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Harvey-Thompson, Adam J. ; Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Crabtree, Jerry A. ; Ampleford, David A. ; Awe, Thomas J. ; Beckwith, Kristian B. ; Fein, Jeffrey R. ; Gomez, Matthew R. ; Hanson, Joseph C. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Maurer, A. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Robert J. ; Speas, Christopher S. ; York, Adam Y. ; Porter, John L. ; Paguio, Reny P.; Smith, Gary S.
Galloway, B.R. ; Slutz, Stephen A. ; Kimmel, Mark W. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Weis, Matthew R. ; Jennings, Christopher A. ; Field, Ella S. ; Kletecka, Damon E. ; Looker, Quinn M. ; Colombo, Anthony P. ; Edens, Aaron E. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Speas, Robert J. ; Spann, Andrew S.; Sin, Justin S.; Gautier, Sophie G.; Sauget, Vincent S.; Treadwell, Paul T.; Rochau, G.A. ; Porter, John L.
Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Crabtree, Jerry A. ; Weis, Matthew R. ; Gomez, Matthew R. ; Fein, Jeffrey R. ; Ampleford, David A. ; Awe, Thomas J. ; Chandler, Gordon A. ; Galloway, B.R. ; Hansen, Stephanie B. ; Hanson, Jeffrey J. ; Harding, Eric H. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lamppa, Derek C. ; Lewis, William L. ; Mangan, Michael M. ; Maurer, A. ; Perea, L. ; Peterson, Kara J. ; Porter, John L. ; Rambo, Patrick K. ; Robertson, Grafton K. ; Rochau, G.A. ; Ruiz, Daniel E. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Yager-Elorriaga, David A. ; York, Adam Y. ; Paguio, R.R.; Smith, G.E.
Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Weis, Matthew R. ; Jennings, Christopher A. ; Gomez, Matthew R. ; Fein, Jeffrey R. ; Ampleford, David A. ; Bliss, David E. ; Chandler, Gordon A. ; Glinsky, Michael E. ; Hahn, Kelly D.; Hansen, Stephanie B. ; Hanson, Joseph C. ; Harding, Eric H. ; Knapp, Patrick K. ; Mangan, Michael M. ; Perea, L. ; Peterson, Kyle J. ; Porter, John L. ; Rambo, Patrick K. ; Robertson, Grafton K. ; Rochau, G.A. ; Ruiz, Carlos L.; Schwarz, Jens S. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Whittemore, K. ; Paguio, Reny P.; Smith, Gary L. ; York, Adam Y.
Gomez, Matthew R. ; Fein, Jeffrey R. ; Hansen, Stephanie B. ; Harvey-Thompson, Adam J. ; Dunham, Gregory S. ; Knapp, Patrick K. ; Slutz, Stephen A. ; Weis, Matthew R. ; Jennings, Christopher A. ; Robertson, Grafton K. ; Speas, Christopher S. ; Maurer, A. ; Ampleford, David A. ; Rochau, G.A. ; Doron, R.D.; O. Nedostup, E.O.; Stambulchik, Stambulchik; Zarnitsky, Y.Z.; Maron, Y.M.; Paguio, Reny P.; Tomlinson, Kurt T.; Huang, H.H.; Smith, Gary S.; Taylor, Randy
T.
Review of Scientific Instruments
Ao, Tommy A. ; Schollmeier, Marius ; Kalita, Patricia K. ; Gard, Paul D. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Seagle, Christopher T.
Sandia’s Z Pulsed Power Facility is able to dynamically compress matter to extreme states with exceptional uniformity, duration, and size, which are ideal for investigating fundamental material properties of high energy density conditions. X-ray diffraction (XRD) is a key atomic scale probe since it provides direct observation of the compression and strain of the crystal lattice and is used to detect, identify, and quantify phase transitions. Because of the destructive nature of Z-Dynamic Material Property (DMP) experiments and low signal vs background emission levels of XRD, it is very challenging to detect a diffraction signal close to the Z-DMP load and to recover the data. We have developed a new Spherical Crystal Diffraction Imager (SCDI) diagnostic to relay and image the diffracted x-ray pattern away from the load debris field. The SCDI diagnostic utilizes the Z-Beamlet laser to generate 6.2-keV Mn–Heα x rays to probe a shock-compressed material on the Z-DMP load. Finally, a spherically bent crystal composed of highly oriented pyrolytic graphite is used to collect and focus the diffracted x rays into a 1-in. thick tungsten housing, where an image plate is used to record the data.
