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Germanium Telluride Chalcogenide Switches for RF Applications

Hummel, Gwendolyn H.; Patrizi, G.A.; Young, Andrew I.; Schroeder, Katlin S.; Ruyack, Alexander R.; Schiess, Adrian R.; Finnegan, Patrick S.; Adams, David P.; Nordquist, Christopher N.

This project developed prototype germanium telluride switches, which can be used in RF applications to improve SWAP (size, weight, and power) and signal quality in RF systems. These switches can allow for highly reconfigurable systems, including antennas, communications, optical systems, phased arrays, and synthetic aperture radar, which all have high impact on current National Security goals for improved communication systems and communication technology supremacy. The final result of the project was the demonstration of germanium telluride RF switches, which could act as critical elements necessary for a single chip RF communication system that will demonstrate low SWAP and high reconfigurability

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AlGaN High Electron Mobility Transistor for Power Switches and High Temperature Logic

Klein, Brianna A.; Armstrong, Andrew A.; Allerman, A.A.; Nordquist, Christopher N.; Neely, Jason C.; Reza, Shahed R.; Douglas, Erica A.; Van Heukelom, Michael V.; Rice, Anthony R.; Patel, Victor J.; Matins, Benjamin M.; Fortune, Torben R.; Rosprim, Mary R.; Caravello, Lisa N.; DeBerry, Rebecca N.; Pipkin, Jennifer R.; Abate, Vincent M.; Kaplar, Robert K.

Abstract not provided.

On-Wafer Microfabricated Test Structures for Characterizing RF Breakdown in Narrow Gaps

Proceedings of the 2021 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems: Making Waves in Texas, WMCS 2021

Ruyack, Alexander R.; Jordan, Matthew J.; Moore, Christopher M.; Hummel, Gwendolyn H.; Herrera, Sergio A.; Ballance, Mark H.; Bingham, Andrew J.; Schiess, Adrian R.; Gibson, Christopher B.; Nordquist, Christopher N.

Plasmas formed in microscale gaps at DC and plasmas formed at radiofrequency (RF) both deviate in behavior compared to the classical Paschen curve, requiring lower voltage to achieve breakdown due to unique processes and dynamics, such as field emission and controlled rates of electron/ion interactions. Both regimes have been investigated independently, using high precision electrode positioning systems for microscale gaps or large, bulky emitters for RF. However, no comprehensive study of the synergistic phenomenon between the two exists. The behavior in such a combined system has the potential to reach sub-10 V breakdown, which combined with the unique electrical properties of microscale plasmas could enable a new class of RF switches, limiters and tuners.This work describes the design and fabrication of novel on-wafer microplasma devices with gaps as small as 100 nm to be operated at GHz frequencies. We used a dual-sacrificial layer process to create devices with microplasma gaps integrated into RF compatible 50 Ω coplanar waveguide transmission lines, which will allow this coupled behaviour to be studied for the first time. These devices are modelled using conventional RF simulations as well as the Sandia code, EMPIRE, which is capable of modelling the breakdown and formation of plasma in microscale gaps driven by high frequencies. Synchronous evaluation of the modelled electrical and breakdown behaviour is used to define device structures, predict behaviour and corroborate results. We further report preliminary independent testing of the microscale gap and RF behaviour. DC testing shows modified-Paschen curve behaviour for plasma gaps at and below four microns, demonstrating decreased breakdown voltage with reduced gap size. Additionally, preliminary S-parameter measurements of as-prepared and connectorized devices have elucidated RF device behaviour. Together, these results provide baseline data that enables future experiments as well as discussion of projected performance and applications for these unique devices.

