experiments at the Z machine with high accuracy. The Z machine is capable of outputting 2 MJ and 330 TW of x-ray yield and power, and accurately measuring these quantities is imperative. We will describe work over the past several years which include the development of new diagnostics, improvements to existing diagnostics, and implementation of automated data analysis routines. A set of experiments on the Z machine were conducted in which the load and machine configuration were held constant. During this shot series, it was observed that the total z-pinch x-ray emission power determined from the two common techniques for inferring the x-ray power, a Kimfol filtered x-ray diode diagnostic and the total power and energy diagnostic, gave 449 TW and 323 TW, respectively. Our analysis shows the latter to be the more accurate interpretation. More broadly, the comparison demonstrates the necessity to consider spectral response and field of view when inferring x-ray powers from z-pinch sources. © 2014 AIP Publishing LLC.

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Differential B-dot and D-dot monitors for current and voltage measurements on a 20-MA 3-MV pulsed-power accelerator

Proposed for publication in Physical Review Special Topics - Accelerators and Beams.

Stygar, William A.; Savage, Mark E.; Speas, Christopher S.; Struve, Kenneth W.; Donovan, Guy L.; Lee, James R.; Leeper, Ramon J.; Leifeste, Gordon T.; Mills, Jerry A.; Rochau, G.A.; Rochau, Gary E.

We have developed a system of differential-output monitors that diagnose current and voltage in the vacuum section of a 20-MA 3-MV pulsed-power accelerator. The system includes 62 gauges: 3 current and 6 voltage monitors that are fielded on each of the accelerator's 4 vacuum-insulator stacks, 6 current monitors on each of the accelerator's 4 outer magnetically insulated transmission lines (MITLs), and 2 current monitors on the accelerator's inner MITL. The inner-MITL monitors are located 6 cm from the axis of the load. Each of the stack and outer-MITL current monitors comprises two separate B-dot sensors, each of which consists of four 3-mm-diameter wire loops wound in series. The two sensors are separately located within adjacent cavities machined out of a single piece of copper. The high electrical conductivity of copper minimizes penetration of magnetic flux into the cavity walls, which minimizes changes in the sensitivity of the sensors on the 100-ns time scale of the accelerator's power pulse. A model of flux penetration has been developed and is used to correct (to first order) the B-dot signals for the penetration that does occur. The two sensors are designed to produce signals with opposite polarities; hence, each current monitor may be regarded as a single detector with differential outputs. Common-mode-noise rejection is achieved by combining these signals in a 50-{Omega} balun. The signal cables that connect the B-dot monitors to the balun are chosen to provide reasonable bandwidth and acceptable levels of Compton drive in the bremsstrahlung field of the accelerator. A single 50-{omega} cable transmits the output signal of each balun to a double-wall screen room, where the signals are attenuated, digitized (0.5-ns/sample), numerically compensated for cable losses, and numerically integrated. By contrast, each inner-MITL current monitor contains only a single B-dot sensor. These monitors are fielded in opposite-polarity pairs. The two signals from a pair are not combined in a balun; they are instead numerically processed for common-mode-noise rejection after digitization. All the current monitors are calibrated on a 76-cm-diameter axisymmetric radial transmission line that is driven by a 10-kA current pulse. The reference current is measured by a current-viewing resistor (CVR). The stack voltage monitors are also differential-output gauges, consisting of one 1.8-cm-diameter D-dot sensor and one null sensor. Hence, each voltage monitor is also a differential detector with two output signals, processed as described above. The voltage monitors are calibrated in situ at 1.5 MV on dedicated accelerator shots with a short-circuit load. Faraday's law of induction is used to generate the reference voltage: currents are obtained from calibrated outer-MITL B-dot monitors, and inductances from the system geometry. In this way, both current and voltage measurements are traceable to a single CVR. Dependable and consistent measurements are thus obtained with this system of calibrated diagnostics. On accelerator shots that deliver 22 MA to a low-impedance z-pinch load, the peak lineal current densities at the stack, outer-MITL, and inner-MITL monitor locations are 0.5, 1, and 58 MA/m, respectively. On such shots the peak currents measured at these three locations agree to within 1%.

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Measurement of the energy and power radiated by a pulsed blackbody x-ray source

Proposed for publication in Physical Review E.

Stygar, William A.; Leeper, Ramon J.; Mazarakis, Michael G.; McDaniel, Dillon H.; Mckenney, John M.; Mills, Jerry A.; Ruggles, Larry R.; Seamen, Johann F.; Simpson, Walter W.; Dropinski, Steven D.; Warne, Larry K.; York, Matthew W.; McGurn, John S.; Bryce, Edwin A.; Chandler, Gordon A.; Cuneo, M.E.; Johnson, William Arthur.; Jorgenson, Roy E.