Edens, Aaron E. ; Kimmel, Mark W. ; Looker, Quinn M. ; Colombo, Anthony P. ; Kellogg, Jeffrey W. ; Speas, Christopher S. ; Stahoviak, John W.; Rambo, Patrick K. ; Smith, Ian C. ; Jones, Michael J. ; Porter, John L.
Ao, Tommy A. ; Schollmeier, Marius ; Kalita, Patricia K. ; Gard, Paul D. ; Williams, James R. ; Blada, Caroline B. ; Hanshaw, Heath L. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Seagle, Christopher T.
Sandia's Z Pulsed Power Facility is able to dynamically compress matter to extreme states with exceptional uniformity, duration, and size, which are ideal for investigations of fundamental material properties of high energy density conditions. X-ray diffraction (XRD) is a key atomic scale probe since it provides direct observation of the compression and strain of the crystal lattice, and is used to detect, identify, and quantify phase transitions. Because of the destructive nature of Z-Dynamic Materials Properties (DMP) experiments and low signal vs background emission levels of XRD, it is very challenging to detect the XRD pattern close to the Z-DMP load and to recover the data. We developed a new Spherical Crystal Diffraction Imager (SCDI) diagnostic to relay and image the diffracted x-ray pattern away from the load debris field. The SCDI diagnostic utilizes the Z-Beamlet laser to generate 6.2-keV Mn-He c , x-rays to probe a shock-compressed sample on the Z-DMP load. A spherically bent crystal composed of highly oriented pyrolytic graphite is used to collect and focus the diffracted x-rays into a 1-inch thick tungsten housing, where an image plate is used to record the data. We performed experiments to implement the SCDI diagnostic on Z to measure the XRD pattern of shock compressed beryllium samples at pressures of 1.8-2.2 Mbar.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Weis, Matthew R. ; Ampleford, David A. ; Bliss, David E. ; Fein, Jeffrey R. ; Galloway, B.R. ; Glinsky, Michael E. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Robert J. ; Speas, Christopher S. ; Porter, John L.
Rambo, Patrick K. ; Galloway, B.R. ; Schwarz, Jens S. ; Geissel, Matthias G. ; Schollmeier, Marius ; Kimmel, Mark W. ; Field, Ella S. ; Kletecka, Damon E. ; Speas, Christopher S. ; Shores, Jonathon S. ; Johnson, Drew J. ; Georgeson, Jeffrey K. ; Smith, Ian C. ; Porter, John L.
Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Jennings, Christopher A. ; Weis, Matthew R. ; Ampleford, David A. ; Bliss, David E. ; Chandler, Gordon A. ; Fein, Jeffrey R. ; Galloway, B.R. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Hahn, K.D.; Hansen, Stephanie B. ; Harding, Eric H. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Perea, L. ; Peterson, Kara J. ; Porter, John L. ; Rambo, Patrick K. ; Robertson, Grafton K. ; Rochau, G.A. ; Ruiz, Daniel E. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Whittemore, K. ; Woodbury, Daniel W.; Smith, G.E.
