Publications

Crane, Nathan K.; Cox, James C.

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Cox, James C.; Crane, Nathan K.

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Silling, Stewart A.; Cox, James C.

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Silling, Stewart A.; Cox, James C.

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Silling, Stewart A.; Cox, James C.

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Proposed for publication in Journal of Engineering Materials and Technology .

Reedy, Earl D.; Cox, James C.

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Schunk, Randy; Grest, Gary S.; Chandross, M.; Reedy, Earl D.; Cox, James C.; Fan, Hongyou F.

Large-scale, high-throughput production of nano-structured materials (i.e. nanomanufacturing) is a strategic area in manufacturing, with markets projected to exceed $1T by 2015. Nanomanufacturing is still in its infancy; process/product developments are costly and only touch on potential opportunities enabled by growing nanoscience discoveries. The greatest promise for high-volume manufacturing lies in age-old coating and imprinting operations. For materials with tailored nm-scale structure, imprinting/embossing must be achieved at high speeds (roll-to-roll) and/or over large areas (batch operation) with feature sizes less than 100 nm. Dispersion coatings with nanoparticles can also tailor structure through self- or directed-assembly. Layering films structured with these processes have tremendous potential for efficient manufacturing of microelectronics, photovoltaics and other topical nano-structured devices. This project is designed to perform the requisite R and D to bring Sandia's technology base in computational mechanics to bear on this scale-up problem. Project focus is enforced by addressing a promising imprinting process currently being commercialized.

Boyce, Brad B.; Foulk, James W.; Littlewood, David J.; Mota, Alejandro M.; Ostien, Jakob O.; Silling, Stewart A.; Spencer, Benjamin S.; Wellman, Gerald W.; Bishop, Joseph E.; Brown, Arthur B.; Córdova, Theresa E.; Cox, James C.; Crenshaw, Thomas B.; Dion, Kristin D.; Emery, John M.

Fracture or tearing of ductile metals is a pervasive engineering concern, yet accurate prediction of the critical conditions of fracture remains elusive. Sandia National Laboratories has been developing and implementing several new modeling methodologies to address problems in fracture, including both new physical models and new numerical schemes. The present study provides a double-blind quantitative assessment of several computational capabilities including tearing parameters embedded in a conventional finite element code, localization elements, extended finite elements (XFEM), and peridynamics. For this assessment, each of four teams reported blind predictions for three challenge problems spanning crack initiation and crack propagation. After predictions had been reported, the predictions were compared to experimentally observed behavior. The metal alloys for these three problems were aluminum alloy 2024-T3 and precipitation hardened stainless steel PH13-8Mo H950. The predictive accuracies of the various methods are demonstrated, and the potential sources of error are discussed.

Cox, James C.

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Cox, James C.

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Cox, James C.

Meaningful computational investigations of many solid mechanics problems require accurate characterization of material behavior through failure. A recent approach to fracture modeling has combined the partition of unity finite element method (PUFEM) with cohesive zone models. Extension of the PUFEM to address crack propagation is often referred to as the extended finite element method (XFEM). In the PUFEM, the displacement field is enriched to improve the local approximation. Most XFEM studies have used simplified enrichment functions (e.g., generalized Heaviside functions) to represent the strong discontinuity but have lacked an analytical basis to represent the displacement gradients in the vicinity of the cohesive crack. As such, the mesh had to be sufficiently fine for the FEM basis functions to capture these gradients.In this study enrichment functions based upon two analytical investigations of the cohesive crack problem are examined. These functions have the potential of representing displacement gradients in the vicinity of the cohesive crack with a relatively coarse mesh and allow the crack to incrementally advance across each element. Key aspects of the corresponding numerical formulation are summarized. Analysis results for simple model problems are presented to evaluate if quasi-static crack propagation can be accurately followed with the proposed formulation. A standard finite element solution with interface elements is used to provide the accurate reference solution, so the model problems are limited to a straight, mode I crack in plane stress. Except for the cohesive zone, the material model for the problems is homogenous, isotropic linear elasticity. The effects of mesh refinement, mesh orientation, and enrichment schemes that enrich a larger region around the cohesive crack are considered in the study. Propagation of the cohesive zone tip and crack tip, time variation of the cohesive zone length, and crack profiles are presented. The analysis results indicate that the enrichment functions based upon the asymptotic solutions can accurately track the cohesive crack propagation independent of mesh orientation. Example problems incorporating enrichment functions for mode II kinematics are also presented. The results yield acceptable crack paths compared with experimental studies. The applicability of the enrichment functions to problems with anisotropy, large strains, and inelasticity is the subject of ongoing studies. Preliminary results for a contrived orthotropic elastic material reflect a decrease in accuracy with increased orthotropy but do not preclude their application to this class of problems.

