Publications

Marinella, Matthew J.; Hughart, David R.; Stevens, James E.; Mickel, Patrick R.; Haase, Gad S.; Decker, Seth D.; Apodaca, Roger A.; Bielejec, Edward S.; Vizkelethy, Gyorgy V.; McLain, Michael L.

Abstract not provided.

Marinella, Matthew J.; Marinella, Matthew J.; Howell, Stephen W.; Howell, Stephen W.; Decker, Seth D.; Decker, Seth D.; Hughart, David R.; Hughart, David R.; Lohn, Andrew L.; Lohn, Andrew L.; Mickel, Patrick R.; Mickel, Patrick R.; Apodaca, Roger A.; Apodaca, Roger A.; Bielejec, Edward S.; Bielejec, Edward S.; Beechem, Thomas E.; Beechem, Thomas E.; Wolfley, Steven L.; Wolfley, Steven L.; Stevens, James E.; Brennecka, Geoffrey L.

Abstract not provided.

Marinella, Matthew J.; Mickel, Patrick R.; Lohn, Andrew L.; Hughart, David R.; Bondi, Robert J.; Mamaluy, Denis M.; Hjalmarson, Harold P.; Stevens, James E.; Decker, Seth D.; Apodaca, Roger A.; Evans, Brian R.; Aimone, James B.; Rothganger, Fredrick R.; James, Conrad D.; DeBenedictis, Erik

Abstract not provided.

Marinella, Matthew J.; Mickel, Patrick R.; Lohn, Andrew L.; Hughart, David R.; Bondi, Robert J.; Mamaluy, Denis M.; Hjalmarson, Harold P.; Stevens, James E.; Decker, Seth D.; Apodaca, Roger A.; Evans, Brian R.; Aimone, James B.; Rothganger, Fredrick R.; James, Conrad D.; DeBenedictis, Erik

This report discusses aspects of neuromorphic computing and how it is used to model microsystems.

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Lohn, Andrew J.; Doyle, Barney L.; Stein, Gregory J.; Mickel, Patrick R.; Stevens, James E.; Marinella, Matthew J.

We present a novel ion beam analysis technique combining Rutherford forward scattering and elastic recoil detection (RFSERD) and demonstrate its ability to increase efficiency in determining stoichiometry in ultrathin (5-50 nm) films as compared to Rutherford backscattering. In the conventional forward geometries, scattering from the substrate overwhelms the signal from light atoms but in RFSERD, scattered ions from the substrate are ranged out while forward scattered ions and recoiled atoms from the thin film are simultaneously detected in a single detector. The technique is applied to tantalum oxide memristors but can be extended to a wide range of materials systems. © 2014 Published by Elsevier B.V.

Journal of Applied Physics

Brumbach, Michael T.; Kalan, Michael K.; Mirabal, Alex J.; Mickel, Patrick R.; Lohn, Andrew L.; Marinella, Matthew J.; Stevens, James E.

Abstract not provided.

Journal of Applied Physics

Brumbach, Michael T.; Kalan, Michael K.; Mirabal, Alex J.; Mickel, Patrick R.; Lohn, Andrew L.; Marinella, Matthew J.; Stevens, James E.

Abstract not provided.

Highstrete, Clark H.; Sterk, Jonathan D.; Heller, Edwin J.; Maunz, Peter L.; Nordquist, Christopher N.; Stevens, James E.; Tigges, Chris P.; Blain, Matthew G.

Trapped atomic ions are a leading physical system for quantum information processing. However, scalability and operational fidelity remain limiting technical issues often associated with optical qubit control. One promising approach is to develop on-chip microwave electronic control of ion qubits based on the atomic hyperfine interaction. This project developed expertise and capabilities at Sandia toward on-chip electronic qubit control in a scalable architecture. The project developed a foundation of laboratory capabilities, including trapping the ¹⁷¹Yb⁺ hyperfine ion qubit and developing an experimental microwave coherent control capability. Additionally, the project investigated the integration of microwave device elements with surface ion traps utilizing Sandia’s state-of-the-art MEMS microfabrication processing. This effort culminated in a device design for a multi-purpose ion trap experimental platform for investigating on-chip microwave qubit control, laying the groundwork for further funded R&D to develop on-chip microwave qubit control in an architecture that is suitable to engineering development.