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Heterogeneous Integration of Silicon Electronics and Compound Semiconductor Optoelectronics for Miniature RF Photonic Transceivers

Nordquist, Christopher N.; Skogen, Erik J.; Fortuna, S.A.; Hollowell, Andrew E.; Hemmady, Caroline S.; Saugen, J.M.; Forbes, T.; Wood, Michael G.; Jordan, Matthew J.; McClain, Jaime L.; Lepkowski, Stefan M.; Alford, Charles A.; Peake, Gregory M.; Pomerene, Andrew P.; Long, Christopher M.; Serkland, Darwin K.; Dean, Kenneth A.

Abstract not provided.

Device-level thermal management of gallium oxide field-effect transistors

IEEE Transactions on Components, Packaging and Manufacturing Technology

Chatterjee, Bikramjit; Zeng, Ke; Nordquist, Christopher N.; Singisetti, Uttam; Choi, Sukwon

The ultrawide bandgap (UWBG) (4.8 eV) and melt-grown substrate availability of β-Ga2O3 give promise to the development of next-generation power electronic devices with dramatically improved size, weight, power, and efficiency over current state-of-the-art WBG devices based on 4H-SiC and GaN. Also, with recent advancements made in gigahertz frequency radio frequency (RF) applications, the potential for monolithic or heterogenous integration of RF and power switches has attracted researchers' attention. However, it is expected that Ga2O3 devices will suffer from self-heating due to the poor thermal conductivity of the material. Thermoreflectance thermal imaging and infrared thermography were used to understand the thermal characteristics of a MOSFET fabricated via homoepitaxy. A 3-D coupled electrothermal model was constructed based on the electrical and thermal characterization results. The device model shows that a homoepitaxial device suffers from an unacceptable junction temperature rise of 1500 °C under a targeted power density of 10 W/mm, indicating the importance of employing device-level thermal managements to individual Ga2O3 transistors. The effectiveness of various active and passive cooling solutions was tested to achieve a goal of reducing the device operating temperature below 200 °C at a power density of 10 W/mm. Results show that flip-chip heterointegration is a viable option to enhance both the steady-state and transient thermal characteristics of Ga2O3 devices without sacrificing the intrinsic advantage of high-quality native substrates. Also, it is not an active thermal management solution that entails peripherals requiring additional size and cost implications.

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Saturation Velocity Measurement of Al0.7Ga0.3N-Channel High Electron Mobility Transistors

Journal of Electronic Materials

Klein, Brianna A.; Baca, A.G.; Lepkowski, Stefan M.; Nordquist, Christopher N.; Wendt, J.R.; Allerman, A.A.; Armstrong, Andrew A.; Douglas, Erica A.; Abate, Vincent M.; Kaplar, Robert K.

Gate length dependent (80 nm–5000 mm) radio frequency measurements to extract saturation velocity are reported for Al0.85Ga0.15N/Al0.7Ga0.3N high electron mobility transistors fabricated into radio frequency devices using electron beam lithography. Direct current characterization revealed the threshold voltage shifting positively with increasing gate length, with devices changing from depletion mode to enhancement mode when the gate length was greater than or equal to 450 nm. Transconductance varied from 10 mS/mm to 25 mS/mm, with the 450 nm device having the highest values. Maximum drain current density was 268 mA/mm at 10 V gate bias. Scattering-parameter characterization revealed a maximum unity gain bandwidth (fT) of 28 GHz, achieved by the 80 nm gate length device. A saturation velocity value of 3.8 × 106 cm/s, or 35% of the maximum saturation velocity reported for GaN, was extracted from the fT measurements.

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RF Performance of Al0.85Ga0.15N/Al0.70Ga0.30N high electron mobility transistors with 80-nm Gates

IEEE Electron Device Letters

Baca, A.G.; Klein, Brianna A.; Wendt, J.R.; Lepkowski, Stefan M.; Nordquist, Christopher N.; Armstrong, Andrew A.; Allerman, A.A.; Douglas, Erica A.; Kaplar, Robert K.