Harvey-Thompson, Adam J. ; Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Geissel, Matthias G. ; Jennings, Christopher A. ; Jennings, Christopher A. ; Weis, Matthew R. ; Weis, Matthew R. ; Ampleford, David A. ; Ampleford, David A. ; Bliss, David E. ; Bliss, David E. ; Chandler, Gordon A. ; Chandler, Gordon A. ; Fein, Jeffrey R. ; Fein, Jeffrey R. ; Galloway, B.R. ; Galloway, B.R. ; Glinsky, Michael E. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Gomez, Matthew R. ; Hahn, K.D.; Hahn, K.D.; Hansen, Stephanie B. ; Hansen, Stephanie B. ; Harding, Eric H. ; Harding, Eric H. ; Kimmel, Mark W. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Knapp, Patrick K. ; Perea, L. ; Perea, L. ; Peterson, Kara J. ; Peterson, Kara J. ; Porter, John L. ; Porter, John L. ; Rambo, Patrick K. ; Rambo, Patrick K. ; Robertson, Grafton K. ; Robertson, Grafton K. ; Rochau, G.A. ; Rochau, G.A. ; Ruiz, Daniel E. ; Ruiz, Daniel E. ; Schwarz, Jens S. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Slutz, Stephen A. ; Smith, Ian C. ; Smith, Ian C. ; Speas, Christopher S. ; Speas, Christopher S. ; Whittemore, K. ; Whittemore, K. ; Woodbury, Daniel W.; Woodbury, Daniel W.; Smith, G.E.; Smith, G.E.
Galloway, B.R. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Field, Ella S. ; Kletecka, Damon E. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Kimmel, Mark W. ; Schollmeier, Marius ; Armstrong, Darrell J. ; Geissel, Matthias G. ; Porter, John L.
Ao, Tommy A. ; Schollmeier, Marius ; Kalita, Patricia K. ; Gard, Paul D. ; Williams, James R. ; Blada, Caroline B. ; Hanshaw, Heath L. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Seagle, Christopher T.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Weis, Matthew R. ; Bliss, David E. ; Fein, Jeffrey R. ; Galloway, B.R. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Peterson, Kyle J. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Porter, John L.
Rambo, Patrick K. ; Galloway, B.R. ; Schwarz, Jens S. ; Geissel, Matthias G. ; Schollmeier, Marius ; Kimmel, Mark W. ; Field, Ella S. ; Kletecka, Damon E. ; Speas, Christopher S. ; Shores, Jonathon S. ; Johnson, Drew J. ; Georgeson, Jeffrey K. ; Smith, Ian C. ; Porter, John L.
Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Weis, Matthew R. ; Jennings, Christopher A. ; Glinsky, Michael E. ; Peterson, Kyle J. ; Awe, Thomas J. ; Bliss, David E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; Porter, John L. ; Rambo, Patrick K. ; Rochau, G.A. ; Schollmeier, Marius ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S.
Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Weis, Matthew R. ; Jennings, Christopher A. ; Glinsky, Michael E. ; Peterson, Kyle J. ; Awe, Thomas J. ; Bliss, David E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; Schollmeier, Marius ; Schwarz, Jens S. ; Sefkow, Adam B. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S. ; Wei, M.S.; Vesey, Roger A. ; Porter, John L.
Harvey-Thompson, Adam J. ; Geissel, Matthias G. ; Weis, Matthew R. ; Peterson, Kyle J. ; Glinsky, Michael E. ; Awe, Thomas J. ; Bliss, David E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; Porter, John L. ; Rochau, G.A. ; Schollmeier, Marius ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Weis, Matthew R. ; Bliss, David E. ; Fein, Jeffrey R. ; Galloway, B.R. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Peterson, Kyle J. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Porter, John L.
Weis, Matthew R. ; Geissel, Matthias G. ; Glinsky, Michael E. ; Harvey-Thompson, Adam J. ; Jennings, Christopher A. ; Peterson, Kyle J. ; Kimmel, Mark W. ; Porter, John L. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S. ; Marinak, Marty M.
Ao, Tommy A. ; Schollmeier, Marius ; Kalita, Patricia K. ; Gard, Paul D. ; Williams, James R. ; Field, Ella S. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Looker, Quinn M. ; Kimmel, Mark W. ; Molina, Leo M. ; Seagle, Christopher T. ; Porter, John L. ; Benage, John F. ; Morgan, Dane D.
Schwarz, Jens S. ; Schollmeier, Marius ; Geissel, Matthias G. ; Smith, Ian C. ; Speas, Christopher S. ; Shores, Jonathon S. ; Galloway, B.R. ; Field, Ella S. ; Kletecka, Damon E. ; Porter, John L.
