Publications

1 Result
Skip to search filters

Improved Throughput and Analysis of Scratch Test Results via Automation and Machine Learning

Lim, Hannah H.; Curry, John C.; Dugger, Michael T.

A data analysis automation interface that incorporates machine learning (ML) has been developed to improve productivity, efficiency, and consistency in identifying and defining critical load values (or other values associated with optically identifiable characteristics) of a coating when a scratch test is performed. In this specific program, the machine learning component of the program has been trained to identify the Critical Load 2 (LC2 ) value by analyzing images of the scratch tracks created in each test. An optical examination of the scratch by a human operator is currently used to determine where this value occurs. However, the vagueness of the standard has led to varying interpretations and nonuniform usage by different operators at different laboratories where the test is implemented, resulting in multiple definitions of the desired parameter. Using a standard set of training and validation images to create the dataset, the critical load can be identified consistently amongst different laboratories using the automation interface without requiring the training of human operators. When the model was used in conjunction with an instrument manufacturer's scratch test software, the model produced accurate and repeatable results and defined LC2 values in as little as half of the time compared to a human operator. When combined with a program that automates other aspects of the scratch testing process usually conducted by a human operator, scratch testing and analysis can occur with little to no intervention from a human beyond initial setup and frees them to complete other work in the lab.

More Details
1 Result
1 Result