Al-rich AlGaN-channel high electron mobility transistors with 80-nm long gates and 85% (70%) Al in the barrier (channel) were evaluated for RF performance. The dc characteristics include a maximum current of 160 mA/mm with a transconductance of 24 mS/mm, limited by source and drain contacts, and an on/off current ratio of 109. fT of 28.4 GHz and fMAX of 18.5 GHz were determined from small-signal S-parameter measurements. Output power density of 0.38 W/mm was realized at 3 GHz in a power sweep using on-wafer load pull techniques.

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Power Handling of Vanadium Dioxide Metal-Insulator Transition RF Limiters

2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2018

Nordquist, Christopher N.; Leonhardt, Darin L.; Custer, Joyce O.; Jordan, Tyler S.; Wolfley, Steven L.; Scott, Sean M.; Sing, Molly N.; Cich, Michael J.; Rodenbeck, Christopher T.

Maximum power handling, spike leakage, and failure mechanisms have been characterized for limiters based on the thermally triggered metal-insulator transition of vanadium dioxide. These attributes are determined by properties of the metal-insulator material such as on/off resistance ratio, geometric properties that determine the film resistance and the currentcarrying capability of the device, and thermal properties such as heatsinking and thermal coupling. A limiter with greater than 10 GHz of bandwidth demonstrated 0.5 dB loss, 27 dBm threshold power, 8 Watts blocking power, and 0.4 mJ spike leakage at frequencies near 2 GHz. A separate limiter optimized for high power blocked over 60 Watts of incident power with leakage less than 25 dBm after triggering. The power handling demonstrates promise for these limiter devices, and device optimization presents opportunities for additional improvement in spike leakage, response speed, and reliability.

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Waveform optimization for resonantly driven MEMS switches electrostatically biased near pull-in

Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)

Siddiqui, Aleem M.; Nordquist, Christopher N.; Grine, Alejandro J.; Lepkowski, Stefan M.; Henry, M.D.; Eichenfield, Matthew S.; Griffin, Benjamin G.

Biasing a MEMS switch close to static-pull in reduces the modulation amplitude necessary to achieve resonant pull-in, but results in a highly nonlinear system. In this work, we present a new methodology that captures the essential dynamics and provides a prescription for achieving the optimal drive waveform which reduces the amplitude requirements of the modulation source. These findings are validated both experimentally and through numerical modeling.

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Inductive coupling for increased bandwidth of aluminum nitride contour-mode microresonator filters

IEEE MTT-S International Microwave Symposium Digest

Nordquist, Christopher N.; Henry, M.D.; Nguyen, Janet H.; Clews, Peggy; Lepkowski, Stefan M.; Grine, Alejandro J.; Dyck, Christopher D.; Olsson, Roy H.

Inductive coupling and matching networks are used to increase the bandwidth of filters realized with aluminum nitride contour-mode resonators. Filter bandwidth has been doubled using a wirebonded combination of a wafer-level-packaged resonator chip and a high-Q integrated inductor chip. The three-pole filters have a center frequency near 500 MHz, an area of 9 mm × 9 mm, insertion loss of < 5 dB for a bandwidth of 0.4%, and a resonator unloaded Q of 1600.

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Thermal Design and Characterization of Heterogeneously Integrated InGaP/GaAs HBTs

IEEE Transactions on Components, Packaging and Manufacturing Technology

Choi, Sukwon; Peake, Gregory M.; Keeler, Gordon A.; Geib, K.M.; Briggs, R.D.; Beechem, Thomas E.; Shaffer, Ryan A.; Clevenger, Jascinda C.; Patrizi, G.A.; Klem, John F.; Tauke-Pedretti, Anna; Nordquist, Christopher N.