Geissel, Matthias G. ; Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Fein, Jeffrey R. ; Woodbury, Daniel W. ; Davis, Daniel R. ; Bliss, David E. ; Scoglietti, Daniel S. ; Gomez, Matthew R. ; Ampleford, David A. ; Awe, Thomas J. ; Colombo, Anthony P. ; Weis, Matthew R. ; Jennings, Christopher A. ; Glinsky, Michael E. ; Slutz, Stephen A. ; Ruiz, Daniel E. ; Peterson, Kyle J. ; Smith, Ian C. ; Shores, Jonathon S. ; Kimmel, Mark W. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Galloway, B.R. ; Speas, Christopher S. ; Porter, John L.
Schollmeier, Marius ; Ao, Tommy A. ; Field, Ella S. ; Galloway, B.R. ; Kalita, Patricia K. ; Kimmel, Mark W. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Benage, John F. ; Porter, John L. ; Morgan, Dane D.
Harding, Eric H. ; Schollmeier, Marius ; Gomez, Matthew R. ; Knapp, Patrick K. ; Hansen, Stephanie B. ; Robertson, Grafton K. ; Speas, Christopher S. ; Rochau, G.A.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Ampleford, David A. ; Bliss, David E. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; Peterson, Kyle J. ; Rambo, Patrick K. ; Rochau, G.A. ; Schollmeier, Marius ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Weis, Matthew R. ; Porter, John L.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Bliss, David E. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; Peterson, Kyle J. ; Schollmeier, Marius ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Weis, Matthew R. ; Porter, John L.
Schwarz, Jens S. ; Rambo, Patrick K. ; Smith, Ian C. ; Shores, Jonathon S. ; Geissel, Matthias G. ; Jennings, Christopher A. ; Schollmeier, Marius ; Speas, Christopher S. ; Kellogg, Jeffrey W. ; Porter, John L.
Schwarz, Jens S. ; Rambo, Patrick K. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Kimmel, Mark W. ; Armstrong, Darrell J. ; Geissel, Matthias G. ; Schollmeier, Marius ; Field, Ella S. ; Kletecka, Damon E. ; Porter, John L.
Bliss, David E. ; Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Harding, Eric H. ; Knapp, Patrick K. ; Peterson, Kyle J. ; Scoglietti, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Strozzi, David S.; Weis, Matthew R.
Struve, Kenneth W. ; Speas, Christopher S. ; Wisher, Matthew L. ; Riley, Nathan R.; Bengtson, Roger D.; Porter, John L.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Bliss, David E. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Peterson, Kyle J. ; Schollmeier, Marius ; Schwarz, Jens S. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Weis, Matthew R. ; Porter, John L.
Peterson, Kyle J. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Bliss, David E. ; Geissel, Matthias G. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; Schollmeier, Marius ; Schwarz, Jens S. ; Sefkow, Adam B. ; Shores, Jonathon S. ; Slutz, Stephen A. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Weis, Matthew R. ; Porter, John L.
Schwarz, Jens S. ; Rambo, Patrick K. ; Schollmeier, Marius ; Geissel, Matthias G. ; Smith, Ian C. ; Kimmel, Mark W. ; Speas, Christopher S. ; Shores, Jonathon S. ; Bellum, John C. ; Field, Ella S. ; Kletecka, Damon E. ; Porter, John L.
Geissel, Matthias G. ; Awe, Thomas J. ; Bliss, David E. ; Campbell, Edward M. ; Gomez, Matthew R. ; Glinsky, Michael E. ; Harding, Eric H. ; Harvey-Thompson, Adam J. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M.; Peterson, Kyle J. ; Schollmeier, Marius ; Schwarz, Jens S. ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Porter, John L. ; Rochau, G.A.
Schollmeier, Marius ; Knapp, Patrick K. ; Ampleford, David A. ; Loisel, Guillaume P. ; Robertson, Grafton K. ; Shores, Jonathon S. ; Speas, Christopher S. ; Smith, Ian C. ; Porter, John L. ; McBride, Ryan D.
Rambo, Patrick K. ; Schwarz, Jens S. ; Geissel, Matthias G. ; Kellogg, Jeffrey W. ; Smith, Ian C. ; Kimmel, Mark W. ; Speas, Christopher S. ; Shores, Jonathon S. ; Bellum, John C. ; Field, Ella S. ; Kletecka, Damon E. ; Porter, John L.