Marinella, Matthew J.; Stevens, James E.; Mickel, Patrick R.; Lohn, Andrew L.; Hughart, David R.

Abstract not provided.

Stevens, James E.; Decker, Seth D.; Hughart, David R.; Mickel, Patrick R.; Marinella, Matthew J.

Abstract not provided.

Marinella, Matthew J.; Stevens, James E.; Mickel, Patrick R.; Lohn, Andrew L.; Hughart, David R.

Abstract not provided.

ECS Transactions (Online)

Stevens, James E.; Mickel, Patrick R.; Hughart, David R.; Marinella, Matthew J.

Resistive random access memory (ReRAM) has become a promising candidate for next-generation high-performance non-volatile memory that operates by electrically tuning resistance states via modulating vacancy concentrations. Here, we demonstrate a wafer-scale process for resistive switching in tantalum oxide that is completely CMOS compatible. The resulting devices are forming-free and with greater than 1x10⁵ cycle endurance.

Mickel, Patrick R.; Stevens, James E.; Doyle, Barney L.; Brumbach, Michael T.; Marinella, Matthew J.

Abstract not provided.

JVSTA

Lohn, Andrew L.; Mickel, Patrick R.; Doyle, Barney L.; Marinella, Matthew J.; Stevens, James E.

Abstract not provided.

Lohn, Andrew L.; Doyle, Barney L.; Mickel, Patrick R.; Stevens, James E.; Marinella, Matthew J.

Abstract not provided.

Lohn, Andrew L.; Mickel, Patrick R.; Stevens, James E.; Doyle, Barney L.; Brumbach, Michael T.; Marinella, Matthew J.

Abstract not provided.

Doyle, Barney L.; Lohn, Andrew L.; Mickel, Patrick R.; Stevens, James E.; Marinella, Matthew J.

Abstract not provided.

Applied Physics Letters

Lohn, Andrew L.; Stevens, James E.; Mickel, Patrick R.; Marinella, Matthew J.

Abstract not provided.

Marinella, Matthew J.; Stevens, James E.; Mickel, Patrick R.; Lohn, Andrew L.; Hughart, David R.

Abstract not provided.

Nguyen, Khoi T.; Stevens, James E.; Grubbs, Robert K.; Pluym, Tammy P.; Dominguez, Jason J.; Young, Ralph W.; Muller, Richard P.; Nielsen, Erik N.; Jacobson, Noah T.; Lilly, Michael L.; Carroll, Malcolm; Bishop, Nathaniel B.; Tracy, Lisa A.; Carr, Stephen M.; Lu, Tzu-Ming L.; Wendt, J.R.

Abstract not provided.

Doyle, Barney L.; Stevens, James E.; Marinella, Matthew J.; Kammler, Daniel K.; Lohn, Andrew L.

Abstract not provided.

Marinella, Matthew J.; Stevens, James E.; Mickel, Patrick R.; Lohn, Andrew L.; Hughart, David R.

Abstract not provided.

Maunz, Peter L.; Scott, Sean M.; Sterk, Jonathan D.; Stevens, James E.; Tigges, Chris P.; Stick, Daniel L.; Blain, Matthew G.; Benito, Francisco M.; Chou, Chin-wen C.; Clark, Craig R.; Haltli, Raymond A.; Ellis, A.R.; Highstrete, Clark H.; Kemme, S.A.; Nordquist, Christopher N.

Abstract not provided.

Marinella, Matthew J.; Stevens, James E.; Akinnikawe, Erin M.; Kotula, Paul G.

Abstract not provided.

Benito, Francisco M.; Moehring, David L.; Stick, Daniel L.; Blain, Matthew G.; Clark, Craig R.; Haltli, Raymond A.; Highstrete, Clark H.; Nordquist, Christopher N.; Scott, Sean M.; Stevens, James E.; Tigges, Chris P.

Abstract not provided.