Flip-chip heterogeneously integrated n-p-n InGaP/GaAs heterojunction bipolar transistors (HBTs) with integrated thermal management on wide-bandgap AlN substrates followed by GaAs substrate removal are demonstrated. Without thermal management, substrate removal after integration significantly aggravates self-heating effects, causing poor $I$-$V$ characteristics due to excessive device self-heating. An electrothermal codesign scheme is demonstrated that involves simulation (design), thermal characterization, fabrication, and evaluation. Thermoreflectance thermal imaging, electrical-temperature sensitive parameter-based thermometry, and infrared thermography were utilized to assess the junction temperature rise in HBTs under diverse configurations. In order to reduce the thermal resistance of integrated devices, passive cooling schemes assisted by structural modification, i.e., positioning indium bump heat sinks between the devices and the carrier, were employed. By implementing thermal heat sinks in close proximity to the active region of flip-chip integrated HBTs, the junction-to-baseplate thermal resistance was reduced over a factor of two, as revealed by junction temperature measurements and improvement of electrical performance. The suggested heterogeneous integration method accounts for not only electrical but also thermal requirements providing insight into realization of advanced and robust III-V/Si heterogeneously integrated electronics.

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Micro-fabricated ion traps for Quantum Information Processing

Maunz, Peter L.; Hollowell, Andrew E.; Lobser, Daniel L.; Nordquist, Christopher N.; Benito, Francisco M.; Clark, Craig R.; Clark, Susan M.; Colombo, Anthony P.; Fortier, Kevin M.; Haltli, Raymond A.; Heller, Edwin J.; Resnick, Paul J.; Rembetski, John F.; Sterk, Jonathan D.; Stick, Daniel L.; Tabakov, Boyan T.; Tigges, Chris P.; Van Der Wall, Jay W.; Dagel, Amber L.; Blain, Matthew G.; Scrymgeour, David S.

Abstract not provided.

Scalable micro-fabricated ion traps for Quantum Information Processing

Maunz, Peter L.; Benito, Francisco M.; Berry, Christopher W.; Blain, Matthew G.; Haltli, Raymond A.; Clark, Craig R.; Clark, Susan M.; Heller, Edwin J.; Hollowell, Andrew E.; Mizrahi, Jonathan M.; Nordquist, Christopher N.; Resnick, Paul J.; Rembetski, John F.; Scrymgeour, David S.; Sterk, Jonathan D.; Tabakov, Boyan T.; Tigges, Chris P.; Van Der Wall, Jay W.; Dagel, Amber L.

Abstract not provided.

Radio Frequency Microelectromechanical Systems [Book Chapter Manuscript]

Nordquist, Christopher N.; Olsson, Roy H.

Radio frequency microelectromechanical system (RF MEMS) devices are microscale devices that achieve superior performance relative to other technologies by taking advantage of the accuracy, precision, materials, and miniaturization available through microfabrication. To do this, these devices use their mechanical and electrical properties to perform a specific RF electrical function such as switching, transmission, or filtering. RF MEMS has been a popular area of research since the early 1990s, and within the last several years, the technology has matured sufficiently for commercialization and use in commercial market systems.

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Technology for On-Chip Qubit Control with Microfabricated Surface Ion Traps

Highstrete, Clark H.; Sterk, Jonathan D.; Heller, Edwin J.; Maunz, Peter L.; Nordquist, Christopher N.; Stevens, James E.; Tigges, Chris P.; Blain, Matthew G.

Trapped atomic ions are a leading physical system for quantum information processing. However, scalability and operational fidelity remain limiting technical issues often associated with optical qubit control. One promising approach is to develop on-chip microwave electronic control of ion qubits based on the atomic hyperfine interaction. This project developed expertise and capabilities at Sandia toward on-chip electronic qubit control in a scalable architecture. The project developed a foundation of laboratory capabilities, including trapping the 171Yb+ hyperfine ion qubit and developing an experimental microwave coherent control capability. Additionally, the project investigated the integration of microwave device elements with surface ion traps utilizing Sandia’s state-of-the-art MEMS microfabrication processing. This effort culminated in a device design for a multi-purpose ion trap experimental platform for investigating on-chip microwave qubit control, laying the groundwork for further funded R&D to develop on-chip microwave qubit control in an architecture that is suitable to engineering development.