Schollmeier, Marius ; Knapp, Patrick K. ; Ampleford, David A. ; Loisel, Guillaume P. ; Harding, Eric H. ; Robertson, Grafton K. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Porter, John L. ; McBride, Ryan D.
Rambo, Patrick K. ; Schwarz, Jens S. ; Schollmeier, Marius ; Geissel, Matthias G. ; Smith, Ian C. ; Kimmel, Mark W. ; Speas, Christopher S. ; Shores, Jonathon S. ; Bellum, John C. ; Field, Ella S. ; Kletecka, Damon E. ; Porter, John L.
Geissel, Matthias G. ; Awe, Thomas J. ; Bliss, David E. ; Campbell, Edward M. ; Glinsky, Michael E. ; Gomez, Matthew R. ; Harding, Eric H. ; Harvey-Thompson, Adam J. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Peterson, Kyle J. ; Jennings, Christopher A. ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Weis, Matthew R. ; Porter, John L.
Rambo, Patrick K. ; Schwarz, Jens S. ; Schollmeier, Marius ; Geissel, Matthias G. ; Smith, Ian C. ; Kimmel, Mark W. ; Speas, Christopher S. ; Shores, Jonathon S. ; Bellum, John C. ; Field, Ella S. ; Kletecka, Damon E. ; Porter, John L.
Geissel, Matthias G. ; Awe, Thomas J. ; Campbell, E.M.C.; Gomez, Matthew R. ; Harding, Eric H. ; Harvey-Thompson, Adam J. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; McBride, Ryan D. ; Peterson, Kyle J. ; Schollmeier, Marius ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Porter, John L.
Lewis, Sean M. ; Geissel, Matthias G. ; Kellogg, Jeffrey W. ; Kimmel, Mark W. ; Long, Joel L. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Riley, Nathan R. ; Bengtson, Roger D.; Ditmire, Todd D.; Stahoviak, John W.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Campbell, Edward M. ; Gomez, Matthew R. ; Harding, Eric H. ; Hansen, Stephanie B. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; McBride, Ryan D. ; Peterson, Kyle J. ; Schollmeier, Marius ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Porter, John L.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Campbell, Michael E.; Gomez, Matthew R. ; Harding, Eric H. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M.; McBride, Ryan D. ; Peterson, Kyle J. ; Schollmeier, Marius ; Schmit, Paul S. ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Vesey, Roger A. ; Porter, John L.
Schollmeier, Marius ; Loisel, Guillaume P. ; Geissel, Matthias G. ; Harding, Eric H. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Porter, John L. ; vargas, mark v.
Geissel, Matthias G. ; Harvey-Thompson, Adam J. ; Awe, Thomas J. ; Campbell, Edward M. ; Gomez, Matthew R. ; Harding, Eric H. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Knapp, Patrick K. ; Lewis, Sean M. ; McBride, Ryan D. ; Peterson, Kyle J. ; Schollmeier, Marius ; Schmit, Paul S. ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Stahoviak, J.W.S.; Vesey, Roger A. ; Porter, John L.
Kimmel, Mark W. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Smith, Ian C. ; Geissel, Matthias G. ; Schollmeier, Marius ; Lewis, Sean M. ; Looker, Quinn M. ; Shores, Jonathon S. ; Speas, Christopher S. ; Ruggles, Larry R. ; Porter, John L.
Geissel, Matthias G. ; Awe, Thomas J. ; Campbell, Edward M. ; Gomez, Matthew R. ; Harding, Eric H. ; Harvey-Thompson, Adam J. ; Jennings, Christopher A. ; Kimmel, Mark W. ; Lewis, Sean M. ; McBride, Ryan D. ; Peterson, Kyle J. ; Schollmeier, Marius ; Sefkow, Adam B. ; Shores, Jonathon S. ; Sinars, Daniel S. ; Slutz, Stephen A. ; Smith, Ian C. ; Speas, Christopher S. ; Stahoviak, John W. ; Porter, John L.
Rambo, Patrick K. ; Armstrong, Darrell J. ; Schwarz, Jens S. ; Smith, Ian C. ; Shores, Jonathon S. ; Speas, Christopher S. ; Porter, John L.
