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Optical spectroscopy of ingan epilayers in the low indium composition regime

Materials Research Society Symposium - Proceedings

Crawford, M.H.; Han, J.; Banas, M.A.; Myers, S.M.; Peterscn, G.A.; Figiel, J.J.

Photoluminescence (PL) spectroscopy was carried out on a series of Si-doped bulk InGaN films in the low indium (In) composition regime. Room temperature PL showed a factor of 25 increase in integrated intensity as the In composition was increased from 0 to 0.07. Temperature dependent PL data was fit to an Arrhenius equation to reveal an increasing activation energy for thermal quenching of the PL intensity as the In composition is increased. Time resolved PL measurements revealed that only the sample with highest In ( x=0.07) showed a strong spectral variation in decay time across the T=4K PL resonance, indicative of recombination from localized states at low temperatures. The decay times at room temperature were non-radiatively dominated for all films, and the room temperature (non-radiative) decay times increased with increasing In, from 50-230 psec for x=0-0.07. Our data demonstrate that non-radiative recombination is less effective with increasing In composition. © 2000 Materials Research Society.

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Control and Elimination of Cracking of AlGaN Using Low-Temperature AlGaN Interlayers

Applied Physics Letters

Han, J.; Waldrip, Karen E.; Figiel, J.J.; Peterscn, G.A.; Myers, S.M.

We demonstrate that the insertion of low-temperature (LT) AlGaN interlayers is effective in reducing mismatch-induced tensile stress and suppressing the formation of cracks during growth of AlGaN directly upon GaN epilayers., Stress evolution and relaxation is monitored using an in-situ optical stress sensor. The combination of in-situ and ex-situ. characterization techniques enables us to determine the degree of pseudomorphism in the interlayers. It is observed that the elastic tensile mismatch between AlGaN and GaN is mediated by the relaxation of interlayers; the use of interlayers offers tunability in the in-plane lattice parameters.

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Diffusion, Uptake and Release of Hydrogen in p-type Gallium Nitride: Theory and Experiment

Journal of Applied Physics

Myers, S.M.; Wright, Alan F.; Peterscn, G.A.; Wampler, William R.; Seager, Carleton H.; Crawford, Mary H.; Han, J.

The diffusion, uptake, and release of H in p-type GaN are modeled employing state energies from density-function theory and compared with measurements of deuterium uptake and release using nuclear-reaction analysis. Good semiquantitative agreement is found when account is taken of a surface permeation barrier.

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The equilibrium state of hydrogen in gallium nitride: Theory and experiment

Journal of Applied Physics

Myers, S.M.; Wright, Alan F.; Peterscn, G.A.; Seager, Carleton H.; Wampler, William R.; Crawford, Mary H.; Han, J.

Formation energies and vibrational frequencies for H in wurtzite GaN were calculated from density functional theory and used to predict equilibrium state occupancies and solid solubilities for p-type, intrinsic, and n-type material. The solubility of deuterium (D) was measured at 600--800 C as a function of D{sub 2} pressure and doping and compared with theory. Agreement was obtained by reducing the H formation energies 0.2 eV from ab-initio theoretical values. The predicted stretch-mode frequency for H bound to the Mg acceptor lies 5% above an observed infrared absorption attributed to this complex. It is concluded that currently recognized H states and physical processes account for the equilibrium behavior of H examined in this work.

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Copper gettering by aluminum precipitates in aluminum-implanted silicon

Journal of Applied Physics

Peterscn, G.A.; Myers, S.M.; Myers, S.M.

Copper in Si is shown to be strongly gettered by Al-rich precipitates formed by implanting Al to supersaturation and followed by annealing. At temperatures ranging from 600 to 800 C a layer containing Al precipitates is found to getter Cu from Cu silicide located on the opposite side of a 0.25-mm Si wafer, indicating a substantially lower chemical potential for the Cu in the molten-A1 phase. Cu gettering proceeds rapidly until an atomic ratio of approximately 2 Cu atoms to 1 Al atom is reached in the precipitated Al region, after which the gettering process slows. Redistribution of Cu from one Al-rich layer to another at low Cu concentrations demonstrates that a segregation-type gettering mechanism is operating. Cu gettering occurs primarily in the region containing the precipitated Al rather than the region where the Al is entirely substitutional.

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OMVPE Growth of Quaternary (Al,Ga,In)N for UV Optoelectronics (title change from A)

Han, J.; Figiel, J.J.; Peterscn, G.A.; Myers, S.M.; Crawford, Mary H.; Banas, Michael A.; Hearne, Sean J.

We report the growth and characterization of quaternary AlGaInN. A combination of photoluminescence (PL), high-resolution x-ray diffraction (XRD), and Rutherford backscattering spectrometry (RBS) characterizations enables us to explore the contours of constant PL peak energy and lattice parameter as functions of the quaternary compositions. The observation of room temperature PL emission at 351nm (with 20% Al and 5% In) renders initial evidence that the quaternary could be used to provide confinement for GaInN (and possibly GaN). AlGaInN/GrdnN MQW heterostructures have been grown; both XRD and PL measurements suggest the possibility of incorporating this quaternary into optoelectronic devices.

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6 Results
6 Results