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Flat plate concentrators with large acceptance angle enabled by micro cells and mini lenses: performance evaluation

Cruz-Campa, Jose L.; Anderson, Benjamin J.; Gupta, Vipin P.; Tauke-Pedretti, Anna; Cederberg, Jeffrey G.; Paap, Scott M.; Sanchez, Carlos A.; Nordquist, Christopher N.; Nielson, Gregory N.; Saavedra, Michael P.; Ballance, Mark H.; Nguyen, Janet N.; Alford, Charles A.; Riley, Daniel R.; Okandan, Murat O.; Lentine, Anthony L.; Sweatt, W.C.; Jared, Bradley H.; Resnick, Paul J.; Kratochvil, Jay A.

Abstract not provided.

Novel detection methods for radiation-induced electron-hole pairs

Cich, Michael C.; Derzon, Mark S.; Martinez, Marino M.; Nordquist, Christopher N.; Vawter, Gregory A.

Most common ionizing radiation detectors typically rely on one of two general methods: collection of charge generated by the radiation, or collection of light produced by recombination of excited species. Substantial efforts have been made to improve the performance of materials used in these types of detectors, e.g. to raise the operating temperature, to improve the energy resolution, timing or tracking ability. However, regardless of the material used, all these detectors are limited in performance by statistical variation in the collection efficiency, for charge or photons. We examine three alternative schemes for detecting ionizing radiation that do not rely on traditional direct collection of the carriers or photons produced by the radiation. The first method detects refractive index changes in a resonator structure. The second looks at alternative means to sense the chemical changes caused by radiation on a scintillator-type material. The final method examines the possibilities of sensing the perturbation caused by radiation on the transmission of a RF transmission line structure. Aspects of the feasibility of each approach are examined and recommendations made for further work.

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Measuring THz QCL feedback using an integrated monolithic transceiver

Wanke, Michael W.; Nordquist, Christopher N.; Cich, Michael C.; Fuller, Charles T.; Reno, J.L.

THz quantum cascade lasers are of interest for use as solid-state local-oscillators in THz heterodyne receiver systems, especially for frequencies exceeding 2 THz and for use with non-cryogenic mixers which require mW power levels. Among other criteria, to be a good local oscillator, the laser must have a narrow linewidth and excellent frequency stability. Recent phase locking measurements of THz QCLs to high harmonics of microwave frequency reference sources as high as 2.7 THz demonstrate that the linewidth and frequency stability of QCLs can be more than adequate. Most reported THz receivers employing QCLs have used discrete source and detector components coupled via mechanically aligned free-space quasioptics. Unfortunately, retroreflections of the laser off of the detecting element can lead to deleterious feedback effects. Using a monolithically integrated transceiver with a Schottky diode monolithically integrated into a THz QCL, we have begun to explore the sensitivity of the laser performance to feedback due to retroreflections of the THz laser radiation. The transceiver allows us to monitor the beat frequency between internal Fabry-Perot modes of the QCL or between a QCL mode and external radiation incident on the transceiver. When some of the power from a free running Fabry-Perot type QCL is retroreflected with quasi-static optics we observe frequency pulling, mode splitting and chaos. Given the lack of calibrated frequency sources with sufficient stability and power to phase lock a QCL above a couple THz, attempts have been made to lock the absolute laser frequency by locking the beat frequency of a multimoded laser. We have phase locked the beat frequency between Fabry-Perot modes to an {approx}13 GHz microwave reference source with a linewidth less than 1 Hz, but did not see any improvment in stability of the absolute frequency of the laser. In this case, when some laser power is retroreflected back into the laser, the absolute frequency can be pulled significantly as a function of the external path length.

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Multi-frequency aluminum nitride micro-filters for advanced RF communications

Olsson, Roy H.; Wojciechowski, Kenneth W.; Tuck, Melanie R.; Stevens, James E.; Nordquist, Christopher N.