The Z-Beamlet laser has been operating at Sandia National Laboratories since 2001 to provide a source of laser-generated x-rays for radiography of events on the Z-Accelerator. Changes in desired operational scope have necessitated the increase in pulse duration and energy available from the laser system. This is enabled via the addition of a phase modulated seed laser as an alternative front-end. The practical aspects of deployment are discussed here.
Schollmeier, Marius ; Harding, Eric H. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Stahoviak, John W. ; Porter, John L.
Geissel, Matthias G. ; Schollmeier, Marius ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S.
Schollmeier, Marius ; Speas, Christopher S. ; Atherton, B.W. ; Rambo, Patrick K. ; Schwarz, Jens S. ; Kimmel, Mark W. ; Smith, Ian C. ; Shores, Jonathon S. ; Webb, Timothy J.
Geissel, Matthias G. ; Atherton, B.W. ; Pitts, Todd A. ; Schollmeier, Marius ; Headley, Daniel I. ; Kimmel, Mark W. ; Rambo, Patrick K. ; Robertson, Grafton K. ; Sefkow, Adam B. ; Schwarz, Jens S. ; Speas, Christopher S.
To extend the backlighting capabilities for Sandia's Z-Accelerator, Z-Petawatt, a laser which can provide laser pulses of 500 fs length and up to 120 J (100TW target area) or up to 450 J (Z/Petawatt target area) has been built over the last years. The main mission of this facility focuses on the generation of high energy X-rays, such as tin K{alpha} at 25 keV in ultra-short bursts. Achieving 25 keV radiographs with decent resolution and contrast required addressing multiple problems such as blocking of hot electrons, minimization of the source, development of suitable filters, and optimization of laser intensity. Due to the violent environment inside of Z, an additional very challenging task is finding massive debris and radiation protection measures without losing the functionality of the backlighting system. We will present the first experiments on 25 keV backlighting including an analysis of image quality and X-ray efficiency.
Geissel, Matthias G. ; Schwarz, Jens S. ; Speas, Christopher S. ; Atherton, B.W. ; Schollmeier, Marius ; Cox, Carlos M. ; Headley, Daniel I. ; Kimmel, Mark W. ; Pitts, Todd A. ; Rambo, Patrick K. ; Robertson, Grafton K. ; Sefkow, Adam B.
Bennett, Guy R. ; Jones, Michael J. ; Kellogg, Jeffrey W. ; Mills, Jerry A. ; Mulville, Thomas D. ; Rambo, Patrick K. ; Ruggles, Larry R. ; Adams, Richard G. ; Schwarz, Jens S. ; Sinars, Daniel S. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Vargas, Mark F. ; Wenger, D.F. ; Atherton, B.W. ; Edens, Aaron E. ; Georgeson, Jeffrey K.
Physical Review ST Accelerators and Beams
Stygar, William A. ; Rosenthal, Stephen E. ; Donovan, Guy L. ; Mills, Jerry A. ; Speas, Christopher S. ; Struve, Kenneth W.
Proposed for publication in Physical Review Special Topics - Accelerators and Beams.
Stygar, William A. ; Savage, Mark E. ; Speas, Christopher S. ; Struve, Kenneth W. ; Donovan, Guy L. ; Lee, James R. ; Leeper, Ramon J. ; Leifeste, Gordon T. ; Mills, Jerry A. ; Rochau, G.A. ; Rochau, Gary E.
