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Survivability of Electronic Components: Lessons Learned from Failure Analyses

Newton, Clay S.; McKenzie, Bonnie B.; Paliwal, Bhasker P.

Abstract not provided.

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TYPE Conference YEAR 2008

OSTI

Dynamic Failure Processes under Confining Stress in AlON a Transparent Polycrystalline Ceramic

Paliwal, Bhasker P.

Abstract not provided.

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TYPE Conference YEAR 2008

OSTI