An AlN MEMS resonator technology has been developed, enabling massively parallel filter arrays on a single chip. Low-loss filter banks covering the 10 MHz--10-GHz frequency range have been demonstrated, as has monolithic integration with inductors and CMOS circuitry. The high level of integration enables miniature multi-bandm spectrally aware, and cognitive radios.

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Quantitative study of rectangular waveguide behavior in the THz

Wanke, Michael W.; Rowen, Adam M.; Nordquist, Christopher N.

This report describes our efforts to quantify the behavior of micro-fabricated THz rectangular waveguides on a configurable, robust semiconductor-based platform. These waveguides are an enabling technology for coupling THz radiation directly from or to lasers, mixers, detectors, antennas, and other devices. Traditional waveguides fabricated on semiconductor platforms such as dielectric guides in the infrared or co-planar waveguides in the microwave regions, suffer high absorption and radiative losses in the THz. The former leads to very short propagation lengths, while the latter will lead to unwanted radiation modes and/or crosstalk in integrated devices. This project exploited the initial developments of THz micro-machined rectangular waveguides developed under the THz Grand Challenge Program, but instead of focusing on THz transceiver integration, this project focused on exploring the propagation loss and far-field radiation patterns of the waveguides. During the 9 month duration of this project we were able to reproduce the waveguide loss per unit of length in the waveguides and started to explore how the loss depended on wavelength. We also explored the far-field beam patterns emitted by H-plane horn antennas attached to the waveguides. In the process we learned that the method of measuring the beam patterns has a significant impact on what is actually measured, and this may have an effect on most of the beam patterns of THz that have been reported to date. The beam pattern measurements improved significantly throughout the project, but more refinements of the measurement are required before a definitive determination of the beam-pattern can be made.

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THz transceiver characterization : LDRD project 139363 final report

Lee, Mark L.; Wanke, Michael W.; Nordquist, Christopher N.; Cich, Michael C.; Wendt, J.R.; Fuller, Charles T.; Reno, J.L.

LDRD Project 139363 supported experiments to quantify the performance characteristics of monolithically integrated Schottky diode + quantum cascade laser (QCL) heterodyne mixers at terahertz (THz) frequencies. These integrated mixers are the first all-semiconductor THz devices to successfully incorporate a rectifying diode directly into the optical waveguide of a QCL, obviating the conventional optical coupling between a THz local oscillator and rectifier in a heterodyne mixer system. This integrated mixer was shown to function as a true heterodyne receiver of an externally received THz signal, a breakthrough which may lead to more widespread acceptance of this new THz technology paradigm. In addition, questions about QCL mode shifting in response to temperature, bias, and external feedback, and to what extent internal frequency locking can improve stability have been answered under this project.

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Ku-band six-bit RF MEMS time delay network

2008 IEEE CSIC Symposium: GaAs ICs Celebrate 30 Years in Monterey, Technical Digest 2008

Nordquist, Christopher N.; Dyck, Christopher D.; Kraus, Garth K.; Sullivan, Charles T.; Austin IV, Franklin; Finnegan, Patrick S.; Ballance, Mark H.

A six-bit time delay circuit operating from DC to 18 GHz is reported. Capacitively loaded transmission lines are used to reduce the physical length of the delay elements and shrink the die size. Additionally, selection of the reference line lengths to avoid resonances allows the replacement of series-shunt switching elements with only series elements. With through-wafer transitions and a packaging seal ring, the 7 mm x 10 mm circuit demonstrates <2.8 dB of loss and 60 ps of delay with good delay flatness and accuracy through 18 GHz. © 2008 IEEE.

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Nanomechanical switch for integration with CMOS logic

Proposed for publication in the Journal of Microelectronics and Micromechanics.

Czaplewski, David A.; Patrizi, G.A.; Kraus, Garth K.; Wendt, J.R.; Nordquist, Christopher N.; Wolfley, Steven L.; De Boer, Maarten P.

