This report summarizes research performed in the context of a REHEDS LDRD project that explores methods for measuring electrical properties of vessel joints. These properties, which include contact points and associated contact resistance, are “hidden” in the sense that they are not apparent from a computer-assisted design (CAD) description or visual inspection. As is demonstrated herein, the impact of this project is the development of electromagnetic near-field scanning capabilities that allow weapon cavity joints to be characterized with high spatial and/or temporal resolution. Such scans provide insight on the hidden electrical properties of the joint, allowing more detailed and accurate models of joints to be developed, and ultimately providing higher fidelity shielding effectiveness (SE) predictions. The capability to perform high-resolution temporal scanning of joints under vibration is also explored, using a multitone probing concept, allowing time-varying properties of joints to be characterized and the associated modulation to SE to be quantified.
We analyze the coupling into a slotted cylindrical cavity operating at fundamental cavity modal frequencies overlapping with the slot’s first resonance frequency through an unmatched formulation that accounts for the slot’s absorption and radiation processes. The model is validated through full-wave simulations and experimental data. We then couple the unmatched formulation to a perturbation theory model to investigate an absorber within the cavity to reduce the interior field strength, also validated with full-wave simulations and experiments. These models are pivotal to understanding the physical processes involved in the electromagnetic penetration through slots, and may constitute design tools to mitigate electromagnetic interference effects within cavities.
In this article, we examine the coupling into an electrically short azimuthal slot on a cylindrical cavity operating at fundamental cavity modal frequencies. We first develop a matched bound formulation through which we can gather information for maximum achievable levels of interior cavity fields. Actual field levels are below this matched bound; therefore, we also develop an unmatched formulation for frequencies below the slot resonance to achieve a better insight on the physics of this coupling. Good agreement is observed between the unmatched formulation, full-wave simulations, and experimental data, providing a validation of our analytical models. We then extend the unmatched formulation to treat an array of slots, found again in good agreement with full-wave simulations. These analytical models can be used to investigate ways to mitigate electromagnetic interference and electromagnetic compatibility effects within cavities.
We summarize the narrow slot algorithms, including the thick electrically small depth case, conductive gaskets, the deep general depth case, multiple fasteners along the length, and finally varying slot width.
Placing microwave absorbing materials into a high-quality factor resonant cavity may in general reduce the large interior electromagnetic fields excited under external illumination. In this paper, we aim to combine two analytical models we previously developed: 1) an unmatched formulation for frequencies below the slot resonance to model shielding effectiveness versus frequency; and 2) a perturbation model approach to estimate the quality factor of cavities in the presence of absorbers. The resulting model realizes a toolkit with which design guidelines of the absorber’s properties and location can be optimized over a frequency band. Analytic predictions of shielding effectiveness for three transverse magnetic modes for various locations of the absorber placed on the inside cavity wall show good agreement with both full-wave simulations and experiments, and validate the proposed model. This analysis opens new avenues for specialized ways to mitigate harmful fields within cavities.
In this paper, we investigate the coupling from external electromagnetic (EM) fields to the interior EM fields of a high-quality factor cylindrical cavity through a small perturbing slot. We illustrate the shielding effectiveness versus frequency, highlighting bounds on the penetrant power through the slot. Because internal fields may become larger than external ones, we then introduce a small amount of microwave absorbing materials decorating the slot to improve shielding effectiveness considerably, as shown by both simulations and experiments. Although the cylindrical cavity is used for demonstration purposes in this paper, the conclusions presented here can be leveraged for use with more complex cavity structures.
This report explores the potential for reducing the fields and the quality factor within a system cavity by introducing microwave absorbing materials. Although the concept of introducing absorbing (lossy) materials within a cavity to drive the interior field levels down is well known, increasing the loading into a complex weapon cavity specifically for improved electromagnetic performance has not, in general, been considered, and this will be the subject of this work. We compare full-wave simulations to experimental results, demonstrating the applicability of the proposed method.
The analysis of electromagnetic coupling in nonlinear circuits requires a bidirectional, fully consistent approach. Nonlinear responses of semiconductor devices in electronic circuit components can change the impedances seen at circuit nodes, changing the boundary conditions encountered by impressed electromagnetic fields, and thus changing the characteristics of the energy coupled from these external fields into that circuit. It is important to include the coupling in the circuit simulation self-consistently because this allows us to accurately predict the responses to various EMI/EMC problems of interest. It is also important to predict circuit responses efficiently because that opens the door to statistical applications for the technique being used. In this paper, we review a technique that we have developed called ATHENA (A THevenin Equivalent Network Approach). This approach is shown to be quite robust in that it is computationally efficient, it can be implemented in a variety of commonly available circuit solving codes, it already includes a few additional techniques required to enhance its implementation in those codes, and it is quite accurate.
This report examines bounds on the penetrant power through ports of entry into a conductive cavity. We first replace the cavity by a load and consider the maximum power transfer properties of an antenna or an aperture. We consider how limitations on the load quality factor place limits on received power. For general frequency ranges we model the backing region by means of a uniformly distributed matched load along a slot aperture and adjust its value for maximum power transfer. This result is derived in closed form using a transmission line model for the aperture. This result illustrates the reduction in received power for low frequencies with finitely conducting wall materials. At high frequencies it approaches the receiving cross section of a linear array having the slot length dimension. Next we examine a slot aperture in a conducting rectangular enclosure and determine how the cavity wall losses and resulting quality factor limit the penetrant power. Detailed simulations and experimental measurements are compared with each other and with the bounding results to assess the accuracy of the bounds. These comparisons also indicate limitations on the accuracy of the models due to perturbing influences in construction, such as bolted joints.
The objective of this work was to understand the fundamental physics of extremely high frequency RF effects on electronics. To accomplish this objective, we produced models, conducted simulations, and performed measurements to identify the mechanisms of effects as frequency increases into the millimeter-wave regime. Our purpose was to answer the questions, 'What are the tradeoffs between coupling, transmission losses, and device responses as frequency increases?', and, 'How high in frequency do effects on electronic systems continue to occur?' Using full wave electromagnetics codes and a transmission-line/circuit code, we investigated how extremely high-frequency RF propagates on wires and printed circuit board traces. We investigated both field-to-wire coupling and direct illumination of printed circuit boards to determine the significant mechanisms for inducing currents at device terminals. We measured coupling to wires and attenuation along wires for comparison to the simulations, looking at plane-wave coupling as it launches modes onto single and multiconductor structures. We simulated the response of discrete and integrated circuit semiconductor devices to those high-frequency currents and voltages, using SGFramework, the open-source General-purpose Semiconductor Simulator (gss), and Sandia's Charon semiconductor device physics codes. This report documents our findings.