We have developed a system of differential-output monitors that diagnose current and voltage in the vacuum section of a 20-MA 3-MV pulsed-power accelerator. The system includes 62 gauges: 3 current and 6 voltage monitors that are fielded on each of the accelerator's 4 vacuum-insulator stacks, 6 current monitors on each of the accelerator's 4 outer magnetically insulated transmission lines (MITLs), and 2 current monitors on the accelerator's inner MITL. The inner-MITL monitors are located 6 cm from the axis of the load. Each of the stack and outer-MITL current monitors comprises two separate B-dot sensors, each of which consists of four 3-mm-diameter wire loops wound in series. The two sensors are separately located within adjacent cavities machined out of a single piece of copper. The high electrical conductivity of copper minimizes penetration of magnetic flux into the cavity walls, which minimizes changes in the sensitivity of the sensors on the 100-ns time scale of the accelerator's power pulse. A model of flux penetration has been developed and is used to correct (to first order) the B-dot signals for the penetration that does occur. The two sensors are designed to produce signals with opposite polarities; hence, each current monitor may be regarded as a single detector with differential outputs. Common-mode-noise rejection is achieved by combining these signals in a 50-{Omega} balun. The signal cables that connect the B-dot monitors to the balun are chosen to provide reasonable bandwidth and acceptable levels of Compton drive in the bremsstrahlung field of the accelerator. A single 50-{omega} cable transmits the output signal of each balun to a double-wall screen room, where the signals are attenuated, digitized (0.5-ns/sample), numerically compensated for cable losses, and numerically integrated. By contrast, each inner-MITL current monitor contains only a single B-dot sensor. These monitors are fielded in opposite-polarity pairs. The two signals from a pair are not combined in a balun; they are instead numerically processed for common-mode-noise rejection after digitization. All the current monitors are calibrated on a 76-cm-diameter axisymmetric radial transmission line that is driven by a 10-kA current pulse. The reference current is measured by a current-viewing resistor (CVR). The stack voltage monitors are also differential-output gauges, consisting of one 1.8-cm-diameter D-dot sensor and one null sensor. Hence, each voltage monitor is also a differential detector with two output signals, processed as described above. The voltage monitors are calibrated in situ at 1.5 MV on dedicated accelerator shots with a short-circuit load. Faraday's law of induction is used to generate the reference voltage: currents are obtained from calibrated outer-MITL B-dot monitors, and inductances from the system geometry. In this way, both current and voltage measurements are traceable to a single CVR. Dependable and consistent measurements are thus obtained with this system of calibrated diagnostics. On accelerator shots that deliver 22 MA to a low-impedance z-pinch load, the peak lineal current densities at the stack, outer-MITL, and inner-MITL monitor locations are 0.5, 1, and 58 MA/m, respectively. On such shots the peak currents measured at these three locations agree to within 1%.
Bennett, Guy R. ; Geissel, Matthias G. ; Georgeson, Jeffrey K. ; Johnson, Drew J. ; Kellogg, Jeffrey W. ; Kimmel, Mark W. ; Rambo, Patrick K. ; Ramirez, Bernadette G.C. ; Shores, Jonathon S. ; Smith, Ian C. ; Speas, Christopher S. ; Schwarz, Jens S. ; Adams, Richard G. ; Atherton, B.W. ; Edens, Aaron E.
Atherton, B.W. ; Gonzales, Rita A. ; Gurrieri, Thomas G. ; Herrmann, Mark H. ; Mulville, Thomas D. ; Neely, Kelly A. ; Rambo, Patrick K. ; Rovang, Dean C. ; Ruggles, Larry R. ; Smith, Ian C. ; Schwarz, Jens S. ; Simpson, Walter W. ; Sinars, Daniel S. ; Speas, Christopher S. ; Tafoya-Porras, Belinda T. ; Wenger, D.F. ; Young, Ralph W. ; Adams, Richard G. ; Bennett, Guy R. ; Campbell, David V. ; Carroll, Malcolm ; Claus, Liam D. ; Edens, Aaron E. ; Geissel, Matthias G.
Gonzales, Rita A. ; Gurrieri, Thomas G. ; Herrmann, Mark H. ; Mulville, Thomas D. ; Neely, Kelly A. ; Rambo, Patrick K. ; Rovang, Dean C. ; Ruggles, Larry R. ; Schwarz, Jens S. ; Adams, Richard G. ; Simpson, Walter W. ; Sinars, Daniel S. ; Smith, Ian C. ; Speas, Christopher S. ; Tafoya-Porras, Belinda T. ; Wenger, D.F. ; Young, Ralph W. ; Edens, Aaron E. ; Atherton, B.W. ; Bennett, Guy R. ; Campbell, David V. ; Carroll, Malcolm ; Claus, Liam D. ; Geissel, Matthias G.