We have developed a diagnostic system that measures the spectrally integrated (i.e. the total) energy and power radiated by a pulsed blackbody x-ray source. The total-energy-and-power (TEP) diagnostic system is optimized for blackbody temperatures between 50 and 350 eV. The system can view apertured sources that radiate energies and powers as high as 2 MJ and 200 TW, respectively, and has been successfully tested at 0.84 MJ and 73 TW on the Z pulsed-power accelerator. The TEP system consists of two pinhole arrays, two silicon-diode detectors, and two thin-film nickel bolometers. Each of the two pinhole arrays is paired with a single silicon diode. Each array consists of a 38 x 38 square array of 10-{micro}m-diameter pinholes in a 50-{micro}m-thick tantalum plate. The arrays achromatically attenuate the x-ray flux by a factor of {approx}1800. The use of such arrays for the attenuation of soft x rays was first proposed by Turner and co-workers [Rev. Sci. Instrum. 70, 656 (1999)RSINAK0034-674810.1063/1.1149385]. The attenuated flux from each array illuminates its associated diode; the diode's output current is recorded by a data-acquisition system with 0.6-ns time resolution. The arrays and diodes are located 19 and 24 m from the source, respectively. Because the diodes are designed to have an approximately flat spectral sensitivity, the output current from each diode is proportional to the x-ray power. The nickel bolometers are fielded at a slightly different angle from the array-diode combinations, and view (without pinhole attenuation) the same x-ray source. The bolometers measure the total x-ray energy radiated by the source and--on every shot--provide an in situ calibration of the array-diode combinations. Two array-diode pairs and two bolometers are fielded to reduce random uncertainties. An analytic model (which accounts for pinhole-diffraction effects) of the sensitivity of an array-diode combination is presented.

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A new laser trigger system for current pulse shaping and jitter reduction on Z

Digest of Technical Papers-IEEE International Pulsed Power Conference

Bliss, David E.; Collins, R.T.; Dalton, D.G.; Dawson, E.J.; Doty, R.L.; Downey, T.L.; Harjes, Henry C.; Illescas, E.A.; Knudson, Marcus D.; Lewis, B.A.; Mills, Jerry A.; Ploor, S.D.; Podsednik, Jason P.; Rogowski, Sonrisa T.; Shams, M.S.; Struve, Kenneth W.

A new laser trigger system (LTS) has been installed on Z that benefits the experimenter with reduced temporal jitter on the x-ray output, the confidence to use command triggers for time sensitive diagnostics and the ability to shape the current pulse at the load. This paper presents work on the pulse shaping aspects of the new LTS. Pulse shaping is possible because the trigger system is based on 36 individual lasers, one per each pulsed power module, instead of a single laser for the entire machine. The firing time of each module can be individually controlled to create an overall waveform that is the linear superposition of all 36 modules. In addition, each module can be set to a long- or short-pulse mode for added flexibility. The current waveform has been stretched from ∼100 ns to ∼250 ns. A circuit model has been developed with BERTHA Code, which contains the independent timing feature of the new LTS to predict and design pulse shapes. The ability to pulse-shape directly benefits isentropic compression experiments (ICE) and equation of state measurements (EOS) for the shock physics programs at Sandia National Laboratories. With the new LTS, the maximum isentropic loading applied to Cu samples 750 um thick has been doubled to 3.2 Mb without generating a shockwave. Macroscopically thick sample of Al, 1.5 mm, have been isentropically compressed to 1.7 Mb. Also, shockless Ti flyer-plates have been launched to 21 km·s-1, remaining in the solid state until impact.

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Z-pinch current-scaling experiments at 10[7] amps

Proposed for publication in Physical Review E.

Stygar, William A.; Matzen, M.K.; Mazarakis, Michael G.; McDaniel, Dillon H.; McGurn, John S.; Mckenney, John M.; Mix, L.P.; Muron, David J.; Ramirez, Juan J.; Ruggles, Larry R.; Stygar, William A.; Seamen, Johann F.; Simpson, Walter W.; Speas, Christopher S.; Spielman, Rick B.; Struve, Kenneth W.; Vesey, Roger A.; Wagoner, Tim C.; Gilliland, Terrance L.; Bennett, Guy R.; Ives, Harry C.; Jobe, Daniel O.; Lazier, Steven E.; Mills, Jerry A.; Mulville, Thomas D.; Pyle, John H.; Romero, Tobias M.; Seamen, Johann F.; Serrano, Jason D.; Smelser, Ruth S.; Fehl, David L.; Cuneo, M.E.; Bailey, James E.; Bliss, David E.; Chandler, Gordon A.; Leeper, Ramon J.

Abstract not provided.

13 Results
13 Results