Sandia?s Radiation-Tolerant Silicon and InP Photonics Platforms with Multi-Project Wafer Runs
Abstract not provided.
Publications
A Window-less Target for Magnetized Liner Inertial Fusion Characterized using High-Speed Solid-State Framing Cameras
Abstract not provided.
High-Speed Solid-State X-ray Framing Camera Improvements and Performance Testing
Abstract not provided.
Design and characterization of an improved, 2 ns, multi-frame imager for the Ultra-Fast X-ray Imager (UXI) program at Sandia National Laboratories
Proceedings of SPIE - The International Society for Optical Engineering
The Icarus camera is an improvement on past imagers (Furi and Hippogriff) designed for the Ultra-Fast X-ray Imager (UXI) program to deliver ultra-fast, time-gated, multi-frame image sets for High Energy Density Physics (HEDP) experiments. Icarus is a 1024 × 512 pixel array with 25 μm spatial resolution containing 4 frames of storage per pixel. It has improved timing generation and distribution components and has achieved 2 ns time gating. Design improvements and initial characterization and performance results will be discussed. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc. for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525.
Semiconductor Detectors for Sub-ns Detection of 20-70 keV X-Rays
Abstract not provided.
Initial characterization results of a 1024 x 448 25 μm multi-frame camera with 2 ns integration time for the Ultra-Fast X-ray Imager (UXI) program at Sandia National Laboratories
Abstract not provided.
The Ultrafast X-ray Imager (UXI) Program
Abstract not provided.
Electronic forensic techniques for manufacturer attribution
Proceedings of the 2016 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2016
The microelectronics industry seeks screening tools that can be used to verify the origin of and track integrated circuits (ICs) throughout their lifecycle. Embedded circuits that measure process variation of an IC are well known. This paper adds to previous work using these circuits for studying manufacturer characteristics on final product ICs, particularly for the purpose of developing and verifying a signature for a microelectronics manufacturing facility (fab). We present the design, measurements and analysis of 159 silicon ICs which were built as a proof of concept for this purpose. 80 copies of our proof of concept IC were built at one fab, and 80 more copies were built across two lots at a second fab. Using these ICs, our prototype circuits allowed us to distinguish these two fabs with up to 98.7% accuracy and also distinguish the two lots from the second fab with up to 98.8% accuracy.
Electronic Forensic Techniques for Manufacturer Attribution (Poster Session Slide)
Abstract not provided.
Electronic Forensic Techniques for Manufacturer Attribution
Abstract not provided.
Initial characterization results of a 1024x448, 25-μm multi-frame camera with 2ns integration time for the Ultrafast X-ray Imager (UXI) program at Sandia National Laboratories
Proceedings of SPIE - The International Society for Optical Engineering
The Hippogriff camera developed at Sandia National Laboratories as part of the Ultra-Fast X-ray Imager (UXI) program is a high-speed, multi-frame, time-gated imager for use on a wide variety of High Energy Density (HED) physics experiments on both Sandia's Z-Machine and the National Ignition Facility. The camera is a 1024 x 448 pixel array with 25 μm spatial resolution, containing 2 frames per pixel natively and has achieved 2 ns minimum integration time. It is sensitive to both optical photons as well as soft X-rays up to ∼6 keV. The Hippogriff camera is the second generation UXI camera that contains circuitry to trade spatial resolution for additional frames of temporal coverage. The user can reduce the row-wise spatial resolution from the native 25 μm to increase the number of frames in a data set to 4 frames at 50 μm or 8 frames at 100 μm spatial resolution. This feature, along with both optical and X-ray sensitivity, facilitates additional experimental flexibility. Minimum signal is 1500 erms and full well is 1.5 million e-.
Direct Detection of > 15 keV X-ray Photons on a Hybrid-CMOS Imager
Abstract not provided.
An overview of the Ultra-Fast X-ray Imager (UXI) program at Sandia Labs
Abstract not provided.
An overview of the Ultra-Fast X-ray Imager (UXI) program at Sandia Labs
Abstract not provided.
An overview of the ultra-fast X-ray imager (UXI) program at Sandia Labs
Proceedings of SPIE - The International Society for Optical Engineering
The Ultra-Fast X-ray Imager (UXI) program is an ongoing effort at Sandia National Laboratories to create high speed, multi-frame, time gated Read Out Integrated Circuits (ROICs), and a corresponding suite of photodetectors to image a wide variety of High Energy Density (HED) physics experiments on both Sandia's Z-Machine and the National Ignition Facility (NIF). The program is currently fielding a 1024 x 448 prototype camera with 25 μm pixel spatial resolution, 2 frames of in-pixel storage and the possibility of exchanging spatial resolution to achieve 4 or 8 frames of storage. The camera's minimum integration time is 2 ns. Minimum signal target is 1500 e-rms and full well is 1.5 million e-. The design and initial characterization results will be presented as well as a description of future imagers.
Ultra-fast X-ray Imager (UXI) Program
Abstract not provided.
A Brief Overview of Research Into Radiation Source Development and Radiation Sensors in the Microfabrication Program at Sandia National Laboratories
Abstract not provided.
Silicon photonic link in CMOS quilt package
Abstract not provided.
Physics Proof of Principle Results for Pixellated Element Gamma and Neutron Sensors
Abstract not provided.
Design Issues in Bonded Silicon as a Platform for Pixellated Element 3D Volume Scalable High Pressure and Exotic Material Radiation Sensors
Abstract not provided.
20 Results