Bennett, Guy R. ; Campbell, David V. ; Claus, Liam D. ; Foresi, James S. ; Johnson, Drew J. ; Jones, Michael J. ; Keller, Keith L. ; Leifeste, Gordon T. ; McPherson, Leroy A. ; Mulville, Thomas D. ; Neely, Kelly A. ; Sinars, Daniel S. ; Herrmann, Mark H. ; Rambo, Patrick K. ; Rovang, Dean C. ; Ruggles, Larry R. ; Simpson, Walter W. ; Speas, Christopher S. ; Wenger, D.F. ; Smith, Ian C. ; Cuneo, M.E. ; Adams, Richard G. ; Atherton, B.W. ; Barnard, Wilson J. ; Beutler, David E. ; Burr, Robert A.
Proposed for publication in Physics of Plasmas.
Vesey, Roger A. ; Yu, Edmund Y. ; Nash, Thomas J. ; Bliss, David E. ; Bennett, Guy R. ; Sinars, Daniel S. ; Simpson, Walter W. ; Ruggles, Larry R. ; Wenger, D.F. ; Garasi, Christopher J. ; Aragon, Rafael A. ; Fowler, William E. ; Johnson, Drew J. ; Keller, Keith L. ; McGurn, John S. ; Mehlhorn, Thomas A. ; Speas, Christopher S. ; Struve, Kenneth W. ; Stygar, William A. ; Chandler, Gordon A.
Leeper, Ramon J. ; Deeney, Christopher D. ; Dunham, Gregory S. ; Fehl, David L. ; Franklin, James K. ; Hawn, Rona E. ; Hall, Clint A. ; Hurst, Michael J. ; Jinzo, Tanya D. ; Jobe, Daniel O. ; Leeper, Ramon J. ; Joseph, Nathan R. ; Knudson, Marcus D. ; Lake, Patrick W. ; Lazier, Steven E. ; Lucas, J. ; McGurn, John S. ; Manicke, Matthew P. ; Mock, Raymond M. ; Moore, T.C. ; Nash, Thomas J. ; Bailey, James E. ; Nelson, Alan J. ; Nielsen, D.S. ; Olson, Richard E. ; Pyle, John H. ; Rochau, G.A. ; Ruggles, Larry R. ; Ruiz, Carlos L. ; Sanford, Thomas W. ; Seamen, Johann F. ; Bennett, Guy R. ; Simpson, Walter W. ; Sinars, Daniel S. ; Speas, Christopher S. ; Stygar, William A. ; Wenger, D.F. ; Seamen, Johann J. ; Carlson, Alan L. ; Chandler, Gordon A. ; Cooper, Gary W. ; Cuneo, M.E.
Proposed for publication in Physical Review E.
Stygar, William A. ; Matzen, M.K. ; Mazarakis, Michael G. ; McDaniel, Dillon H. ; McGurn, John S. ; Mckenney, John M. ; Mix, L.P. ; Muron, David J. ; Ramirez, Juan J. ; Ruggles, Larry R. ; Stygar, William A. ; Seamen, Johann F. ; Simpson, Walter W. ; Speas, Christopher S. ; Spielman, Rick B. ; Struve, Kenneth W. ; Vesey, Roger A. ; Wagoner, Tim C. ; Gilliland, Terrance L. ; Bennett, Guy R. ; Ives, Harry C. ; Jobe, Daniel O. ; Lazier, Steven E. ; Mills, Jerry A. ; Mulville, Thomas D. ; Pyle, John H. ; Romero, Tobias M. ; Seamen, Johann F. ; Serrano, Jason D. ; Smelser, Ruth S. ; Fehl, David L. ; Cuneo, M.E. ; Bailey, James E. ; Bliss, David E. ; Chandler, Gordon A. ; Leeper, Ramon J.
Physics of Plasmas
Ruggles, Larry R. ; Simpson, Walter W. ; Smith, Ian C. ; Speas, Christopher S. ; Struve, Kenneth W. ; Wenger, D.F. ; Bennett, Guy R. ; Vesey, Roger A. ; Cuneo, M.E. ; Adams, Richard G. ; Aragon, Rafael A. ; Rambo, Patrick K. ; Rovang, Dean C.
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