We designed, fabricated and measured the performance of nanoelectromechanical (NEMS) switches. Initial data are reported with one of the switch designs having a measured switching time of 400 ns and an operating voltage of 5 V. The switches operated laterally with unmeasurable leakage current in the 'off' state. Surface micromachining techniques were used to fabricate the switches. All processing was CMOS compatible. A single metal layer, defined by a single mask step, was used as the mechanical switch layer. The details of the modeling, fabrication and testing of the NEMS switches are reported.

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SOI-Enabled MEMS Processes Lead to Novel Mechanical Optical and Atomic Physics Devices Presentation

Herrera, Gilbert V.; McCormick, Frederick B.; Nielson, Gregory N.; Nordquist, Christopher N.; Okandan, Murat O.; Olsson, Roy H.; Ortiz, Keith O.; Platzbecker, Mark R.; Resnick, Paul J.; Shul, Randy J.; Bauer, Todd B.; Sullivan, Charles T.; Watts, Michael W.; Blain, Matthew G.; Dodd, Paul E.; Dondero, Richard D.; Garcia, Ernest J.; Galambos, Paul; Hetherington, Dale L.; Hudgens, James J.

Abstract not provided.

SOI-Enabled MEMS Processes Lead to Novel Mechanical Optical and Atomic Physics Devices

Herrera, Gilbert V.; McCormick, Frederick B.; Nielson, Gregory N.; Nordquist, Christopher N.; Okandan, Murat O.; Olsson, Roy H.; Ortiz, Keith O.; Platzbecker, Mark R.; Resnick, Paul J.; Shul, Randy J.; Bauer, Todd B.; Sullivan, Charles T.; Watts, Michael W.; Blain, Matthew G.; Dodd, Paul E.; Dondero, Richard D.; Garcia, Ernest J.; Galambos, Paul; Hetherington, Dale L.; Hudgens, James J.

Abstract not provided.

Macro-meso-microsystems integration in LTCC : LDRD report

Rohde, Steven B.; Okandan, Murat O.; Pfeifer, Kent B.; De Smet, Dennis J.; Patel, Kamlesh P.; Ho, Clifford K.; Nordquist, Christopher N.; Walker, Charles A.; Rohrer, Brandon R.; Buerger, Stephen B.; Wroblewski, Brian W.

Low Temperature Cofired Ceramic (LTCC) has proven to be an enabling medium for microsystem technologies, because of its desirable electrical, physical, and chemical properties coupled with its capability for rapid prototyping and scalable manufacturing of components. LTCC is viewed as an extension of hybrid microcircuits, and in that function it enables development, testing, and deployment of silicon microsystems. However, its versatility has allowed it to succeed as a microsystem medium in its own right, with applications in non-microelectronic meso-scale devices and in a range of sensor devices. Applications include silicon microfluidic ''chip-and-wire'' systems and fluid grid array (FGA)/microfluidic multichip modules using embedded channels in LTCC, and cofired electro-mechanical systems with moving parts. Both the microfluidic and mechanical system applications are enabled by sacrificial volume materials (SVM), which serve to create and maintain cavities and separation gaps during the lamination and cofiring process. SVMs consisting of thermally fugitive or partially inert materials are easily incorporated. Recognizing the premium on devices that are cofired rather than assembled, we report on functional-as-released and functional-as-fired moving parts. Additional applications for cofired transparent windows, some as small as an optical fiber, are also described. The applications described help pave the way for widespread application of LTCC to biomedical, control, analysis, characterization, and radio frequency (RF) functions for macro-meso-microsystems.

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Investigating the impact of carbon contamination on RF MEMS reliability

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

Carton, Andrew J.; Christodoulou, C.G.; Dyck, Christopher D.; Nordquist, Christopher N.