Cox, James C.

Abstract not provided.

Battaile, Corbett C.; Bartel, Timothy J.; Reedy, Earl D.; Cox, James C.; Foulk, James W.; Puskar, J.D.; Boyce, Brad B.; Emery, John M.

Fatigue cracking in metals has been and is an area of great importance to the science and technology of structural materials for quite some time. The earliest stages of fatigue crack nucleation and growth are dominated by the microstructure and yet few models are able to predict the fatigue behavior during these stages because of a lack of microstructural physics in the models. This program has developed several new simulation tools to increase the microstructural physics available for fatigue prediction. In addition, this program has extended and developed microscale experimental methods to allow the validation of new microstructural models for deformation in metals. We have applied these developments to fatigue experiments in metals where the microstructure has been intentionally varied.

Cox, James C.

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Cox, James C.

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Cox, James C.

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Cox, James C.

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Cox, James C.

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International Journal of Numerical Methods in Engineering

Cox, James C.

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Cox, James C.

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Cox, James C.

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Cox, James C.

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Walraven, J.A.; Cox, James C.; Skousen, Troy J.; Ohlhausen, J.A.; Jenkins, Mark W.; Jokiel, Bernhard J.; Parson, Ted B.; Tang, Michelle D.

Qualification of microsystems for weapon applications is critically dependent on our ability to build confidence in their performance, by predicting the evolution of their behavior over time in the stockpile. The objective of this work was to accelerate aging mechanisms operative in surface micromachined silicon microelectromechanical systems (MEMS) with contacting surfaces that are stored for many years prior to use, to determine the effects of aging on reliability, and relate those effects to changes in the behavior of interfaces. Hence the main focus was on 'dormant' storage effects on the reliability of devices having mechanical contacts, the first time they must move. A large number ({approx}1000) of modules containing prototype devices and diagnostic structures were packaged using the best available processes for simple electromechanical devices. The packaging processes evolved during the project to better protect surfaces from exposure to contaminants and water vapor. Packages were subjected to accelerated aging and stress tests to explore dormancy and operational environment effects on reliability and performance. Functional tests and quantitative measurements of adhesion and friction demonstrated that the main failure mechanism during dormant storage is change in adhesion and friction, precipitated by loss of the fluorinated monolayer applied after fabrication. The data indicate that damage to the monolayer can occur at water vapor concentrations as low as 500 ppm inside the package. The most common type of failure was attributed to surfaces that were in direct contact during aging. The application of quantitative methods for monolayer lubricant analysis showed that even though the coverage of vapor-deposited monolayers is generally very uniform, even on hidden surfaces, locations of intimate contact can be significantly depleted in initial concentration of lubricating molecules. These areas represent defects in the film prone to adsorption of water or contaminants that can cause movable structures to adhere. These analysis methods also indicated significant variability in the coverage of lubricating molecules from one coating process to another, even for identical processing conditions. The variability was due to residual molecules left in the deposition chamber after incomplete cleaning. The coating process was modified to result in improved uniformity and total coverage. Still, a direct correlation was found between the resulting static friction behavior of MEMS interfaces, and the absolute monolayer coverage. While experimental results indicated that many devices would fail to start after aging, the modeling approach used here predicted that all the devices should start. Adhesion modeling based upon values of adhesion energy from cantilever beams is therefore inadequate. Material deposition that bridged gaps was observed in some devices, and potentially inhibits start-up more than the adhesion model indicates. Advances were made in our ability to model MEMS devices, but additional combined experimental-modeling studies will be needed to advance the work to a point of providing predictive capability. The methodology developed here should prove useful in future assessments of device aging, however. Namely, it consisted of measuring interface properties, determining how they change with time, developing a model of device behavior incorporating interface behavior, and then using the age-aware interface behavior model to predict device function.

Bishop, Joseph E.; Heinstein, Martin W.; Cox, James C.

Abstract not provided.