Publications
Trans-Barrier Device Channel Characterization Using Frequency Fitting Methods
On-Wafer Microfabricated Test Structures for Characterizing RF Breakdown in Narrow Gaps
Passive Wireless Sensors
Ultra-wideband communication using a SAW correlator zero-IF architecture
Proposed for presentation at the 2003 IEEE Topical Conference on Wireless Communication Technology held October 15-17, 2003 in Honolulu, HI.
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