Radio Frequency Microelectromechanical Systems (RF MEMS) are advantageous for reconfigurable antennas providing the potential for steering, frequency agility, and tunable directivity. Until RF MEMS switches can consistently reach cycles into the billions (if not trillions), limited reliability outweighs the promised benefits, preventing the deployment of RF MEMS into systems. Understanding failure mechanisms is essential to improving reliability. This paper describes preliminary reliability results and tests conducted in a vacuum chamber to investigate and understand the impact of contamination related failure mechanisms. © 2006 IEEE.

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RF MEMS Reconfigurable triangular patch antenna

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

Feldner, Lucas M.; Nordquist, Christopher N.; Christodoulou, Christos G.

A Ka-Band RF MEMS enabled frequency reconfigurable triangular microstrip patch antenna has been designed for monolithic integration with RF MEMS phase shifters to demonstrate a low-cost monolithic passive electronically scanned array (PESA). This paper introduces our first prototype reconfigurable triangular patch antenna currently in fabrication. The aperture coupled patch antenna is fabricated on a dual-layer quartz/alumina substrate using surface micromachining techniques. Full-wave MoM simulation results will be compared to laboratory measurements in the oral presentation. © 2005 IEEE.

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RF MEMS reconfigurable triangular patch antenna

Feldner, Lucas M.; Nordquist, Christopher N.

A Ka-band RF MEMS enabled frequency reconfigurable triangular microstrip patch antenna has been designed for monolithic integration with RF MEMS phase shifters to demonstrate a low-cost monolithic passive electronically scanned array (PESA). This paper introduces our first prototype reconfigurable triangular patch antenna currently in fabrication. The aperture coupled patch antenna is fabricated on a dual-layer quartz/alumina substrate using surface micromachining techniques.

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Novel microsystem applications with new techniques in LTCC

Patel, Kamlesh P.; Ho, Clifford K.; Rohde, Steven B.; Nordquist, Christopher N.; Walker, Charles A.; Okandan, Murat O.

Low-temperature co-fired ceramic (LTCC) enables development and testing of critical elements on microsystem boards as well as nonmicroelectronic meso-scale applications. We describe silicon-based microelectromechanical systems packaging and LTCC meso-scale applications. Microfluidic interposers permit rapid testing of varied silicon designs. The application of LTCC to micro-high-performance liquid chromatography (?-HPLC) demonstrates performance advantages at very high pressures. At intermediate pressures, a ceramic thermal cell lyser has lysed bacteria spores without damaging the proteins. The stability and sensitivity of LTCC/chemiresistor smart channels are comparable to the performance of silicon-based chemiresistors. A variant of the use of sacrificial volume materials has created channels, suspended thick films, cavities, and techniques for pressure and flow sensing. We report on inductors, diaphragms, cantilevers, antennae, switch structures, and thermal sensors suspended in air. The development of 'functional-as-released' moving parts has resulted in wheels, impellers, tethered plates, and related new LTCC mechanical roles for actuation and sensing. High-temperature metal-to-LTCC joining has been developed with metal thin films for the strong, hermetic interfaces necessary for pins, leads, and tubes.

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Si-based RF MEMS components

Dyck, Christopher D.; Stewart, Harold D.; Fleming, J.G.; Stevens, James E.; Nordquist, Christopher N.

Radio frequency microelectromechanical systems (RF MEMS) are an enabling technology for next-generation communications and radar systems in both military and commercial sectors. RF MEMS-based reconfigurable circuits outperform solid-state circuits in terms of insertion loss, linearity, and static power consumption and are advantageous in applications where high signal power and nanosecond switching speeds are not required. We have demonstrated a number of RF MEMS switches on high-resistivity silicon (high-R Si) that were fabricated by leveraging the volume manufacturing processes available in the Microelectronics Development Laboratory (MDL), a Class-1, radiation-hardened CMOS manufacturing facility. We describe novel tungsten and aluminum-based processes, and present results of switches developed in each of these processes. Series and shunt ohmic switches and shunt capacitive switches were successfully demonstrated. The implications of fabricating on high-R Si and suggested future directions for developing low-loss RF MEMS-based circuits are also discussed.

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136 Results
136 Results