Publications

Abstract not provided.

Procedures to predict the reliability of electrical circuits are discussed. Three cases are introduced and discussed. In Case 1, an analyst predicts the probability of any failure in the intended relations between circuit inputs and circuit outputs. In Case 2, an analyst predicts the probability that specified unintended outputs would occur. In Case 3, an analyst considers coupling between circuits. Logic models are given for the three cases, and sources of failure probabilities of components are mentioned. Methods of analysis are given, software tools are mentioned, and recommendations for presentation and review of results are discussed.

Abstract not provided.

Abuse tests were conducted on the lead-acid batteries used to power electrical testers used at the Department of Energy's Pantex Plant. Batteries were subjected to short circuits, crushes, penetrations, and drops. None of the observed responses would be a threat to nuclear explosive safety in a bay or cell at Pantex. Temperatures, currents, and damage were measured and recorded during the tests.